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  • Calculating Useful Lifetimes of Embedded Processors

    • SPRABX4B November   2014  – March 2020 AM3351 , AM3352 , AM3354 , AM3356 , AM3357 , AM3358 , AM3359 , AM4372 , AM4376 , AM4377 , AM4378 , AM4379 , AM5716 , AM5726 , AM5728 , AM5729 , AM5746 , AM5748 , F28M35E20B , F28M35H22C , F28M35H52C , F28M35H52C-Q1 , F28M35M22C , F28M35M52C , F28M36H33B2 , F28M36H53B2 , F28M36P53C2 , F28M36P63C2 , F29H850TU , F29H859TU-Q1 , SM320F2801-EP , TMS320C28341 , TMS320C28342 , TMS320C28343 , TMS320C28343-Q1 , TMS320C28344 , TMS320C28345 , TMS320C28346 , TMS320C28346-Q1 , TMS320F280021 , TMS320F280021-Q1 , TMS320F280023 , TMS320F280023-Q1 , TMS320F280023C , TMS320F280025 , TMS320F280025-Q1 , TMS320F280025C , TMS320F280025C-Q1 , TMS320F280040-Q1 , TMS320F280040C-Q1 , TMS320F280041 , TMS320F280041-Q1 , TMS320F280041C , TMS320F280041C-Q1 , TMS320F280045 , TMS320F280048-Q1 , TMS320F280048C-Q1 , TMS320F280049 , TMS320F280049-Q1 , TMS320F280049C , TMS320F280049C-Q1 , TMS320F2801 , TMS320F2801-Q1 , TMS320F28015 , TMS320F28016 , TMS320F28016-Q1 , TMS320F2802 , TMS320F2802-Q1 , TMS320F28020 , TMS320F280200 , TMS320F28021 , TMS320F28022 , TMS320F28022-Q1 , TMS320F28023 , TMS320F28023-Q1 , TMS320F280230 , TMS320F28026 , TMS320F28026-Q1 , TMS320F28026F , TMS320F28027 , TMS320F28027-Q1 , TMS320F28027F , TMS320F28027F-Q1 , TMS320F28030 , TMS320F28030-Q1 , TMS320F28031 , TMS320F28031-Q1 , TMS320F28032 , TMS320F28032-Q1 , TMS320F28033 , TMS320F28033-Q1 , TMS320F28034 , TMS320F28034-Q1 , TMS320F28035 , TMS320F28035-EP , TMS320F28035-Q1 , TMS320F28044 , TMS320F28050 , TMS320F28051 , TMS320F28052 , TMS320F28052-Q1 , TMS320F28052F , TMS320F28052F-Q1 , TMS320F28053 , TMS320F28054 , TMS320F28054-Q1 , TMS320F28054F , TMS320F28054F-Q1 , TMS320F28054M , TMS320F28054M-Q1 , TMS320F28055 , TMS320F2806 , TMS320F2806-Q1 , TMS320F28062 , TMS320F28062-Q1 , TMS320F28062F , TMS320F28062F-Q1 , TMS320F28063 , TMS320F28064 , TMS320F28065 , TMS320F28066 , TMS320F28066-Q1 , TMS320F28067 , TMS320F28067-Q1 , TMS320F28068F , TMS320F28068M , TMS320F28069 , TMS320F28069-Q1 , TMS320F28069F , TMS320F28069F-Q1 , TMS320F28069M , TMS320F28069M-Q1 , TMS320F28075 , TMS320F28075-Q1 , TMS320F2808 , TMS320F2808-Q1 , TMS320F2809 , TMS320F2810 , TMS320F2810-Q1 , TMS320F2811 , TMS320F2811-Q1 , TMS320F2812 , TMS320F2812-Q1 , TMS320F28232 , TMS320F28232-Q1 , TMS320F28234 , TMS320F28234-Q1 , TMS320F28235 , TMS320F28235-Q1 , TMS320F28332 , TMS320F28333 , TMS320F28334 , TMS320F28335 , TMS320F28335-Q1 , TMS320F28374D , TMS320F28374S , TMS320F28375D , TMS320F28375S , TMS320F28375S-Q1 , TMS320F28376D , TMS320F28376S , TMS320F28377D , TMS320F28377D-EP , TMS320F28377D-Q1 , TMS320F28377S , TMS320F28377S-Q1 , TMS320F28378D , TMS320F28378S , TMS320F28379D , TMS320F28379D-Q1 , TMS320F28379S , TMS320F28384D , TMS320F28384S , TMS320F28386D , TMS320F28386S , TMS320F28388D , TMS320F28388S , TMS320F28P650DH , TMS320F28P650DK , TMS320F28P650SH , TMS320F28P650SK , TMS320F28P659DH-Q1 , TMS320F28P659DK-Q1 , TMS320F28P659SH-Q1

       

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  • Calculating Useful Lifetimes of Embedded Processors
  1.   Calculating Useful Lifetimes of Embedded Processors
    1.     Trademarks
    2. 1 Introduction
    3. 2 Stages of Reliability and Useful Life Period
    4. 3 CMOS Wear Out Mechanisms and IC Design
    5. 4 Effect of Temperature on Electro-Migration
      1. 4.1 Operating Below 105°C TJ
      2. 4.2 Operating Above 105°C TJ
    6. 5 Electro-Migration Analysis of a System Mission Profile
    7. 6 Useful Life and MTTF Values
    8. 7 Limitations of This Document
  2.   Revision History
  3. IMPORTANT NOTICE
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APPLICATION NOTE

Calculating Useful Lifetimes of Embedded Processors

Calculating Useful Lifetimes of Embedded Processors

This application report provides a methodology for calculating the useful lifetime of TI embedded processors (EP) under power when used in electronic systems. It is aimed at general engineers who wish to determine if the reliability of the TI EP meets the end system reliability requirement. Electro-migration is the primary failure mechanism being modeled.

Trademarks

All other trademarks are the property of their respective owners.

1 Introduction

This document introduces the three stages of reliability and shows the current generation of TI industrial grade EP product is designed to support a useful lifetime of 10 year operating at 105°C junction temperature (TJ).

Based on the physics of failure approach, it shows useful life scales with temperature and decreasing the effective temperature below 105°C TJ, can extend the useful lifetime of the silicon beyond 10 years. Similarly, increasing the effective temperature above the 105°C TJ will shorten lifetime.

Using a case study of an actual system level mission profile, it shows how to calculate if the EP will be operating within its target useful lifetime for which it was designed.

 

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