SN74LV573AT

Name: SN74LV573AT
Brand: TI
SKU: SN74LV573AT
Price: 0.295 USD

現行

具有 3 態輸出的八路透明 D 型鎖存

立即訂購

產品規格表

document-pdfAcrobat SN74LV573AT datasheet (Rev. C) (英文)

SN74LV573AT

現行

產品規格表

立即訂購

產品詳細資料

Number of channels

8

Technology family

LV-AT

Supply voltage (min) (V)

4.5

Supply voltage (max) (V)

5.5

Input type

TTL-Compatible CMOS

Output type

3-State

Clock frequency (max) (MHz)

70

IOL (max) (mA)

16

IOH (max) (mA)

-16

Supply current (max) (µA)

20

Features

Balanced outputs, Flow-through pinout, High speed (tpd 10-50ns), Partial power down (Ioff)

Operating temperature range (°C)

-40 to 85

Rating

Catalog

Number of channels

8

Technology family

LV-AT

Supply voltage (min) (V)

4.5

Supply voltage (max) (V)

5.5

Input type

TTL-Compatible CMOS

Output type

3-State

Clock frequency (max) (MHz)

70

IOL (max) (mA)

16

IOH (max) (mA)

-16

Supply current (max) (µA)

20

Features

Balanced outputs, Flow-through pinout, High speed (tpd 10-50ns), Partial power down (Ioff)

Operating temperature range (°C)

-40 to 85

Rating

Catalog

SOIC (DW)

20

131.84 mm² 12.8 x 10.3

TSSOP (PW)

20

41.6 mm² 6.5 x 6.4

Inputs Are TTL-Voltage Compatible
4.5-V to 5.5-V V_CC Operation
Typical t_pd = 5.1 ns at 5 V
Typical V_OLP (Output Ground Bounce)
<0.8 V at V_CC = 5 V, T_A = 25°C
Typical V_OHV (Output V_OH Undershoot)
>2.3 V at V_CC = 5 V, T_A = 25°C
Supports Mixed-Mode Voltage Operation on All Ports
I_off Supports Partial-Power-Down Mode Operation
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)

Inputs Are TTL-Voltage Compatible
4.5-V to 5.5-V V_CC Operation
Typical t_pd = 5.1 ns at 5 V
Typical V_OLP (Output Ground Bounce)
<0.8 V at V_CC = 5 V, T_A = 25°C
Typical V_OHV (Output V_OH Undershoot)
>2.3 V at V_CC = 5 V, T_A = 25°C
Supports Mixed-Mode Voltage Operation on All Ports
I_off Supports Partial-Power-Down Mode Operation
Latch-Up Performance Exceeds 250 mA Per JESD 17
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)

The SN74LV573AT is an octal transparent D-type latch. When the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs. When LE is low, the Q outputs are latched at the logic levels of the D inputs.

A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high or low) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without interface or pullup components.

To ensure the high-impedance state during power up or power down, OE shall be tied to V_CC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

OE does not affect the internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

This device is fully specified for partial-power-down applications using I_off. The I_off circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

The SN74LV573AT is an octal transparent D-type latch. When the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs. When LE is low, the Q outputs are latched at the logic levels of the D inputs.

A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high or low) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without interface or pullup components.

To ensure the high-impedance state during power up or power down, OE shall be tied to V_CC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

OE does not affect the internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

This device is fully specified for partial-power-down applications using I_off. The I_off circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.

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