Produktdetails

Configuration 8:1 Number of channels 1 Power supply voltage - single (V) 8, 12, 16, 20 Protocols Analog Ron (typ) (Ω) 180 CON (typ) (pF) 30 ON-state leakage current (max) (µA) 0.022 Supply current (typ) (µA) 0.14 Bandwidth (MHz) 150 Operating temperature range (°C) -55 to 125 Features 1.8-V compatible control inputs, Break-before-make, Fail-safe logic, Overvoltage protection, Powered-off protection Input/output continuous current (max) (mA) 5 Rating Space Supply voltage (max) (V) 20
Configuration 8:1 Number of channels 1 Power supply voltage - single (V) 8, 12, 16, 20 Protocols Analog Ron (typ) (Ω) 180 CON (typ) (pF) 30 ON-state leakage current (max) (µA) 0.022 Supply current (typ) (µA) 0.14 Bandwidth (MHz) 150 Operating temperature range (°C) -55 to 125 Features 1.8-V compatible control inputs, Break-before-make, Fail-safe logic, Overvoltage protection, Powered-off protection Input/output continuous current (max) (mA) 5 Rating Space Supply voltage (max) (V) 20
TSSOP (PW) 20 41.6 mm² 6.5 x 6.4
  • VID V62/23607-01XE
  • Radiation hardened
    • Single event latch-up (SEL) immune to 43 MeV-cm2/mg at 125°C
    • ELDRS free to 30krad(Si)
    • Total ionizing dose (TID) RLAT for every wafer lot up to 30krad(Si)
    • TID characterized up to 30krad(Si)
    • Single event transient (SET) characterized to 43 MeV-cm2 /mg
  • Supply range: +8V to +22V
  • Integrated powered-off and overvoltage protection
    • Overvoltage and power-off-protected up to +60V
    • Cold sparing capable up to +60V
    • Adjustable fault threshold threshold (VFP) from 3V to supply
    • Interrupt flag feedback indicating faulted channel
    • Non-fault channels continue to operate with low leakage currents
  • Latch-up immune construction
  • Precision performance with ±4.5nA source off leakage current (max) and 4pF off-cap
  • Space enhanced plastic
    • Operating temperature from –55°C to +125°C
    • Controlled baseline
    • Gold wire and NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Extended product life cycle
    • Product traceability
    • Enhanced mold compound for low outgassing
  • Small, industry standard TSSOP-20 packaging
  • VID V62/23607-01XE
  • Radiation hardened
    • Single event latch-up (SEL) immune to 43 MeV-cm2/mg at 125°C
    • ELDRS free to 30krad(Si)
    • Total ionizing dose (TID) RLAT for every wafer lot up to 30krad(Si)
    • TID characterized up to 30krad(Si)
    • Single event transient (SET) characterized to 43 MeV-cm2 /mg
  • Supply range: +8V to +22V
  • Integrated powered-off and overvoltage protection
    • Overvoltage and power-off-protected up to +60V
    • Cold sparing capable up to +60V
    • Adjustable fault threshold threshold (VFP) from 3V to supply
    • Interrupt flag feedback indicating faulted channel
    • Non-fault channels continue to operate with low leakage currents
  • Latch-up immune construction
  • Precision performance with ±4.5nA source off leakage current (max) and 4pF off-cap
  • Space enhanced plastic
    • Operating temperature from –55°C to +125°C
    • Controlled baseline
    • Gold wire and NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Extended product life cycle
    • Product traceability
    • Enhanced mold compound for low outgassing
  • Small, industry standard TSSOP-20 packaging

The TMUX582F-SEP is a modern 8:1 multiplexer suitable for single ended operation. This latch-up immune device offers robust overvoltage protection up to +60V making it optimal for harsh space environments. Additionally, this protection operates in powered-on, powered-off, and floating supply conditions.

During a fault such as an overvoltage or undervoltage event, the offending channel turns OFF and the Sx pin becomes high impedance. If this fault channel is selected, the drain (D) is pulled to the fault rail that is exceeded (Vfp or Vfn). All other Sx pins which are not under fault continue to operate normally. During normal operation, when the source (Sx) does not exceed Vfp or Vfn, the switch operates with low leakage, low capacitance and an ultra-flat on-resistance. This provides high performance signal integrity with minimal distortion.

The TMUX582F-SEP is a fault protected CMOS multiplexer flexible enough to handle almost any application, from system monitoring, to power-up sequencing protection, to high precision front end data acquisition.

The TMUX582F-SEP is a modern 8:1 multiplexer suitable for single ended operation. This latch-up immune device offers robust overvoltage protection up to +60V making it optimal for harsh space environments. Additionally, this protection operates in powered-on, powered-off, and floating supply conditions.

During a fault such as an overvoltage or undervoltage event, the offending channel turns OFF and the Sx pin becomes high impedance. If this fault channel is selected, the drain (D) is pulled to the fault rail that is exceeded (Vfp or Vfn). All other Sx pins which are not under fault continue to operate normally. During normal operation, when the source (Sx) does not exceed Vfp or Vfn, the switch operates with low leakage, low capacitance and an ultra-flat on-resistance. This provides high performance signal integrity with minimal distortion.

The TMUX582F-SEP is a fault protected CMOS multiplexer flexible enough to handle almost any application, from system monitoring, to power-up sequencing protection, to high precision front end data acquisition.

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Technische Dokumentation

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Typ Titel Datum
* Data sheet TMUX582F-SEP Radiation-Tolerant +60V Protected, Latch-Up Immune 8:1 Multiplexer with Adjustable Fault Threshol datasheet (Rev. A) 18 Sep 2024
* VID TMUX582F-SEP VID V62/23607 18 Feb 2025
* Radiation & reliability report TMUX582F-SEP Total Ionizing Dose (TID) Report (Rev. A) PDF | HTML 22 Nov 2024
* Radiation & reliability report TMUX582F-SEP Single-Event Effects (SEE) Radiation Report (Rev. A) PDF | HTML 29 Okt 2024
* Radiation & reliability report TMUX582F-SEP Production Flow and Reliability Report 02 Jan 2024

Design und Entwicklung

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Evaluierungsplatine

TMUX-24PW-EVM — TMUX generisches Evaluierungsmodul für 16-, 20- und 24-Pin-PW-Thin-Shrink-Small-Outline-Gehäuse (TSS

Das TMUX-24PW-EVM-Evaluierungsmodul ermöglicht das schnelle Prototyping und die DC-Charakterisierung der TMUX-Produktreihe von TI, die 16-, 20- oder 24-polige TSSOP-Gehäuse (PW) verwendet und für den Hochspannungsbetrieb ausgelegt ist.

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