Detalles del producto

Configuration 2:1 SPDT Number of channels 4 Power supply voltage - single (V) 2.5, 3.3 Protocols Analog, I2C, I2S, JTAG, RGMII, SPI, TDM, UART Ron (typ) (Ω) 4 CON (typ) (pF) 10.5 Supply current (typ) (µA) 250 Bandwidth (MHz) 500 Operating temperature range (°C) -40 to 85 Features Powered-off protection, Supports input voltage beyond supply Input/output continuous current (max) (mA) 64 Rating Catalog Drain supply voltage (max) (V) 3.6 Supply voltage (max) (V) 3.6
Configuration 2:1 SPDT Number of channels 4 Power supply voltage - single (V) 2.5, 3.3 Protocols Analog, I2C, I2S, JTAG, RGMII, SPI, TDM, UART Ron (typ) (Ω) 4 CON (typ) (pF) 10.5 Supply current (typ) (µA) 250 Bandwidth (MHz) 500 Operating temperature range (°C) -40 to 85 Features Powered-off protection, Supports input voltage beyond supply Input/output continuous current (max) (mA) 64 Rating Catalog Drain supply voltage (max) (V) 3.6 Supply voltage (max) (V) 3.6
SSOP (DBQ) 16 29.4 mm² 4.9 x 6 TSSOP (PW) 16 32 mm² 5 x 6.4 TVSOP (DGV) 16 23.04 mm² 3.6 x 6.4 VQFN (RGY) 16 14 mm² 4 x 3.5
  • High-bandwidth data path (up to 500MHz)
  • 5V Tolerant I/Os with device powered up or powered down
  • Low and flat on-state resistance (ron) characteristics over operating range (ron= 4Ω typical)
  • Rail-to-rail switching on data I/O ports
    • 0- to 5V Switching with 3.3V VCC
    • 0- to 3.3V Switching with 2.5V VCC
  • Bidirectional data flow with near-zero propagation delay
  • Low input and output capacitance minimizes loading and signal distortion (Cio(OFF) = 3.5pF typical)
  • Fast switching frequency (f OE = 20MHz maximum)
  • Data and control inputs provide undershoot clamp diodes
  • Low power consumption (ICC = 0.7mA typical)
  • VCC Operating range from 2.3V to 3.6V
  • Data I/Os support 0- to 5V signaling levels (0.8V, 1.2V, 1.5V, 1.8V, 2.5V, 3.3V, 5V)
  • Control inputs can be driven by TTL or 5V and 3.3V CMOS outputs
  • Ioff Supports partial-power-down mode operation
  • Latch-up performance exceeds 100mA Per JESD 78, class II
  • ESD Performance tested per JESD 22
    • 2000V Human body model (A114-B, class II)
    • 1000V Charged-device model (C101)
  • Supports both digital and analog applications: USB interface, differential signal interface, bus isolation, low-distortion signal gating (1)

(1)For additional information regarding the performance characteristics of the CB3Q family, refer to the TI CBT-C, CB3T, and CB3Q Signal-Switch Families application report.

  • High-bandwidth data path (up to 500MHz)
  • 5V Tolerant I/Os with device powered up or powered down
  • Low and flat on-state resistance (ron) characteristics over operating range (ron= 4Ω typical)
  • Rail-to-rail switching on data I/O ports
    • 0- to 5V Switching with 3.3V VCC
    • 0- to 3.3V Switching with 2.5V VCC
  • Bidirectional data flow with near-zero propagation delay
  • Low input and output capacitance minimizes loading and signal distortion (Cio(OFF) = 3.5pF typical)
  • Fast switching frequency (f OE = 20MHz maximum)
  • Data and control inputs provide undershoot clamp diodes
  • Low power consumption (ICC = 0.7mA typical)
  • VCC Operating range from 2.3V to 3.6V
  • Data I/Os support 0- to 5V signaling levels (0.8V, 1.2V, 1.5V, 1.8V, 2.5V, 3.3V, 5V)
  • Control inputs can be driven by TTL or 5V and 3.3V CMOS outputs
  • Ioff Supports partial-power-down mode operation
  • Latch-up performance exceeds 100mA Per JESD 78, class II
  • ESD Performance tested per JESD 22
    • 2000V Human body model (A114-B, class II)
    • 1000V Charged-device model (C101)
  • Supports both digital and analog applications: USB interface, differential signal interface, bus isolation, low-distortion signal gating (1)

(1)For additional information regarding the performance characteristics of the CB3Q family, refer to the TI CBT-C, CB3T, and CB3Q Signal-Switch Families application report.

