TPL5110
- Supply Voltage From 1.8 V to 5.5 V
- Current Consumption at 2.5 V and 35 nA (Typical)
- Selectable Time Intervals: 100 ms to 7200 s
- Timer Accuracy: 1% (Typical)
- Resistor Selectable Time Interval
- Manual MOSFET Power On
- One-Shot Feature
The TPL5110 Nano Timer is a low power timer with an integrated MOSFET driver designed for power gating in duty cycled or battery-powered applications. Consuming only 35 nA, the TPL5110 can enable the power supply line and drastically reduce the overall system stand by current during the sleep time. Such power savings enable the use of significantly smaller batteries for energy harvesting or wireless sensor applications. The TPL5110 provides selectable timing intervals from 100 ms to 7200 s and is designed for power gating applications. In addition, the TPL5110 has a unique One-shot feature where the timer will only power the MOSFET for one cycle. The TPL5110 is available in a 6-pin SOT23 package.
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | TPL5110 Nano-Power System Timer for Power Gating datasheet (Rev. A) | PDF | HTML | 2018年 9月 27日 |
Application brief | Power Cycling an IoT System with a Nano-power System Timer | 2016年 12月 5日 | ||
Technical article | Achieve extremely long battery life in wireless sensor nodes | PDF | HTML | 2015年 6月 18日 | |
EVM User's guide | TPL5110EVM User's Guide | 2014年 12月 3日 |
設計與開發
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TPL5110EVM — TPL5110 評估模組
The TPL5110 evaluation module allows a designer to configure the timer intervals of the TPL5110 and measure its very low current consumption. Moreover the TPL5110EVM is ready to be connected to the Launchpad of MSP430F5529 in order to test its watchdog and timer features. The EVM has an on board (...)
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TIDA-00374 — 可讓鈕釦電池壽命長達 10 年以上且適用於星狀網路的濕度及溫度感測器節點參考設計
TIDA-00484 — 可讓鈕釦電池壽命長達 10 年以上且適用於 Sub-1GHz 星狀網路的濕度及溫度感測器節點
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
SOT-23-THN (DDC) | 6 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。