SN74LV4046A
- ESD Protection Exceeds JESD 22
- 2000-V Human Body Model (A114-A)
- 1000-V Charged-Device Model (C101)
- Choice of Three Phase Comparators
- Exclusive OR
- Edge-Triggered J-K Flip-Flop
- Edge-Triggered RS Flip-Flop
- Excellent VCO Frequency Linearity
- VCO-Inhibit Control for ON/OFF Keying and for Low Standby Power Consumption
- Optimized Power-Supply Voltage Range From 3 V to 5.5 V
- Wide Operating Temperature Range From –40°C to +125°C
- Latch-Up Performance Exceeds 250 mA Per JESD 17
The SN74LV4046A is a high-speed silicon-gate CMOS device that is pin compatible with the CD4046B and the CD74HC4046. The device is specified in compliance with JEDEC Std 7.
The SN74LV4046A is a phase-locked loop (PLL) circuit that contains a linear voltage-controlled oscillator (VCO) and three different phase comparators (PC1, PC2, and PC3). A signal input and a comparator input are common to each comparator.
The signal input can be directly coupled to large voltage signals, or indirectly coupled (with a series capacitor) to small voltage signals. A self-bias input circuit keeps small voltage signals within the linear region of the input amplifiers. With a passive low-pass filter, the SN74LV4046A forms a second-order loop PLL. The excellent VCO linearity is achieved by the use of linear operational amplifier techniques. Various applications include telecommunications, digital phase-locked loop and signal generators.
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | SN74LV4046A High-Speed CMOS Logic Phase-Locked Loop With VCO datasheet (Rev. E) | PDF | HTML | 2016年 11月 15日 |
設計與開發
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14-24-LOGIC-EVM — 適用於 14 針腳至 24 針腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產品通用評估模組
14-24-LOGIC-EVM 評估模組 (EVM) 設計用於支援任何 14 針腳至 24 針腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯裝置。
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
PDIP (N) | 16 | Ultra Librarian |
SOIC (D) | 16 | Ultra Librarian |
SOP (NS) | 16 | Ultra Librarian |
TSSOP (PW) | 16 | Ultra Librarian |
TVSOP (DGV) | 16 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點