SLVUBG5A June   2018  – September 2021 ESD122 , ESD204 , ESD401 , SN65220 , SN65240 , TPD1E01B04 , TPD1E04U04 , TPD1E05U06 , TPD1E10B06 , TPD1E10B06-Q1 , TPD1E10B09 , TPD1E10B09-Q1 , TPD2E001 , TPD2E001-Q1 , TPD2E009 , TPD2E1B06 , TPD2E2U06-Q1 , TPD2EUSB30 , TPD2S017 , TPD4E001-Q1 , TPD4E004 , TPD4E02B04 , TPD4E05U06 , TPD4E05U06-Q1 , TPD4E101 , TPD4E1B06 , TPD4E1U06 , TPD4E6B06 , TPD5E003 , TPD6E001 , TPD6E004 , TPD6E05U06 , TPD8E003 , TPD8S009 , TVS2200 , UC1611-SP , UC2610 , UC3610 , UC3611 , UC3611M

 

  1.   Trademarks
  2. 1Introduction
  3. 2Definitions
  4. 3S-Parameter Analysis
    1. 3.1 DQA 4-Port Analysis
  5. 4Lower Speed Device Testing
    1. 4.1 ESD Tests
      1. 4.1.1 Test Method and Set-Up
      2. 4.1.2 Evaluation of Test Results
  6. 5Board Layout
  7. 6Schematics and Bill of Materials
    1. 6.1 Schematics
    2. 6.2 Bill of Materials
  8. 7Revision History

4.1 ESD Tests

TI's ESD portfolio of devices provide robust protection during an ESD event. In order to see the passing level of the device the set up below should be used. It is important to note that due to the parasitics of the EVM, the IEC waveform is slightly different than during validation of the device potentially lending to different results.