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TS5A4597 現行 具有流通針腳配置的 5-V、1:1 (SPST)、1 通道通用型類比開關 (低電位作動) Better parameters and wider supply range

產品詳細資料

Configuration 1:1 SPST Number of channels 1 Power supply voltage - single (V) 5 Protocols Analog Ron (typ) (Ω) 5 ON-state leakage current (max) (µA) 1 Operating temperature range (°C) -40 to 85 Input/output continuous current (max) (mA) 128 Rating Catalog Drain supply voltage (max) (V) 5.5 Supply voltage (max) (V) 5.5
Configuration 1:1 SPST Number of channels 1 Power supply voltage - single (V) 5 Protocols Analog Ron (typ) (Ω) 5 ON-state leakage current (max) (µA) 1 Operating temperature range (°C) -40 to 85 Input/output continuous current (max) (mA) 128 Rating Catalog Drain supply voltage (max) (V) 5.5 Supply voltage (max) (V) 5.5
SOT-23 (DBV) 5 8.12 mm² 2.9 x 2.8 SOT-SC70 (DCK) 5 4.2 mm² 2 x 2.1
  • 5- Switch Connection Between Two Ports
  • TTL-Compatible Control Input Levels
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)

  • 5- Switch Connection Between Two Ports
  • TTL-Compatible Control Input Levels
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)

The SN74CBTD1G125 features a single high-speed line switch. The switch is disabled when the output-enable (OE) input is high. A diode to VCC is integrated on the chip to allow for level shifting from 5-V signals at the device inputs to 3.3-V signals at the device outputs.

The SN74CBTD1G125 features a single high-speed line switch. The switch is disabled when the output-enable (OE) input is high. A diode to VCC is integrated on the chip to allow for level shifting from 5-V signals at the device inputs to 3.3-V signals at the device outputs.

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類型 標題 日期
* Data sheet SN74CBTD1G125 datasheet (Rev. L) 2006年 3月 29日

訂購與品質

內含資訊:
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊:
  • 晶圓廠位置
  • 組裝地點

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