The SN74CB3Q3257 device is a high-bandwidth FET bus switch using a charge pump to elevate the gate voltage of the pass transistor, providing a low and flat ON-state resistance (ron).

The SN74CB3Q3257 device is a high-bandwidth FET bus switch using a charge pump to elevate the gate voltage of the pass transistor, providing a low and flat ON-state resistance (ron).

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Documentación técnica

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Tipo Título Fecha
* Data sheet SN74CB3Q3257 4-Bit 1-of-2 FET Multiplexer and Demultiplexer 2.5V and 3.3V Low-Voltage High-Bandwidth Bus Switch datasheet (Rev. E) PDF | HTML 06 dic 2024
Application note Selecting the Correct Texas Instruments Signal Switch (Rev. E) PDF | HTML 02 jun 2022
Application note Multiplexers and Signal Switches Glossary (Rev. B) PDF | HTML 01 dic 2021
Application note CBT-C, CB3T, and CB3Q Signal-Switch Families (Rev. C) PDF | HTML 19 nov 2021
Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
More literature Digital Bus Switch Selection Guide (Rev. A) 10 nov 2004
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
User guide Signal Switch Data Book (Rev. A) 14 nov 2003
Application note Bus FET Switch Solutions for Live Insertion Applications 07 feb 2003

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Placa de evaluación

TAS2770EVM — TAS2770EVM Amplificador de audio de clase D mono, entrada digital, detección de IV y módulo de evalu

The TAS2770EVM provides developers with a simple to use mono evaluation module that can be configured as a stereo solution and as a multi-channel solution. It is powerful tool kit for assessing stereo and mono implementations of the TAS2770 with or without IV sense. Everything needed for evaluating (...)
Guía del usuario: PDF
Placa de evaluación

TAS2770EVM-STEREO — Módulo de evaluación estéreo del amplificador de audio de detección IV, clase D y entrada digital TA

The TAS2770EVM-Stereo evaluation module provides developers with a simple to use module pre-configured in as a stereo solution. It is powerful tool kit for assessing stereo or mono implementations of the TAS2770 with or without IV sense. Everything needed for evaluating TAS2770 as a conventional (...)
Guía del usuario: PDF
Adaptador de interfaz

LEADED-ADAPTER1 — Adaptador de montaje superficial a conector macho DIP para pruebas rápidas de encapsulados con plomo

The EVM-LEADED1 board allows for quick testing and bread boarding of TI's common leaded packages.  The board has footprints to convert TI's D, DBQ, DCT,DCU, DDF, DGS, DGV, and PW surface mount packages to 100mil DIP headers.     

Guía del usuario: PDF
Adaptador de interfaz

LEADLESS-ADAPTER1 — Adaptador de montaje superficial a conector macho DIP para pruebas de encapsulados sin plomo de 6, 8

The EVM-LEADLESS1 board allows for quick testing and bread boarding of TI's common leadless packages.  The board has footprints to convert TI's DRC, DTP, DQE, RBW, RGY, RSE, RSV, RSW RTE, RTJ, RUK , RUC, RUG, RUM,RUT and YZP surface mount packages to 100mil DIP headers.
Guía del usuario: PDF
Modelo de simulación

HSPICE Model of SN74CB3Q3257

SCDJ024.ZIP (28 KB) - HSpice Model
Modelo de simulación

SN74CB3Q3257 IBIS Model

SCDM049.ZIP (44 KB) - IBIS Model
Diseños de referencia

TIDA-01572 — Diseño de referencia del módulo de evaluación estéreo del amplificador de audio de detección IV, cla

This reference design provides a high-performance stereo audio subsystem for use in PC applications. It operates off a single supply, ranging from 4.5 V to 16 V, and features the TAS2770, a digital-input Class-D audio amplifier that provides excellent noise and distortion performance and is (...)
Design guide: PDF
Esquema: PDF
Encapsulado Pines Símbolos CAD, huellas y modelos 3D
SSOP (DBQ) 16 Ultra Librarian
TSSOP (PW) 16 Ultra Librarian
TVSOP (DGV) 16 Ultra Librarian
VQFN (RGY) 16 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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Soporte y capacitación

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