產品詳細資料

Rating Space Integrated isolated power No Isolation rating Basic Number of channels 4 Forward/reverse channels 3 forward / 1 reverse Default output High, Low Data rate (max) (Mbps) 100 Surge isolation voltage (VIOSM) (VPK) 5200 Transient isolation voltage (VIOTM) (VPK) 4242 Withstand isolation voltage (VISO) (Vrms) 3000 CMTI (min) (V/µs) 85000 Operating temperature range (°C) -55 to 125 Supply voltage (max) (V) 5.5 Supply voltage (min) (V) 2.25 Propagation delay time (typ) (µs) 0.0107 Current consumption per channel (DC) (typ) (mA) 0.88 Current consumption per channel (1 Mbps) (typ) (mA) 1.48 Creepage (min) (mm) 3.7 Clearance (min) (mm) 3.7
Rating Space Integrated isolated power No Isolation rating Basic Number of channels 4 Forward/reverse channels 3 forward / 1 reverse Default output High, Low Data rate (max) (Mbps) 100 Surge isolation voltage (VIOSM) (VPK) 5200 Transient isolation voltage (VIOTM) (VPK) 4242 Withstand isolation voltage (VISO) (Vrms) 3000 CMTI (min) (V/µs) 85000 Operating temperature range (°C) -55 to 125 Supply voltage (max) (V) 5.5 Supply voltage (min) (V) 2.25 Propagation delay time (typ) (µs) 0.0107 Current consumption per channel (DC) (typ) (mA) 0.88 Current consumption per channel (1 Mbps) (typ) (mA) 1.48 Creepage (min) (mm) 3.7 Clearance (min) (mm) 3.7
SSOP (DBQ) 16 29.4 mm² 4.9 x 6
  • Radiation Tolerant
    • Total Ionizing Dose (TID) Characterized (ELDRS-Free) = 30 krad(Si)
    • TID RLAT/RHA = 30 krad(Si)
    • Single-Event Latch-up (SEL) Immune to LET = 43 MeV⋅cm2/mg at 125°C
    • Single-Event Dielectric Rupture (SEDR) Immune (43 MeV⋅cm2/mg) at 500 VDC
  • Space Enhanced Plastic (Space EP)
    • Meets NASA’s ASTM E595 Outgassing Spec
    • Vendor Item Drawing (VID) V62/21610
    • Military Temp Range (-55°C to 125°C)
    • One Wafer Fabrication Site
    • One Assembly and Test Site
    • Gold Bond Wire, NiPdAu Lead Finish
    • Wafer Lot Traceability
    • Extended Product Life Cycle
    • Extended Product Change Notification
  • 600 VRMS continous working voltage
  • Section 6.7:
    • DIN VDE V 0884-11:2017-01
    • UL 1577 component recognition program
  • 100 Mbps data rate
  • Wide supply range: 2.25 V to 5.5 V
  • 2.25-V to 5.5-V level translation
  • Default output low
  • Low power consumption, 1.5 mA per channel typical at 1 Mbps
  • Low propagation delay: 10.7 ns typical (5-V Supplies)
  • Low channel-to-channel skew: 4 ns max (5-V Supplies)
  • ±100 kV/µs typical CMTI
  • System-level ESD, EFT, Surge, and Magnetic Immunity
  • Small QSOP (DBQ-16) package

  • Radiation Tolerant
    • Total Ionizing Dose (TID) Characterized (ELDRS-Free) = 30 krad(Si)
    • TID RLAT/RHA = 30 krad(Si)
    • Single-Event Latch-up (SEL) Immune to LET = 43 MeV⋅cm2/mg at 125°C
    • Single-Event Dielectric Rupture (SEDR) Immune (43 MeV⋅cm2/mg) at 500 VDC
  • Space Enhanced Plastic (Space EP)
    • Meets NASA’s ASTM E595 Outgassing Spec
    • Vendor Item Drawing (VID) V62/21610
    • Military Temp Range (-55°C to 125°C)
    • One Wafer Fabrication Site
    • One Assembly and Test Site
    • Gold Bond Wire, NiPdAu Lead Finish
    • Wafer Lot Traceability
    • Extended Product Life Cycle
    • Extended Product Change Notification
  • 600 VRMS continous working voltage
  • Section 6.7:
    • DIN VDE V 0884-11:2017-01
    • UL 1577 component recognition program
  • 100 Mbps data rate
  • Wide supply range: 2.25 V to 5.5 V
  • 2.25-V to 5.5-V level translation
  • Default output low
  • Low power consumption, 1.5 mA per channel typical at 1 Mbps
  • Low propagation delay: 10.7 ns typical (5-V Supplies)
  • Low channel-to-channel skew: 4 ns max (5-V Supplies)
  • ±100 kV/µs typical CMTI
  • System-level ESD, EFT, Surge, and Magnetic Immunity
  • Small QSOP (DBQ-16) package

