產品詳細資料

Configuration 1:1 SPST Number of channels 4 Power supply voltage - single (V) 5 Power supply voltage - dual (V) +/-2.5, +/-5 Protocols Analog Ron (typ) (Ω) 35 CON (typ) (pF) 5 Supply current (typ) (µA) 8 Bandwidth (MHz) 200 Operating temperature range (°C) -55 to 125 Features Break-before-make Input/output continuous current (max) (mA) 25 Rating Catalog Drain supply voltage (max) (V) 5.5 Supply voltage (max) (V) 10 Negative rail supply voltage (max) (V) 0
Configuration 1:1 SPST Number of channels 4 Power supply voltage - single (V) 5 Power supply voltage - dual (V) +/-2.5, +/-5 Protocols Analog Ron (typ) (Ω) 35 CON (typ) (pF) 5 Supply current (typ) (µA) 8 Bandwidth (MHz) 200 Operating temperature range (°C) -55 to 125 Features Break-before-make Input/output continuous current (max) (mA) 25 Rating Catalog Drain supply voltage (max) (V) 5.5 Supply voltage (max) (V) 10 Negative rail supply voltage (max) (V) 0
PDIP (N) 16 181.42 mm² 19.3 x 9.4 SOIC (D) 16 59.4 mm² 9.9 x 6
  • Wide analog-input-voltage range:

    VCC - VEE: 0V to 10V

  • Low ON resistance:
    • 45Ω (typical): VCC = 4.5V
    • 35Ω (typical): VCC = 6V
    • 30Ω (typical): VCC – VEE = 9V
  • Fast switching and propagation delay times
  • Low OFF leakage current
  • Built-in break-before-make switching
  • Logic-level translation to enable 5V logic to accommodate ±5 V analog signals
  • Wide operating temperature range: -55°C to 125°C
  • HC types:
    • 2V to 10V operation
    • High noise immunity: NIL = 30%, NIH = 30% of VCC at VCC = 5V
  • HCT types:
    • Direct LSTTL input logic compatibility, VIL= 0.8V (maximum), VIH = 2V (minimum)
    • CMOS input compatibility, II ≤ 1 µA at VOL, VOH
  • Wide analog-input-voltage range:

    VCC - VEE: 0V to 10V

  • Low ON resistance:
    • 45Ω (typical): VCC = 4.5V
    • 35Ω (typical): VCC = 6V
    • 30Ω (typical): VCC – VEE = 9V
  • Fast switching and propagation delay times
  • Low OFF leakage current
  • Built-in break-before-make switching
  • Logic-level translation to enable 5V logic to accommodate ±5 V analog signals
  • Wide operating temperature range: -55°C to 125°C
  • HC types:
    • 2V to 10V operation
    • High noise immunity: NIL = 30%, NIH = 30% of VCC at VCC = 5V
  • HCT types:
    • Direct LSTTL input logic compatibility, VIL= 0.8V (maximum), VIH = 2V (minimum)
    • CMOS input compatibility, II ≤ 1 µA at VOL, VOH

The ’HC4316 and CD74HCT4316 contain four independent digitally controlled analog switches that use silicon-gate CMOS technology to achieve operating speeds similar to LSTTL with the low power consumption of standard CMOS integrated circuits.

In addition these devices contain logic-level translation circuits that provide for analog signal switching of voltages between ±5V via 5V logic. Each switch is turned on by a high-level voltage on its select input (S) when the common Enable (E) is Low. A High E disables all switches. The digital inputs can swing between VCC and GND; the analog inputs/outputs can swing between VCC as a positive limit and VEE as a negative limit. Voltage ranges are shown in Figure 13-1 and Figure 13-2.

The ’HC4316 and CD74HCT4316 contain four independent digitally controlled analog switches that use silicon-gate CMOS technology to achieve operating speeds similar to LSTTL with the low power consumption of standard CMOS integrated circuits.

In addition these devices contain logic-level translation circuits that provide for analog signal switching of voltages between ±5V via 5V logic. Each switch is turned on by a high-level voltage on its select input (S) when the common Enable (E) is Low. A High E disables all switches. The digital inputs can swing between VCC and GND; the analog inputs/outputs can swing between VCC as a positive limit and VEE as a negative limit. Voltage ranges are shown in Figure 13-1 and Figure 13-2.

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* Data sheet CDx4HCx4316 High-Speed CMOS Logic Quad Analog Switch with Level Translation datasheet (Rev. E) PDF | HTML 2024年 7月 16日

訂購與品質

內含資訊:
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊:
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