BQ2010
- Conservative and repeatable measurement of available charge in rechargeable batteries
- Designed for battery pack integration
- 120µA typical standby current
- Small size enables implementations in as little as ½ square inch of PCB
- Integrate within a system or as a stand-alone device
- Display capacity via single-wire serial communication port or direct drive of LEDs
- Measurements compensated for current and temperature
- Self-discharge compensation using internal temperature sensor
- Accurate measurements across a wide range of current (> 500:1)
- 16-pin narrow SOIC
The bq2010 Gas Gauge IC is intended for battery-pack or in-system installation to maintain an accurate record of a batterys available charge. The IC monitors a voltage drop across a sense resistor connected in series between the negative battery terminal and ground to determine charge and discharge activity of the battery.
NiMH and NiCd battery self-discharge is estimated based on an internal timer and temperature sensor. Compensations for battery temperature and rate of charge or discharge are applied to the charge, discharge, and self-discharge calculations to provide available charge information across a wide range of operating conditions. Battery capacity is automatically recalibrated, or "learned," in the course of a discharge cycle from full to empty.
Nominal available charge may be directly indicated using a five- or six-segment LED display. These segments are used to indicate graphically the nominal available charge.
The bq2010 supports a simple single-line bidirectional serial link to an external processor (common ground). The bq2010 outputs battery information in response to external commands over the serial link.
The bq2010 may operate directly from 3 or 4 cells. With the REF output and an external transistor, a simple, inexpensive regulator can be built to provide VCC across a greater number of cells.
Internal registers include available charge, temperature, capacity, battery ID, battery status, and programming pin settings. To support subassembly testing, the outputs may also be controlled. The external processor may also overwrite some of the bq2010 gas gauge data registers.
技術資料
種類 | タイトル | 最新の英語版をダウンロード | 日付 | |||
---|---|---|---|---|---|---|
* | データシート | Gas Gauge IC データシート (Rev. A) | 2003年 2月 11日 | |||
ユーザー・ガイド | EV2010 Evaluation System Product Brief | 1999年 9月 5日 | ||||
アプリケーション・ノート | U-514 Using the bq2010 - A Tutorial for Gas Gauging | 1999年 9月 5日 | ||||
ユーザー・ガイド | EV2010 Gas Gauge Evaluation Board User's Guide (Rev. A) | 1998年 3月 1日 |
設計および開発
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パッケージ | ピン数 | CAD シンボル、フットプリント、および 3D モデル |
---|---|---|
SOIC (D) | 16 | Ultra Librarian |
購入と品質
- RoHS
- REACH
- デバイスのマーキング
- リード端子の仕上げ / ボールの原材料
- MSL 定格 / ピーク リフロー
- MTBF/FIT 推定値
- 使用原材料
- 認定試験結果
- 継続的な信頼性モニタ試験結果
- ファブの拠点
- 組み立てを実施した拠点