TIBPAL20R8-20M
- High-Performance: fmax (w/o feedback)
- TIBPAL20R’ -15C Series . . . 45 MHz
- TIBPAL20R’ -20M Series . . . 41.6 MHz
- High-Performance . . . 45 MHz Min
- Reduced ICC of 180 mA Max
- Functionally Equivalent, but Faster Than
PAL20L8, PAL20R4, PAL20R6, PAL20R8 - Power-Up Clear on Registered Devices (All Register Outputs are
Set Low, but Voltage Levels at the Output Pins Go High) - Preload Capability on Output Registers Simplifies Testing
- Package Options Include Both Plastic and Ceramic Chip Carriers
in Addition to Plastic and Ceramic DIPs
IMPACT is a trademark of Texas Instruments Incorporated.
PAL is a registered trademark of Advanced Micro Devices Inc.
These programmable array logic devices feature high speed and functional equivalency when compared with currently available devices. These IMPACT™ circuits combine the latest Advanced Low-Power Schottky technology with proven titanium-tungsten fuses to provide reliable, high-performance substitutes for conventional TTL logic. Their easy programmability allows for quick design of custom functions and typically results in a more compact circuit board. In addition, chip carriers are available for futher reduction in board space.
Extra circuitry has been provided to allow loading of each register asynchronously to either a high or low state. This feature simplifies testing because the registers can be set to an initial state prior to executing the test sequence.
The TIBPAL20 C series is characterized from 0°C to 75°C. The TIBPAL20 M series is characterized for operation over the full military temperature range of 55°C to 125°C.
技術資料
種類 | タイトル | 最新の英語版をダウンロード | 日付 | |||
---|---|---|---|---|---|---|
* | データシート | HighPerformance Impact Programmable Array Logic Circuits データシート (Rev. A) | 2011年 1月 5日 |
設計および開発
その他のアイテムや必要なリソースを参照するには、以下のタイトルをクリックして詳細ページをご覧ください。
パッケージ | ピン数 | CAD シンボル、フットプリント、および 3D モデル |
---|---|---|
CDIP (JT) | 24 | Ultra Librarian |
購入と品質
- RoHS
- REACH
- デバイスのマーキング
- リード端子の仕上げ / ボールの原材料
- MSL 定格 / ピーク リフロー
- MTBF/FIT 推定値
- 使用原材料
- 認定試験結果
- 継続的な信頼性モニタ試験結果
- ファブの拠点
- 組み立てを実施した拠点