製品詳細

Function General-purpose timer Iq (typ) (mA) 5 Rating Space Operating temperature range (°C) -55 to 125 Supply voltage (max) (V) 16.5 Supply voltage (min) (V) 4.5
Function General-purpose timer Iq (typ) (mA) 5 Rating Space Operating temperature range (°C) -55 to 125 Supply voltage (max) (V) 16.5 Supply voltage (min) (V) 4.5
CDIP (JG) 8 64.032 mm² 9.6 x 6.67
  • Timing From Microseconds to Hours
  • Astable or Monostable Operation
  • Adjustable Duty Cycle
  • TTL-Compatible Output Can Sink or Source up to 100 mA
  • QML-V Qualified, SMD 5962-98555
  • Military Temperature Range (–55°C to 125°C)
  • Rad-Tolerant: 25 kRad (Si) TID(1)

(1) Radiation tolerance is a typical value based upon initial device qualification with dose rate = 10 mrad/sec. Radiation Lot Acceptance Testing is available - contact factory for details.

  • Timing From Microseconds to Hours
  • Astable or Monostable Operation
  • Adjustable Duty Cycle
  • TTL-Compatible Output Can Sink or Source up to 100 mA
  • QML-V Qualified, SMD 5962-98555
  • Military Temperature Range (–55°C to 125°C)
  • Rad-Tolerant: 25 kRad (Si) TID(1)

(1) Radiation tolerance is a typical value based upon initial device qualification with dose rate = 10 mrad/sec. Radiation Lot Acceptance Testing is available - contact factory for details.

The SE555 is a precision timing circuit capable of producing accurate time delays or oscillation. In the time-delay or monostable mode of operation, the timed interval is controlled by a single external resistor and capacitor network. In the astable mode of operation, the frequency and duty cycle can be controlled independently with two external resistors and a single external capacitor.

The threshold and trigger levels normally are two-thirds and one-third, respectively, of VCC. These levels can be altered by use of the control-voltage terminal. When the trigger input falls below the trigger level, the flip-flop is set, and the output goes high. If the trigger input is above the trigger level and the threshold input is above the threshold level, the flip-flop is reset and the output is low. The reset (RESET) input can override all other inputs and can be used to initiate a new timing cycle. When RESET goes low, the flip-flop is reset, and the output goes low. When the output is low, a low-impedance path is provided between discharge (DISCH) and ground.

The output circuit is capable of sinking or sourcing current up to 100 mA. Operation is specified for supplies of 4.5 V to 16.5 V. With a 5-V supply, output levels are compatible with TTL inputs.

The SE555 is a precision timing circuit capable of producing accurate time delays or oscillation. In the time-delay or monostable mode of operation, the timed interval is controlled by a single external resistor and capacitor network. In the astable mode of operation, the frequency and duty cycle can be controlled independently with two external resistors and a single external capacitor.

The threshold and trigger levels normally are two-thirds and one-third, respectively, of VCC. These levels can be altered by use of the control-voltage terminal. When the trigger input falls below the trigger level, the flip-flop is set, and the output goes high. If the trigger input is above the trigger level and the threshold input is above the threshold level, the flip-flop is reset and the output is low. The reset (RESET) input can override all other inputs and can be used to initiate a new timing cycle. When RESET goes low, the flip-flop is reset, and the output goes low. When the output is low, a low-impedance path is provided between discharge (DISCH) and ground.

The output circuit is capable of sinking or sourcing current up to 100 mA. Operation is specified for supplies of 4.5 V to 16.5 V. With a 5-V supply, output levels are compatible with TTL inputs.

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種類 タイトル 最新の英語版をダウンロード 日付
* 放射線と信頼性レポート SE555 ELDRS Report 2015年 3月 31日
* データシート Precision Timer. データシート 2010年 2月 4日

購入と品質

記載されている情報:
  • RoHS
  • REACH
  • デバイスのマーキング
  • リード端子の仕上げ / ボールの原材料
  • MSL 定格 / ピーク リフロー
  • MTBF/FIT 推定値
  • 使用原材料
  • 認定試験結果
  • 継続的な信頼性モニタ試験結果
記載されている情報:
  • ファブの拠点
  • 組み立てを実施した拠点

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