The ISOS141-SEP radiation-tolerant device is a high-performance, quad-channel digital isolator in a small form factor 16-pin QSOP package. Each isolation channel has a logic input and output buffer separated by a double capacitive silicon dioxide (SiO2) insulation barrier. This device supports low Earth orbit (LEO) space applications with its high data rate of 100 Mbps, low propagation delay of 10.7 ns, and tight channel-to-channel skew of 4 ns. The ISOS141-SEP device has three forward and one reverse-direction channels and if the input power or signal is lost, the default output is low. The enable pins can be used to put the respective outputs in high impedance for multi-master driving applications and to reduce power consumption.

The ISOS141-SEP provides high electromagnetic immunity and low emissions with low power consumption, while isolating CMOS or LVCMOS digital I/Os. The device has a high common-mode transient immunity of 100 kV/µs and can ease system-level ESD, EFT, surge, and simplify emissions compliance through its innovative chip design.

The ISOS141-SEP radiation-tolerant device is a high-performance, quad-channel digital isolator in a small form factor 16-pin QSOP package. Each isolation channel has a logic input and output buffer separated by a double capacitive silicon dioxide (SiO2) insulation barrier. This device supports low Earth orbit (LEO) space applications with its high data rate of 100 Mbps, low propagation delay of 10.7 ns, and tight channel-to-channel skew of 4 ns. The ISOS141-SEP device has three forward and one reverse-direction channels and if the input power or signal is lost, the default output is low. The enable pins can be used to put the respective outputs in high impedance for multi-master driving applications and to reduce power consumption.

The ISOS141-SEP provides high electromagnetic immunity and low emissions with low power consumption, while isolating CMOS or LVCMOS digital I/Os. The device has a high common-mode transient immunity of 100 kV/µs and can ease system-level ESD, EFT, surge, and simplify emissions compliance through its innovative chip design.

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* Data sheet ISOS141-SEP Radiation Tolerant High-Speed Quad-Channel Digital Isolator datasheet PDF | HTML 2021年 3月 5日
* Radiation & reliability report ISOS141-SEP Neutron Displacement Damage Characterization 2021年 3月 18日
* Radiation & reliability report ISOS141-SEP Production Flow and Reliability Report 2021年 3月 18日
* Radiation & reliability report ISOS141-SEP Quad-Channel Digital Isolator TID Report 2021年 3月 17日
* Radiation & reliability report ISOS141-SEP Single-Event Latch-Up (SEL) Radiation Report 2021年 3月 17日
Selection guide TI Space Products (Rev. J) 2024年 2月 12日
Certificate VDE Certificate for Basic Isolation for DIN EN IEC 60747-17 (Rev. W) 2024年 1月 31日
Technical article 航太級強化產品如何因應低地球軌道應用的挑戰 (Rev. A) PDF | HTML 2024年 1月 11日
Certificate UL Certificate of Compliance File E181974 Vol 4 Sec 6 (Rev. P) 2022年 8月 5日
Application brief How to Isolate Signals with Digital Isolators in Emerging LEO Satellite Apps (Rev. A) PDF | HTML 2022年 7月 6日
Technical article How space-grade digital isolation meets high radiation and immunity requirements i PDF | HTML 2021年 10月 14日
Application brief Space-Grade, 30 krad, Isolated I2C Circuit PDF | HTML 2021年 6月 1日
Application brief Space-Grade, 30-krad, Isolated CAN Serial Transceiver Circuit PDF | HTML 2021年 6月 1日
Application brief Space-Grade, 30-krad, Isolated RS-422 Serial Transceiver Circuit PDF | HTML 2021年 6月 1日
Technical article How to select the right digital isolator for your design PDF | HTML 2020年 10月 21日
Technical article Top 9 design questions about digital isolators PDF | HTML 2019年 2月 4日

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DIGI-ISO-EVM — 通用數位隔離器評估模組

DIGI-ISO-EVM 是一款評估模組 (EVM),可評估任何 TI 單通道、雙通道、三通道、四通道或六通道數位隔離器裝置,並提供五種不同封裝 - 8 接腳窄體 SOIC (D)、8 接腳寬體 SOIC (DWV)、16 接腳寬體 SOIC (DWW)、16 接腳超寬體 SOIC (DWW) 和 16 接腳 (DBQ) 封裝。EVM 具備足夠 Berg 接腳選項,可用於評估具最少外部零組件的裝置。

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ISOS141-SEP IBIS Model

SLLM498.ZIP (63 KB) - IBIS Model
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SSOP (DBQ) 16 Ultra Librarian

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