首頁 邏輯和電壓轉換 正反器、鎖存器和暫存器 D 型正反器
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D 型正反器

SN54SC2T74-SEP

現行

具有清晰、預設和整合式位準移位器的耐輻射雙 D 型正反器

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產品規格表

SN54SC2T74-SEP

現行
產品規格表 立即訂購

產品詳細資料

Number of channels 2 Technology family SCxT Supply voltage (min) (V) 1.2 Supply voltage (max) (V) 5.5 Input type TTL-Compatible CMOS Output type Push-Pull Features Balanced outputs, Over-voltage tolerant inputs, Voltage translation Operating temperature range (°C) -55 to 125 Rating Space
Number of channels 2 Technology family SCxT Supply voltage (min) (V) 1.2 Supply voltage (max) (V) 5.5 Input type TTL-Compatible CMOS Output type Push-Pull Features Balanced outputs, Over-voltage tolerant inputs, Voltage translation Operating temperature range (°C) -55 to 125 Rating Space
TSSOP (PW) 14 32 mm² 5 x 6.4
  • Vendor item drawing available, VID V62/23632-01XE
  • Total ionizing dose characterized at 30 krad (Si)
    • Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
    • Single event transient (SET) characterized to 43 MeV-cm2 /mg
  • Wide operating range of 1.2 V to 5.5 V
  • Single-supply translating gates at 5/3.3/2.5/1.8/1.2 V V CC
    • TTL compatible inputs:
      • Up translation:
        • 1.8-V – Inputs from 1.2 V
        • 2.5-V – Inputs from 1.8 V
        • 3.3-V – Inputs from 1.8 V, 2.5 V
        • 5.0-V – Inputs from 2.5 V, 3.3 V
      • Down translation:

        • 1.2-V – Inputs from 1.8 V, 2.5 V, 3.3 V, 5.0 V

        • 1.8-V – Inputs from 2.5 V, 3.3 V, 5.0 V
        • 2.5-V – Inputs from 3.3 V, 5.0 V
        • 3.3-V – Inputs from 5.0 V
  • 5.5 V tolerant input pins
  • Output drive up to 25 mA AT 5-V
  • Latch-up performance exceeds 250 mA per JESD 17
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Product traceability
    • Meets NASAs ASTM E595 outgassing specification
  • Vendor item drawing available, VID V62/23632-01XE
  • Total ionizing dose characterized at 30 krad (Si)
    • Total ionizing dose radiation lot acceptance testing (TID RLAT) for every wafer lot to 30 krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 43 MeV-cm2 /mg
    • Single event transient (SET) characterized to 43 MeV-cm2 /mg
  • Wide operating range of 1.2 V to 5.5 V
  • Single-supply translating gates at 5/3.3/2.5/1.8/1.2 V V CC
    • TTL compatible inputs:
      • Up translation:
        • 1.8-V – Inputs from 1.2 V
        • 2.5-V – Inputs from 1.8 V
        • 3.3-V – Inputs from 1.8 V, 2.5 V
        • 5.0-V – Inputs from 2.5 V, 3.3 V
      • Down translation:

        • 1.2-V – Inputs from 1.8 V, 2.5 V, 3.3 V, 5.0 V

        • 1.8-V – Inputs from 2.5 V, 3.3 V, 5.0 V
        • 2.5-V – Inputs from 3.3 V, 5.0 V
        • 3.3-V – Inputs from 5.0 V
  • 5.5 V tolerant input pins
  • Output drive up to 25 mA AT 5-V
  • Latch-up performance exceeds 250 mA per JESD 17
  • Space enhanced plastic (SEP)
    • Controlled baseline
    • Gold bondwire
    • NiPdAu lead finish
    • One assembly and test site
    • One fabrication site
    • Military (–55°C to 125°C) temperature range
    • Extended product life cycle
    • Product traceability
    • Meets NASAs ASTM E595 outgassing specification

The SN54SC2T74-SEP contains two independent D-type positive-edge-triggered flip-flops. A low level at the preset ( PRE) input sets the output high. A low level at the clear ( CLR) input resets the output low. Preset and clear functions are asynchronous and not dependent on the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs (Q, Q) on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the input clock (CLK) signal. Following the hold-time interval, data at the data (D) input can be changed without affecting the levels at the outputs (Q, Q). The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).

The SN54SC2T74-SEP contains two independent D-type positive-edge-triggered flip-flops. A low level at the preset ( PRE) input sets the output high. A low level at the clear ( CLR) input resets the output low. Preset and clear functions are asynchronous and not dependent on the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time requirements is transferred to the outputs (Q, Q) on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a voltage level and is not directly related to the rise time of the input clock (CLK) signal. Following the hold-time interval, data at the data (D) input can be changed without affecting the levels at the outputs (Q, Q). The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.

The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).
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類型 標題 日期
* Data sheet SN54SC2T74-SEPRadiation Tolerant, Dual D-Type Flip-Flop With Integrated Translation datasheet PDF | HTML 2023年 11月 15日
* Radiation & reliability report SN54SC2T74-SEP Single Event Effects Report PDF | HTML 2024年 4月 4日
* Radiation & reliability report SN54SC2T74-SEP Total Ionizing Dose (TID) Report PDF | HTML 2023年 12月 1日
* Radiation & reliability report SN54SC2T74-SEP Production Flow and Reliability Report PDF | HTML 2023年 11月 3日
Application brief TI Space Enhanced Plastic Logic Overview and Applications in Low-Earth Orbit Satellite Platforms PDF | HTML 2024年 9月 10日

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