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Integrierte Präzisions-ADCs und -DACs

AFE11612-SEP

AKTIV

Strahlungstolerantes analoges 12-Bit-Frontend mit Temperatursensoren und 12 DAC- und 16 ADC-Kanälen

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AFE11612-SEP

AKTIV
Datenblatt Jetzt bestellen

Produktdetails

Number of ADC channels 16 ADC resolution (Bps) 12 Number of DAC channels 12 DAC resolution (bps) 12 Temperature sensing Local, Remote Number of GPIOs 8 Interface type I2C, SPI Features GPIO Operating temperature range (°C) -55 to 125 Rating Space ADC sampling rate (ksps) 500 ADC analog input range (min) (V) -5 ADC analog input range (max) (V) 5 DAC settling time (µs) 2 DAC output full-scale (min) (V) 0 DAC output full-scale (max) (V) 12.5
Number of ADC channels 16 ADC resolution (Bps) 12 Number of DAC channels 12 DAC resolution (bps) 12 Temperature sensing Local, Remote Number of GPIOs 8 Interface type I2C, SPI Features GPIO Operating temperature range (°C) -55 to 125 Rating Space ADC sampling rate (ksps) 500 ADC analog input range (min) (V) -5 ADC analog input range (max) (V) 5 DAC settling time (µs) 2 DAC output full-scale (min) (V) 0 DAC output full-scale (max) (V) 12.5
HTQFP (PAP) 64 144 mm² 12 x 12
  • Radiation tolerant:
    • Single-event latch-up (SEL) immune up to LET = 43 MeV-cm 2/mg at 125°C
    • Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm 2/mg
    • Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
  • Space-enhanced plastic (space EP):
    • Meets ASTM E595 outgassing specification
    • Vendor item drawing (VID) V62/22614
    • Military temperature range: –55°C to +125°C
    • One fabrication, assembly, and test site
    • Gold bond wire, NiPdAu lead finish
    • Wafer lot traceability
    • Extended product life cycle
  • 12 monotonic, 12-bit DACs
    • 0 V to 5 V output range
    • DAC shutdown to user-defined level
  • 16 input, 12-bit SAR ADC
    • High sample rate: 500 kSPS
    • 16 single-ended inputs or 2 differential and 12 single-ended inputs
    • Programmable out-of-range alarms
  • Eight GPIO pins
  • Internal 2.5-V reference
  • Two remote temperature sensors
  • Internal temperature sensor
  • Configurable SPI and I 2C interface
    • 2.7-V to 5.5-V operation
  • Radiation tolerant:
    • Single-event latch-up (SEL) immune up to LET = 43 MeV-cm 2/mg at 125°C
    • Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm 2/mg
    • Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
  • Space-enhanced plastic (space EP):
    • Meets ASTM E595 outgassing specification
    • Vendor item drawing (VID) V62/22614
    • Military temperature range: –55°C to +125°C
    • One fabrication, assembly, and test site
    • Gold bond wire, NiPdAu lead finish
    • Wafer lot traceability
    • Extended product life cycle
  • 12 monotonic, 12-bit DACs
    • 0 V to 5 V output range
    • DAC shutdown to user-defined level
  • 16 input, 12-bit SAR ADC
    • High sample rate: 500 kSPS
    • 16 single-ended inputs or 2 differential and 12 single-ended inputs
    • Programmable out-of-range alarms
  • Eight GPIO pins
  • Internal 2.5-V reference
  • Two remote temperature sensors
  • Internal temperature sensor
  • Configurable SPI and I 2C interface
    • 2.7-V to 5.5-V operation

The AFE11612-SEP is a highly integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems. The device includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.

The device has an internal 2.5-V reference that sets the DAC to an output voltage range of 0 V to 5 V. The device also supports operation from an external reference. The device supports communication through both SPI-compatible and I 2C-compatible interfaces.

The device high level of integration significantly reduces component count and simplifies closed-loop system design, thus making the device a great choice for high-density applications where radiation-tolerance and board space are critical.

The AFE11612-SEP is a highly integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems. The device includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.

The device has an internal 2.5-V reference that sets the DAC to an output voltage range of 0 V to 5 V. The device also supports operation from an external reference. The device supports communication through both SPI-compatible and I 2C-compatible interfaces.

The device high level of integration significantly reduces component count and simplifies closed-loop system design, thus making the device a great choice for high-density applications where radiation-tolerance and board space are critical.
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Technische Dokumentation

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Typ Titel Datum
* Data sheet AFE11612-SEP Radiation-Tolerant, Analog Monitor and Controller With Multichannel ADC, DACs, and Temperature Sensors datasheet (Rev. A) PDF | HTML 15 Sep 2023
* Radiation & reliability report AFE11612-SEP Single-Event Effects (SEE) Test Report (Rev. A) 01 Sep 2023
* Radiation & reliability report AFE11612-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) 26 Jan 2023
* Radiation & reliability report AFE11612-SEP Reliability and Production Flow Chart (Rev. A) PDF | HTML 23 Dez 2022
EVM User's guide AFE11612 Evaluation Module User's Guide (Rev. A) PDF | HTML 03 Jun 2024
Application note Laser Biasing and Optical Communication Applications with the AFE11612-SEP PDF | HTML 30 Aug 2023
Certificate AFE11612EVM EU RoHS Declaration of Conformity (DoC) 01 Feb 2023

Design und Entwicklung

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  • Blei-Finish/Ball-Material
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  • Qualifikationszusammenfassung
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