SE555-SP
- Timing From Microseconds to Hours
- Astable or Monostable Operation
- Adjustable Duty Cycle
- TTL-Compatible Output Can Sink or Source up to 100 mA
- QML-V Qualified, SMD 5962-98555
- Military Temperature Range (–55°C to 125°C)
- Rad-Tolerant: 25 kRad (Si) TID(1)
(1) Radiation tolerance is a typical value based upon initial device qualification with dose rate = 10 mrad/sec. Radiation Lot Acceptance Testing is available - contact factory for details.
The SE555 is a precision timing circuit capable of producing accurate time delays or oscillation. In the time-delay or monostable mode of operation, the timed interval is controlled by a single external resistor and capacitor network. In the astable mode of operation, the frequency and duty cycle can be controlled independently with two external resistors and a single external capacitor.
The threshold and trigger levels normally are two-thirds and one-third, respectively, of VCC. These levels can be altered by use of the control-voltage terminal. When the trigger input falls below the trigger level, the flip-flop is set, and the output goes high. If the trigger input is above the trigger level and the threshold input is above the threshold level, the flip-flop is reset and the output is low. The reset (RESET) input can override all other inputs and can be used to initiate a new timing cycle. When RESET goes low, the flip-flop is reset, and the output goes low. When the output is low, a low-impedance path is provided between discharge (DISCH) and ground.
The output circuit is capable of sinking or sourcing current up to 100 mA. Operation is specified for supplies of 4.5 V to 16.5 V. With a 5-V supply, output levels are compatible with TTL inputs.
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | Precision Timer. datasheet | 2010年 2月 4日 | |
* | SMD | SE555-SP SMD 5962-98555 | 2016年 7月 8日 | |
* | Radiation & reliability report | SE555 ELDRS Report | 2015年 3月 31日 | |
Application brief | DLA Approved Optimizations for QML Products (Rev. A) | PDF | HTML | 2024年 6月 5日 | |
Selection guide | TI Space Products (Rev. J) | 2024年 2月 12日 | ||
More literature | TI Engineering Evaluation Units vs. MIL-PRF-38535 QML Class V Processing (Rev. A) | 2023年 8月 31日 | ||
Application note | Heavy Ion Orbital Environment Single-Event Effects Estimations (Rev. A) | PDF | HTML | 2022年 11月 17日 | |
Application note | Single-Event Effects Confidence Interval Calculations (Rev. A) | PDF | HTML | 2022年 10月 19日 |
設計與開發
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---|---|---|
CDIP (JG) | 8 | Ultra Librarian |
訂購與品質
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