4 Revision History
Changes from Revision C (December 2016) to Revision D (April 2023)
- TUV IEC 62368 認証機能を追加Go
- Changed BTST from anode to cathode and REGN from cathode to anode in
descriptionsGo
- Updated inclusive terminology throughout data sheetGo
Changes from Revision A (October 2013) to Revision B (November 2014)
- 「取り扱い定格」の表、「機能説明」セクション、「デバイスの機能モード」セクション、「アプリケーションと実装」セクション、「電源に関する推奨事項」セクション、「レイアウト」セクション、「デバイスおよびドキュメントのサポート」セクション、「メカニカル、パッケージ、および注文情報」セクションを追加。Go
- 先頭ページの回路図を変更Go
- Changed REG01[4] = 1 to REG01[5] = 1 in OTG
descriptionGo
- Added (10kΩ NTC thermister only) to QON descriptionGo
- Added ESD information to Handling Ratings Go
- Changed ICHG = 1792 mA in IICHG_REG_ACC test
conditionsGo
- Changed falling to rising in VHTF
Go
- Changed VHTF TYP to 47.2% Go
- Changed Input high threshold (OTG) MIN to 1.1 VGo
- Changed Table 9-2
Go
- Changed Figure 9-5
Go
- Changed RT1 = 5.25 kΩ Go
- Deleted and LSFET from Voltage and Current Monitoring in Buck Mode descriptionGo
- Deleted HSFET and from Voltage and Current Monitoring in Boost
Mode descriptionGo
- Changed text in Section 9.3.5.4.1
Go
- Changed REG09[5] to REG09[3] in Battery Over-Voltage Protection (BATOVP) sectionGo
- Changed REG09 Bit 3 description 1 – Battery OVP Go
Changes from Revision * (September 2013) to Revision A (October 2013)