SN74AHCU04-EP

Name: SN74AHCU04-EP
Brand: TI
SKU: SN74AHCU04-EP
Price: 0.64 USD

활성

향상된 제품 6채널, 2V~5.5V 인버터

지금 주문

데이터 시트

document-pdfAcrobat Hex Inverter datasheet (영어)

SN74AHCU04-EP

활성

데이터 시트

지금 주문

제품 상세 정보

Technology family

AHC

Supply voltage (min) (V)

2

Supply voltage (max) (V)

5.5

Number of channels

6

IOL (max) (mA)

8

IOH (max) (mA)

-8

Supply current (max) (µA)

20

Input type

Standard CMOS

Output type

Push-Pull

Features

Balanced outputs, Over-voltage tolerant inputs, Unbuffered, Very high speed (tpd 5-10ns)

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

Technology family

AHC

Supply voltage (min) (V)

2

Supply voltage (max) (V)

5.5

Number of channels

6

IOL (max) (mA)

8

IOH (max) (mA)

-8

Supply current (max) (µA)

20

Input type

Standard CMOS

Output type

Push-Pull

Features

Balanced outputs, Over-voltage tolerant inputs, Unbuffered, Very high speed (tpd 5-10ns)

Rating

HiRel Enhanced Product

Operating temperature range (°C)

-55 to 125

TSSOP (PW)

14

32 mm² 5 x 6.4

Controlled Baseline
- One Assembly Site
- One Test Site
- One Fabrication Site
Extended Temperature Performance of -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree⁽¹⁾
Operating Range 2-V to 5.5-V V_CC
Unbuffered Outputs
Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)

⁽¹⁾ Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Controlled Baseline
- One Assembly Site
- One Test Site
- One Fabrication Site
Extended Temperature Performance of -55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree⁽¹⁾
Operating Range 2-V to 5.5-V V_CC
Unbuffered Outputs
Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)

⁽¹⁾ Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The ’HC04 devices contain six independent inverters. They perform the Boolean function Y = A in positive logic.

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