Detalles del producto

Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 1.3 Vs (max) (V) 30 Vs (min) (V) 2 Rating Automotive Iq per channel (typ) (mA) 0.4 Vos (offset voltage at 25°C) (max) (mV) 7 Rail-to-rail In to V- Operating temperature range (°C) -40 to 150 Input bias current (±) (max) (nA) 50 VICR (max) (V) 30.5 VICR (min) (V) 0
Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 1.3 Vs (max) (V) 30 Vs (min) (V) 2 Rating Automotive Iq per channel (typ) (mA) 0.4 Vos (offset voltage at 25°C) (max) (mV) 7 Rail-to-rail In to V- Operating temperature range (°C) -40 to 150 Input bias current (±) (max) (nA) 50 VICR (max) (V) 30.5 VICR (min) (V) 0
SOIC (D) 8 29.4 mm² 4.9 x 6 TSSOP (PW) 8 19.2 mm² 3 x 6.4 VSSOP (DGK) 8 14.7 mm² 3 x 4.9
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • Device temperature grade 0: –40°C to 150°C ambient operating temperature range (LM2903E-Q1)
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification level H1C
    • Device CDM ESD classification level C4B
  • Improved 2 kV HBM ESD for "B" device
  • Tri-Temp testing available for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200 uA typical per comparator ("B" Versions)
  • Low input bias current 3.5 nA typical ("B" device)
  • Low input offset current 0.5 nA typ ("B" device)
  • Low input offset voltage ±0.37 mV typ ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36 V
  • Output compatible with TTL, MOS, and CMOS
  • Functional Safety-Capable
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • Device temperature grade 0: –40°C to 150°C ambient operating temperature range (LM2903E-Q1)
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification level H1C
    • Device CDM ESD classification level C4B
  • Improved 2 kV HBM ESD for "B" device
  • Tri-Temp testing available for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200 uA typical per comparator ("B" Versions)
  • Low input bias current 3.5 nA typical ("B" device)
  • Low input offset current 0.5 nA typ ("B" device)
  • Low input offset voltage ±0.37 mV typ ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36 V
  • Output compatible with TTL, MOS, and CMOS
  • Functional Safety-Capable

The LM2903B-Q1 device is the next generation version of the industry-standard LM2903-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of two independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The LM2903-Q1 and LM2903B-Q1 are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C. The LM2903E-Q1 is Qualified for the Grade 0 extended temperature range of -40°C to +150°C.

The LM2903B-Q1 device is the next generation version of the industry-standard LM2903-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of two independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The LM2903-Q1 and LM2903B-Q1 are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C. The LM2903E-Q1 is Qualified for the Grade 0 extended temperature range of -40°C to +150°C.

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Documentación técnica

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Tipo Título Fecha
* Data sheet LM2903-Q1 and LM2903B-Q1 Automotive Dual Comparators datasheet (Rev. L) PDF | HTML 14 ago 2023
Application note Application Design Guidelines for LM339, LM393, TL331 Family Comparators Including the New B-versions (Rev. E) PDF | HTML 06 jun 2024
Functional safety information LM2903-Q1 Functional Safety, FIT Rate, Failure Mode Distribution and Pin FMA 07 abr 2020
E-book The Signal e-book: A compendium of blog posts on op amp design topics 28 mar 2017
Application note Designing Overcurrent protection for TPL7407L Peripheral Driver 05 nov 2014

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

AMP-PDK-EVM — Módulo de evaluación del kit de desarrollo del rendimiento del amplificador

El kit de desarrollo del rendimiento (PDK) del amplificador es un kit de módulo de evaluación (EVM) para probar los parámetros comunes del amplificador operacional y es compatible con la mayoría de los amplificadores operacionales y comparadores. El kit del EVM ofrece una placa principal con varias (...)

Guía del usuario: PDF | HTML
Modelo de simulación

LM2903B PSpice Model (Rev. E)

SLCJ011E.ZIP (46 KB) - PSpice Model
Modelo de simulación

LM2903B TINA-TI Spice Model (Rev. B)

SLCM014B.ZIP (10 KB) - TINA-TI Spice Model
Herramienta de simulación

PSPICE-FOR-TI — PSpice® para herramienta de diseño y simulación de TI

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
Herramienta de simulación

TINA-TI — Programa de simulación analógica basado en SPICE

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
Guía del usuario: PDF
Diseños de referencia

TIDA-00143 — Control de motor CC sin escobillas (BLDC) de 60 W de calidad automotriz

Este diseño de referencia TIDA-00143 es un controlador de motor CC sin escobillas (BLDC) para una única fuente de alimentación de 12 V (nominal) que puede variar en un amplio rango de tensiones, tal como sucede en las aplicaciones típicas automotrices.  La placa está diseñada para accionar motores (...)
Design guide: PDF
Esquema: PDF
Diseños de referencia

TIDA-01445 — Diseño de referencia de bloqueo de alta tensión para automoción

This reference design is a low BOM design that has good coverage of automotive interlock connection diagnosis. In hybrid or electric vehicles (HEV/EVs), battery management systems, traction inverters, DCDC converters, onboard chargers, and other subsystems that operate at high voltages need to (...)
Design guide: PDF
Esquema: PDF
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
SOIC (D) 8 Ultra Librarian
TSSOP (PW) 8 Ultra Librarian
VSSOP (DGK) 8 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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Soporte y capacitación

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