SLVAFF0
September 2022
TPS25947
,
TPS2597
,
TPS25981
,
TPS25982
,
TPS25985
Abstract
Trademarks
1
Understanding the FET SOA
2
Ensuring FET SOA in Hot-Swap Design
3
eFuse Ensuring Integrated FET SOA Operation
3.1
Thermal Shutdown
3.2
eFuse Response to Events Stressing Integrated FET
4
Plotting eFuse AOA
5
eFuse Application Design Recommendations to Ensure Integrated FET Reliability
6
Summary
7
References
7
References
Texas Instruments,
Understanding MOSFET data sheets, Part 2 - Safe operating area (SOA) graph
, E2E
TM
Forum
Texas Instruments,
Robust Hot Swap Design
, application note
G. Breglio, F. Frisina, A. Magri, and P. Spirito,
Electro-Thermal Instability in Low Voltage Power MOS: Experimental Characterization
, IEEE Proceedings ISPSD 1999, Toronto, p233
Texas Instruments,
11 Ways to Protect Your Power Path
Texas Instruments,
TPS2597xx 2.7 V–23 V, 7-A, 9.8-mΩ eFuse With Accurate Current Monitor and Transient Overcurrent Blanking
data sheet
Texas Instruments,
Selecting TVS diodes in hot-swap and ORing applications
, E2E
TM
Forum
Texas Instruments,
Reducing Power Loss and Overheating During Faults with eFuses
, application note
Texas Instruments,
Calculating FIT for a Mission Profile
, application note