SN74LV6T07-Q1
- AEC-Q100 qualified for automotive applications:
- Device temperature grade 1: -40°C to +125°C
- Device HBM ESD classification level 2
- Device CDM ESD classification level C4B
-
Available in wettable flank QFN package
- Wide operating range of 1.65 V to 5.5 V
- 5.5-V tolerant input pins
- LVxT enhanced inputs combined with open-drain outputs provide maximum voltage translation flexibility:
- Over 6.67-Mbps operation, (R PU = 1 kΩ, C L = 30 pF)
- Up translation from 1.2 V to 5 V with 1.8-V supply
- Down translation from 5 V to 0.8 V or even less with any valid supply
- 5.5-V tolerant input pins
- Supports standard function pinout
- Latch-up performance exceeds 250 mA per JESD 17
The SN74LV6T07-Q1 device contains six independent buffers with open-drain outputs. Each buffer performs the Boolean function Y = A in positive logic.
The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).
技術文件
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檢視所有 3 類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | SN74LV6T07-Q1 Automotive Hex Open-Drain Buffers with Integrated Translation datasheet | PDF | HTML | 2023年 8月 15日 |
Application note | Schematic Checklist - A Guide to Designing with Auto-Bidirectional Translators | PDF | HTML | 2024年 7月 12日 | |
Application note | Understanding Transient Drive Strength vs. DC Drive Strength in Level-Shifters (Rev. A) | PDF | HTML | 2024年 7月 3日 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
開發板
14-24-LOGIC-EVM — 適用於 14 針腳至 24 針腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產品通用評估模組
14-24-LOGIC-EVM 評估模組 (EVM) 設計用於支援任何 14 針腳至 24 針腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯裝置。
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
TSSOP (PW) | 14 | Ultra Librarian |
WQFN (BQA) | 14 | Ultra Librarian |
訂購與品質
內含資訊:
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
內含資訊:
- 晶圓廠位置
- 組裝地點