開發模組 (EVM) 的 GUI
AFE11612EVM-GUI — GUI for the AFE11612 evaluation module (EVM)
The AFE11612EVM-GUI is a windows-based software GUI that controls the AFE11612EVM through I2C and SPI.
產品規格表
AFE11612-SEP
- Radiation tolerant:
- Single-event latch-up (SEL) immune up to LET = 43 MeV-cm 2/mg at 125°C
- Single-event functional interrupt (SEFI) characterized up to LET = 43 MeV-cm 2/mg
- Total ionizing dose (TID) RLAT/RHA characterized up to 20 krad(Si)
- Space-enhanced plastic (space EP):
- Meets ASTM E595 outgassing specification
- Vendor item drawing (VID) V62/22614
- Military temperature range: –55°C to +125°C
- One fabrication, assembly, and test site
- Gold bond wire, NiPdAu lead finish
- Wafer lot traceability
- Extended product life cycle
- 12 monotonic, 12-bit DACs
- 0 V to 5 V output range
- DAC shutdown to user-defined level
- 16 input, 12-bit SAR ADC
- High sample rate: 500 kSPS
- 16 single-ended inputs or 2 differential and 12 single-ended inputs
- Programmable out-of-range alarms
- Eight GPIO pins
- Internal 2.5-V reference
- Two remote temperature sensors
- Internal temperature sensor
- Configurable SPI and I 2C interface
- 2.7-V to 5.5-V operation
The AFE11612-SEP is a highly integrated analog monitor and control device designed for high-density, general-purpose monitor and control systems. The device includes 12 12-bit digital-to-analog converters (DACs) and a 16-channel, 12-bit, analog-to-digital converter (ADC). The device also incorporates eight general-purpose inputs and outputs (GPIOs), two remote temperature sensor channels, and a local temperature sensor channel.
The device has an internal 2.5-V reference that sets the DAC to an output voltage range of 0 V to 5 V. The device also supports operation from an external reference. The device supports communication through both SPI-compatible and I 2C-compatible interfaces.
The device high level of integration significantly reduces component count and simplifies closed-loop system design, thus making the device a great choice for high-density applications where radiation-tolerance and board space are critical.
技術文件
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檢視所有 7 | 類型 | 標題 | 日期 | ||
|---|---|---|---|---|
| * | Data sheet | AFE11612-SEP Radiation-Tolerant, Analog Monitor and Controller With Multichannel ADC, DACs, and Temperature Sensors datasheet (Rev. A) | PDF | HTML | 2023年 9月 15日 |
| * | Radiation & reliability report | AFE11612-SEP Single-Event Effects (SEE) Test Report (Rev. A) | 2023年 9月 1日 | |
| * | Radiation & reliability report | AFE11612-SEP Total Ionizing Dose (TID) Radiation Report (Rev. B) | 2023年 1月 26日 | |
| * | Radiation & reliability report | AFE11612-SEP Reliability and Production Flow Chart (Rev. A) | PDF | HTML | 2022年 12月 23日 |
| Application note | Laser Biasing and Optical Communication Applications With the AFE11612-SEP (Rev. A) | PDF | HTML | 2024年 7月 23日 | |
| EVM User's guide | AFE11612 Evaluation Module User's Guide (Rev. A) | PDF | HTML | 2024年 6月 3日 | |
| Certificate | AFE11612EVM EU RoHS Declaration of Conformity (DoC) | 2023年 2月 1日 |
設計與開發
如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。
開發板
AFE11612EVM — AFE11612-SEP 評估模組，適用於具有溫度感測器的 12 位元類比前端 (AFE)
AFE11612EVM 是簡單易用的平台，旨在評估 AFE11612‑SEP 裝置的功能和性能。AFE11612‑SEP 是一款高度整合、低功耗、完整類比監視器和控制器，包括 16 通道 (12 位元) 類比轉數位轉換器 (ADC)、12 通道 (12 位元) 數位轉類比轉換器 (DAC)、八個 GPIO、兩個遠程溫度感測器通道，以及一個本機溫度感測器通道。該裝置也配備輸入超出範圍警報，並支援具 5-V 和 3-V 邏輯的 SPI 與 I2C 通訊協定的可配置序列介面。
模擬工具
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| HTQFP (PAP) | 64 | Ultra Librarian |
訂購與品質
內含資訊：
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
內含資訊：
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。