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SN74LV4052A-EP

現行

增強型產品雙路 4 通道類比多工器/解多工器

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產品規格表

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引腳對引腳且具備與所比較裝置相同的功能
TMUX1309 現行 具有 1.8-V 邏輯控制的 2 通道 4:1 通用型類比多工器 Higher bandwidth

SN74LV4052A-EP

現行
產品規格表 立即訂購

產品詳細資料

Configuration 4:1 Number of channels 2 Power supply voltage - single (V) 1.8, 2.5, 3.3, 5 Protocols Analog Ron (typ) (Ω) 25 ON-state leakage current (max) (µA) 1 Bandwidth (MHz) 50 Operating temperature range (°C) -40 to 105 Input/output continuous current (max) (mA) 25 Rating HiRel Enhanced Product Drain supply voltage (max) (V) 5.5 Supply voltage (max) (V) 5.5
Configuration 4:1 Number of channels 2 Power supply voltage - single (V) 1.8, 2.5, 3.3, 5 Protocols Analog Ron (typ) (Ω) 25 ON-state leakage current (max) (µA) 1 Bandwidth (MHz) 50 Operating temperature range (°C) -40 to 105 Input/output continuous current (max) (mA) 25 Rating HiRel Enhanced Product Drain supply voltage (max) (V) 5.5 Supply voltage (max) (V) 5.5
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 105°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Support Mixed-Mode Voltage Operation on All Ports
  • Fast Switching
  • High On-Off Output-Voltage Ratio
  • Low Crosstalk Between Switches
  • Extremely Low Input Current
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 105°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Support Mixed-Mode Voltage Operation on All Ports
  • Fast Switching
  • High On-Off Output-Voltage Ratio
  • Low Crosstalk Between Switches
  • Extremely Low Input Current
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

This dual 4-channel CMOS analog multiplexer/demultiplexer is designed for 2-V to 5.5-V VCC operation.

The SN74LV4052A handles both analog and digital signals. Each channel permits signals with amplitudes up to 5.5 V (peak) to be transmitted in either direction.

Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for analog-to-digital and digital-to-analog conversion systems.

This dual 4-channel CMOS analog multiplexer/demultiplexer is designed for 2-V to 5.5-V VCC operation.

The SN74LV4052A handles both analog and digital signals. Each channel permits signals with amplitudes up to 5.5 V (peak) to be transmitted in either direction.

Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for analog-to-digital and digital-to-analog conversion systems.
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類型 標題 日期
* Data sheet SN74LV4052A-EP datasheet (Rev. C) 2004年 5月 11日

訂購與品質

內含資訊：
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊：
  • 晶圓廠位置
  • 組裝地點

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