SLVA793A june 2016 – august 2023 ESD122 , ESDS304 , TPD1E04U04 , TPD2E1B06 , TPD2EUSB30 , TPD4E004 , TPD4E02B04 , TPD4E05U06-Q1 , TPD6E004

3 USB 3.0 Gen 1

Figure 3-1 shows a full-channel USB 3.1 Gen 1 compliant model without the addition of an ESD protection diode. The resultant eye diagram can be seen in Figure 3-2. Figure 3-3 shows the eye diagram for the same circuit utilizing the TPD4E02B04 ESD protection diode by Texas Instruments at the source connector. The schematic model is shown in Figure 3-4.

Figure 3-1 USB 3.0 Gen 1 Full-Compliance Schematic without ESD Protection

Figure 3-2 USB 3.0 Gen 1 Eye Diagram without ESD Protection

Figure 3-3 USB 3.0 Gen 1 Eye Diagram with TPD4E02B04DQA ESD Protection

Figure 3-4 USB 3.0 Gen 1 Full-Compliance Schematic with ESD Protection

Table 3-1 shows the eye diagram measurements with and without ESD protection:

Table 3-1 Eye Diagram Measurements with and without ESD Protection

	No ESD Protection	TPD4E02B04	Change
Rise Time	81.96 ps	86.18 ps	+4.22 ps
Fall Time	81.89 ps	86.11 ps	+4.22 ps
Eye Height	266 mV	243 mV	–23 mV
Eye Width	182.8 ps	177.7 ps	–5.1 ps
Jitter(PP)	17.2 ps	22.8 ps	+5.6 ps
Jitter(RMS)	2.969 ps	3.836 ps	+0.867 ps

The additional capacitance of an ESD protection diode has an impact on rise and fall-times by slowing them down. This negatively impacts the rest of the table values as well. However, the low-capacitance of TPD4E02B04 only minimally impacts the eye diagram, making it an excellent choice for ESD protection in a USB 3.0 Gen 1 system. TPD4E02B04 is also successful in a USB 3.1 Gen 2 application.