SN74LV595A-Q1
- Qualified for automotive applications
- Available in wettable flank QFN (WBQB) package
- Customer-specific configuration control can be supported along with major-change approval
- 2-V to 5.5-V V CC operation
- Typical V OLP (output ground bounce) < 0.8 V at V CC = 3.3 V, T A = 25°C
- Typical V OHV (output V OH undershoot) > 2.3 V at V CC = 3.3 V, T A = 25°C
- Supports mixed-mode voltage operation on all ports
- 8-bit serial-in, parallel-out shift
- I off supports partial-power-down mode operation
- Shift register has direct clear
The SN74LV595A-Q1 contains an 8-bit serial-in, parallel-out shift register that feeds an 8-bit D-type storage register. The storage register has parallel 3-state outputs. Separate clocks are provided for both the shift and storage register. The shift register has a direct overriding clear ( SRCLR) input, serial (SER) input, and a serial output for cascading. When the output-enable ( OE) input is high, all outputs except Q H are in the high-impedance state.
The device is fully specified for partial-power-down applications using I off. The I off circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | SN74LV595A-Q1 8-Bit Shift Registers With 3-State Output Registers datasheet (Rev. G) | PDF | HTML | 2023年 3月 24日 |
Application note | Power-Up Behavior of Clocked Devices (Rev. B) | PDF | HTML | 2022年 12月 15日 | |
More literature | Automotive Logic Devices Brochure | 2014年 8月 27日 |
設計與開發
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14-24-LOGIC-EVM — 適用於 14 針腳至 24 針腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產品通用評估模組
14-24-LOGIC-EVM 評估模組 (EVM) 設計用於支援任何 14 針腳至 24 針腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯裝置。
14-24-NL-LOGIC-EVM — 適用於 14 針腳至 24 針腳無引線封裝的邏輯產品通用評估模組
14-24-NL-LOGIC-EVM 是一款靈活的評估模組 (EVM),設計用途可支援任何具有 14 針腳至 24 針腳 BQA、BQB、RGY、RSV、RJW 或 RHL 封裝的邏輯或轉換裝置。
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
TSSOP (PW) | 16 | Ultra Librarian |
WQFN (BQB) | 16 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點