SN54AS867
- Fully Programmable With Synchronous Counting and Loading
- SN74ALS867A and ´AS867 Have Asynchronous Clear; SN74ALS869 and ´AS869 Have Synchronous Clear
- Fully Independent Clock Circuit Simplifies Use
- Ripple-Carry Output for n-Bit Cascading
- Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs
These synchronous, presettable, 8-bit up/down counters feature internal-carry look-ahead circuitry for cascading in high-speed counting applications. Synchronous operation is provided by having all flip-flops clocked simultaneously so that the outputs change coincidentally with each other when so instructed by the count-enable (,) inputs and internal gating. This mode of operation eliminates the output counting spikes normally associated with asynchronous (ripple-clock) counters. A buffered clock (CLK) input triggers the eight flip-flops on the rising (positive-going) edge of the clock waveform.
These counters are fully programmable; they may be preset to any number between 0 and 255. The load-input circuitry allows parallel loading of the cascaded counters. Because loading is synchronous, selecting the load mode disables the counter and causes the outputs to agree with the data inputs after the next clock pulse.
The carry look-ahead circuitry provides for cascading counters for n-bit synchronous applications without additional gating. Two count-enable (and ) inputs and a ripple-carry () output are instrumental in accomplishing this function. Both and must be low to count. The direction of the count is determined by the levels of the select (S0, S1) inputs as shown in the function table. is fed forward to enable . thus enabled produces a low-level pulse while the count is zero (all outputs low) counting down or 255 counting up (all outputs high). This low-level overflow-carry pulse can be used to enable successive cascaded stages. Transitions at and are allowed regardless of the level of CLK. All inputs are diode clamped to minimize transmission-line effects, thereby simplifying system design.
These counters feature a fully independent clock circuit. With the exception of the asynchronous clear on the SN74ALS867A and ´AS867, changes at S0 and S1 that modify the operating mode have no effect on the Q outputs until clocking occurs. For the ´AS867 and ´AS869, any time ENP\ and/or ENT\ is taken high, either goes or remains high. For the SN74ALS867A and SN74ALS869, any time is taken high, either goes or remains high. The function of the counter (whether enabled, disabled, loading, or counting) is dictated solely by the conditions meeting the stable setup and hold times.
The SN54AS867 and SN54AS869 are characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ALS867A, SN74ALS869, SN74AS867, and SN74AS869 are characterized for operation from 0°C to 70°C.
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | Synchronous 8-Bit Up/Down Counters datasheet (Rev. C) | 1995年 1月 1日 | |
* | SMD | SN54AS867 SMD 5962-89668 | 2016年 6月 21日 | |
Selection guide | Logic Guide (Rev. AB) | 2017年 6月 12日 | ||
Application note | Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) | 2015年 12月 2日 | ||
User guide | LOGIC Pocket Data Book (Rev. B) | 2007年 1月 16日 | ||
Application note | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004年 7月 8日 | ||
Application note | TI IBIS File Creation, Validation, and Distribution Processes | 2002年 8月 29日 | ||
Application note | Designing With Logic (Rev. C) | 1997年 6月 1日 | ||
Application note | Advanced Schottky Load Management | 1997年 2月 1日 | ||
Application note | Input and Output Characteristics of Digital Integrated Circuits | 1996年 10月 1日 | ||
Application note | Live Insertion | 1996年 10月 1日 | ||
Application note | Advanced Schottky (ALS and AS) Logic Families | 1995年 8月 1日 |
設計與開發
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封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
CDIP (JT) | 24 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點