SN54SC4T125-SEP
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VID V62/23631-01XE
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Radiation Tolerant
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Single Event Latch-Up (SEL) immune up to 43 MeV-cm 2/mg at 125°C
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Total Ionizing Does (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si)
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Single Event Transient (SET) characterized up to LET = 43 MeV-cm 2/mg
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Wide operating range of 1.2 V to 5.5 V
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Single-supply voltage translator:
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Up translation:
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1.2 V to 1.8 V
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1.5 V to 2.5 V
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1.8 V to 3.3 V
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3.3 V to 5.0 V
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Down translation:
- 5.0 V, 3.3 V, 2.5 V to 1.8 V
- 5.0 V, 3.3 V to 2.5 V
- 5.0 V to 3.3 V
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- 5.5-V tolerant input pins
- Supports standard pinouts
- Up to 150 Mbps with 5-V or 3.3-V V CC
- Latch-up performance exceeds 250 mA per JESD 17
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Space Enhanced Plastic
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Controlled baseline
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Au bondwire and NiPdAu lead finish
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Meets NASA ASTM E595 outgassing specification
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One fabrication, assembly, and test site
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Extended product life cycle
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Product traceability
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The SN54SC4T125-SEP contains four independent buffers with 3-state outputs and extended voltage operation to allow for level translation. Each buffer performs the Boolean function Y = A in positive logic. The outputs can be put into a high impedance (Hi-Z) state by applying a HIGH on the OE pin. The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.
The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).
技術文件
設計與開發
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14-24-LOGIC-EVM — 適用於 14 針腳至 24 針腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產品通用評估模組
14-24-LOGIC-EVM 評估模組 (EVM) 設計用於支援任何 14 針腳至 24 針腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯裝置。
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
TSSOP (PW) | 14 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點