제품 상세 정보

Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Number of channels 8 IOL (max) (mA) 64 IOH (max) (mA) -24 Input type TTL-Compatible CMOS Output type 3-State Features Partial power down (Ioff), Very high speed (tpd 5-10ns) Technology family ABT Rating Military Operating temperature range (°C) -55 to 125
Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Number of channels 8 IOL (max) (mA) 64 IOH (max) (mA) -24 Input type TTL-Compatible CMOS Output type 3-State Features Partial power down (Ioff), Very high speed (tpd 5-10ns) Technology family ABT Rating Military Operating temperature range (°C) -55 to 125
CDIP (JT) 24 221.44 mm² 32 x 6.92 LCCC (FK) 28 130.6449 mm² 11.43 x 11.43
  • Members of the Texas Instruments SCOPETM Family of Testability Products
  • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port
    and Boundary-Scan Architecture
  • Functionally Equivalent to 'F245 and 'ABT245 in the Normal-Function Mode
  • SCOPETM Instruction Set:
    • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
    • Parallel-Signature Analysis at Inputs With Masking Option
    • Pseudo-Random Pattern Generation From Outputs
    • Sample Inputs/Toggle Outputs
    • Binary Count From Outputs
    • Even-Parity Opcodes
  • Two Boundary-Scan Cells per I/O for Greater Flexibility
  • State-of-the-Art EPIC-IIBTM BiCMOS Design Significantly Reduces Power Dissipation
  • Package Options Include Plastic Small-Outline Packages (DW), Ceramic Chip Carriers(FK), and Standard Ceramic DIPs (JT)

    SCOPE and EPIC-IIB are trademarks of Texas Instruments Incorporated.


  • Members of the Texas Instruments SCOPETM Family of Testability Products
  • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port
    and Boundary-Scan Architecture
  • Functionally Equivalent to 'F245 and 'ABT245 in the Normal-Function Mode
  • SCOPETM Instruction Set:
    • IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
    • Parallel-Signature Analysis at Inputs With Masking Option
    • Pseudo-Random Pattern Generation From Outputs
    • Sample Inputs/Toggle Outputs
    • Binary Count From Outputs
    • Even-Parity Opcodes
  • Two Boundary-Scan Cells per I/O for Greater Flexibility
  • State-of-the-Art EPIC-IIBTM BiCMOS Design Significantly Reduces Power Dissipation
  • Package Options Include Plastic Small-Outline Packages (DW), Ceramic Chip Carriers(FK), and Standard Ceramic DIPs (JT)

    SCOPE and EPIC-IIB are trademarks of Texas Instruments Incorporated.


The 'ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the 'F245 and 'ABT245 octal bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal bus transceivers.

Data flow is controlled by the direction-control (DIR) and output-enable () inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The output-enable () input can be used to disable the device so that the buses are effectively isolated.

 

In the test mode, the normal operation of the SCOPETM bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations as described in IEEE Standard 1149.1-1990.

Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

The SN54ABT8245 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8245 is characterized for operation from -40°C to 85°C.

 

 

The 'ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPETM testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

In the normal mode, these devices are functionally equivalent to the 'F245 and 'ABT245 octal bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPETM octal bus transceivers.

Data flow is controlled by the direction-control (DIR) and output-enable () inputs. Data transmission is allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The output-enable () input can be used to disable the device so that the buses are effectively isolated.

 

In the test mode, the normal operation of the SCOPETM bus transceivers is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations as described in IEEE Standard 1149.1-1990.

Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.

The SN54ABT8245 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74ABT8245 is characterized for operation from -40°C to 85°C.

 

 

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기술 자료

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20개 모두 보기
유형 직함 날짜
* Data sheet Scan Test Devices With Octal Bus Transceivers datasheet (Rev. D) 1996/12/01
* SMD SN54ABT8245 SMD 5962-93186 2016/06/21
Application note Implications of Slow or Floating CMOS Inputs (Rev. E) 2021/07/26
Selection guide Logic Guide (Rev. AB) 2017/06/12
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015/12/02
User guide LOGIC Pocket Data Book (Rev. B) 2007/01/16
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004/07/08
Application note Selecting the Right Level Translation Solution (Rev. A) 2004/06/22
Application note Quad Flatpack No-Lead Logic Packages (Rev. D) 2004/02/16
Application note TI IBIS File Creation, Validation, and Distribution Processes 2002/08/29
Application note Power-Up 3-State (PU3S) Circuits in TI Standard Logic Devices 2002/05/10
Selection guide Advanced Bus Interface Logic Selection Guide 2001/01/09
Application note Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) 1997/08/01
Application note Advanced BiCMOS Technology (ABT) Logic Characterization Information (Rev. B) 1997/06/01
Application note Designing With Logic (Rev. C) 1997/06/01
Application note Advanced BiCMOS Technology (ABT) Logic Enables Optimal System Design (Rev. A) 1997/03/01
Application note Family of Curves Demonstrating Output Skews for Advanced BiCMOS Devices (Rev. A) 1996/12/01
Application note Input and Output Characteristics of Digital Integrated Circuits 1996/10/01
Application note Live Insertion 1996/10/01
Application note Understanding Advanced Bus-Interface Products Design Guide 1996/05/01

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시뮬레이션 모델

BSDL Model of SN74ABT8245

SCTM006.ZIP (2 KB) - BSDL Model
패키지 CAD 기호, 풋프린트 및 3D 모델
CDIP (JT) 24 Ultra Librarian
LCCC (FK) 28 Ultra Librarian

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

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