SLVAEX0 October   2020 TPS1H000-Q1 , TPS1H100-Q1 , TPS1H200A-Q1 , TPS1HA08-Q1 , TPS1HB16-Q1 , TPS1HB50-Q1 , TPS2HB16-Q1 , TPS2HB50-Q1 , TPS4H000-Q1 , TPS4H160-Q1

 

  1.   Abstract
  2.   Trademarks
  3. 1Introduction
  4. 2Normal Operation Diagnostics
    1. 2.1 Configuring Diagnostics With SEL/SELx Pin
      1. 2.1.1 Diagnostics Select Pin: SEL1
      2. 2.1.2 Diagnostics Select Pin: SELx
    2. 2.2 Operating Current Measurements Using the SNS/CS Pin
      1. 2.2.1 Internal/External Factor: Load Current Through Device
      2. 2.2.2 External Factor: Analog-to-Digital Converter (ADC)
      3. 2.2.3 External Factor: Probe Ground Termination
      4. 2.2.4 External Factor: Component Tolerances
    3. 2.3 Device Temperature on the Sense (SNS) Pin
  5. 3Fault State Diagnostics
    1. 3.1 Fault Behavior Configurations: Latch/THER/Delay Pin
      1. 3.1.1 Latch Pin
      2. 3.1.2 THER Pin
      3. 3.1.3 Delay Pin
    2. 3.2 Open Load Fault
    3. 3.3 Short to Battery Fault
    4. 3.4 Thermal Shutdown
    5. 3.5 Loss of Ground or Power Supply
    6. 3.6 Summary
  6. 4References

3.1 Fault Behavior Configurations: Latch/THER/Delay Pin

Depending on the device, the recovery behavior of the device when it detects a fault event can be configured to do a few things: turn off, latch the current, or retry. These different states help the device maintain operation and prevent unwanted behavior that can occur as a result of faults such as short to GND. This is dictated by the configuration of a single pin that varies from device to device. This is typically done through a THER, LATCH, DELAY pin.

Table 3-1 shows the different devices that have any of the three pins.

Table 3-1 Devices and Corresponding Fault Configuration Pin
Pin Device
DELAY TPS1H200A-Q1, TPS1H000A-Q1
THER TPS2H000-Q1, TPS4H000-Q1, TPS2HB160-Q1
LATCH TPSxHBxx-Q1 family, TPS1HA08-Q1