LMG2650EVM-100

LMG2650 half-bridge daughtercard evaluation module

LMG2650EVM-100

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Overview

The LMG2650EVM-100 is designed to provide a quick and easy platform to evaluate TI integrated GaN devices in any half-bridge topology. The board is designed to be interfaced with a larger system using the 6 power pins and 12 digital pins on the bottom edge of the board in a socket-style external connection. Power pins form the main switching loop consisting of a high-voltage DC bus, switch node and power ground. The digital pins control the LMG2650 device with PWM gate inputs, provide auxiliary power with low-voltage supplies, and report faults as a digital output. Evaluating the LMG2650EVM-100 performance is most easily demonstrated using a synchronous buck/boost motherboard from TI (LMG342X-BB-EVM). The daughtercard easily plugs into the motherboard and interfaces all power and digital control in an open-loop configuration for full system control. Additionally, a recommended footprint is provided to interface the daughtercard with a custom system for further testing.

Features
  • Input voltage operation up to 650V
  • Simple open-loop design to evaluate performance of LMG2640
  • Single or dual PWM input on board for PWM signal with variable dead time
  • Highly integrated GaN power-FET half bridge with low-side current-sense emulation output
  • Convenient probe points for logic and power stage measurements with oscilloscope probes having short ground spring probes
Gallium nitride (GaN) power stages
LMG2650 650V 95mΩ GaN half-bridge with integrated driver, protection and current sense
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Evaluation board

LMG2650EVM-100

LMG2650 half-bridge daughtercard evaluation module 

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Evaluation board

LMG342X-BB-EVM — LMG342x evaluation motherboard

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TI's Standard Terms and Conditions for Evaluation Items apply.

Technical documentation

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EVM User's guide LMG2650 Half-Bridge Daughtercard Evaluation Module User's Guide PDF | HTML 04 Dec 2024

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