TPS7H1121-SP

現行

輻射強化、QMLV 和 QMLP、2.25V 至 14V 輸入、2A 低壓差 (LDO) 穩壓器

產品詳細資料

Output options Adjustable Output Iout (max) (A) 2 Vin (max) (V) 14 Vin (min) (V) 2.25 Vout (max) (V) 13.2 Vout (min) (V) 0.6 Fixed output options (V) 0 Rating Space Noise (µVrms) 4 PSRR at 100 KHz (dB) 45 Iq (typ) (mA) 10 Thermal resistance θJA (°C/W) 30.5 Load capacitance (min) (µF) 6.8 Regulated outputs (#) 1 Features Adjustable current limit, Enable, Power good, Soft start Accuracy (%) 1.5 Dropout voltage (Vdo) (typ) (mV) 400 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 75 Radiation, TID (typ) (krad) 100
Output options Adjustable Output Iout (max) (A) 2 Vin (max) (V) 14 Vin (min) (V) 2.25 Vout (max) (V) 13.2 Vout (min) (V) 0.6 Fixed output options (V) 0 Rating Space Noise (µVrms) 4 PSRR at 100 KHz (dB) 45 Iq (typ) (mA) 10 Thermal resistance θJA (°C/W) 30.5 Load capacitance (min) (µF) 6.8 Regulated outputs (#) 1 Features Adjustable current limit, Enable, Power good, Soft start Accuracy (%) 1.5 Dropout voltage (Vdo) (typ) (mV) 400 Operating temperature range (°C) -55 to 125 Radiation, SEL (MeV·cm2/mg) 75 Radiation, TID (typ) (krad) 100
CFP (HFT) 22 60.221856 mm² 6.211 x 9.696
  • Total Ionizing Dose radiation characterized:
    • Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si)

  • Single-Event Effects (SEE) Characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized to LET = 75MeV-cm2/mg
    • Single-event transient (SET) characterized to LET = 75MeV-cm2/mg
  • Wide VIN range: 2.25V to 14V
  • 2A maximum output current
  • ±1.5% accuracy VIN > 3V over load, and temperature
  • ±1.8% accuracy VIN < 3V over load, and temperature
  • Soft start (SS) control through an external capacitor
  • Open-drain power good (PG) output for power sequencing
  • Programmable current limit through an external resistor (CL)
  • Optional external control loop compensation utilizing the STAB pin
  • Excellent load and line transient response
  • Plastic packages out gas tested per ASTM E595
  • Military (–55°C to 125°C) temperature range
  • Total Ionizing Dose radiation characterized:
    • Radiation hardness assurance (RHA) availability of 100krad(Si) or 50krad(Si)

  • Single-Event Effects (SEE) Characterized
    • Single-event latch-up (SEL), single-event burnout (SEB), and single-event gate rupture (SEGR) immune to linear energy transfer (LET) = 75MeV-cm2/mg
    • Single-event functional interrupt (SEFI) characterized to LET = 75MeV-cm2/mg
    • Single-event transient (SET) characterized to LET = 75MeV-cm2/mg
  • Wide VIN range: 2.25V to 14V
  • 2A maximum output current
  • ±1.5% accuracy VIN > 3V over load, and temperature
  • ±1.8% accuracy VIN < 3V over load, and temperature
  • Soft start (SS) control through an external capacitor
  • Open-drain power good (PG) output for power sequencing
  • Programmable current limit through an external resistor (CL)
  • Optional external control loop compensation utilizing the STAB pin
  • Excellent load and line transient response
  • Plastic packages out gas tested per ASTM E595
  • Military (–55°C to 125°C) temperature range

The TPS7H1121 is a radiation-hardened, low dropout linear regulator (LDO) which operates over a wide input voltage range and is optimized for powering devices in a space environment. It is capable of sourcing up to 2A over a 2.25V to 14V input.

The device offers excellent stability and features a programmable current limit with a wide adjustment range. To support the complex power requirements of FPGAs, DSPs, and microcontrollers, the TPS7H1121 provides enable on and off functionality, programmable soft start, and a power good open-drain output.

The TPS7H1121 is a radiation-hardened, low dropout linear regulator (LDO) which operates over a wide input voltage range and is optimized for powering devices in a space environment. It is capable of sourcing up to 2A over a 2.25V to 14V input.

The device offers excellent stability and features a programmable current limit with a wide adjustment range. To support the complex power requirements of FPGAs, DSPs, and microcontrollers, the TPS7H1121 provides enable on and off functionality, programmable soft start, and a power good open-drain output.

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類型 標題 日期
* Data sheet TPS7H1121-SP 2.25V to 14V Input, 2A, Radiation Hardened Low Dropout (LDO) Linear Regulator datasheet (Rev. A) PDF | HTML 2024年 9月 24日
* SMD TPS7H1121-SP SMD 5962-23203 2024年 12月 16日
* Radiation & reliability report TPS7H1121-SP Neutron Displacement Damage (NDD) Characterization Report PDF | HTML 2024年 9月 19日
* Radiation & reliability report TPS7H1121-SP Total Ionizing Dose (TID) Radiation Report PDF | HTML 2024年 9月 19日
* Radiation & reliability report TPS7H1121-SP Single-Event Effects (SEE) PDF | HTML 2024年 9月 18日
Application brief DLA Approved Optimizations for QML Products (Rev. B) PDF | HTML 2024年 10月 23日
EVM User's guide TPS7H1121EVM-CVAL Evaluation Module User's Guide (Rev. A) PDF | HTML 2024年 5月 17日
Certificate TPS7H1121EVM-CVAL EU Declaration of Conformity (DoC) 2024年 4月 5日
Selection guide TI Space Products (Rev. J) 2024年 2月 12日
More literature TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) 2023年 8月 31日
Application note QML flow, its importance, and obtaining lot information (Rev. C) 2023年 8月 30日
Application note Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) PDF | HTML 2022年 11月 17日
Application note DLA Standard Microcircuit Drawings (SMD) and JAN Part Numbers Primer 2020年 8月 21日
Application note Hermetic Package Reflow Profiles, Termination Finishes, and Lead Trim and Form PDF | HTML 2020年 5月 18日
E-book Radiation Handbook for Electronics (Rev. A) 2019年 5月 21日

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開發板

TPS7H1121EVM-CVAL — TPS7H1121-SP 評估模組

TPS7H1121EVM-CVAL 展示單一 TPS7H1121-SP LDO 穩壓器的運作。電路板提供可裝入其他元件的元件封裝,以便進行自訂配置測試,並提供測試點和 SMA 連接器,以簡化性能驗證。
使用指南: PDF | HTML
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模擬型號

TPS7H1121-SP PSpice Model

SLVME97.ZIP (36 KB) - PSpice Model
封裝 針腳 CAD 符號、佔位空間與 3D 模型
CFP (HFT) 22 Ultra Librarian

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  • 進行中持續性的可靠性監測
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