Detalles del producto

Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Military Supply current (max) (µA) 3000
Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Military Supply current (max) (µA) 3000
CDIP (J) 16 135.3552 mm² 19.56 x 6.92
  • BCD-to-decimal decoding or binary-to-octal decoding
  • High decoded output drive capability
  • "Positive logic" inputs and outputs……decoded outputs go high on selection
  • Medium-speed operation… tPHL, tPLH = 80 ns (typ.) @ VDD = 10 V
  • Standardized, symmetrical output characteristics
  • 100% tested for quiescent current at 20 V
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
            1 V at VDD = 5 V
            2 V at VDD = 10 V
         2.5 V at VDD = 15 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Applications:
    • Code conversion
    • Indicator-tube decoder
    • Address decoding-memory selection control

Data sheet acquired from Harris Semiconductor

  • BCD-to-decimal decoding or binary-to-octal decoding
  • High decoded output drive capability
  • "Positive logic" inputs and outputs……decoded outputs go high on selection
  • Medium-speed operation… tPHL, tPLH = 80 ns (typ.) @ VDD = 10 V
  • Standardized, symmetrical output characteristics
  • 100% tested for quiescent current at 20 V
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • Noise margin (full package-temperature range) =
            1 V at VDD = 5 V
            2 V at VDD = 10 V
         2.5 V at VDD = 15 V
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Applications:
    • Code conversion
    • Indicator-tube decoder
    • Address decoding-memory selection control

Data sheet acquired from Harris Semiconductor

CD4028 types are BCD-to-decimal or binary-to-octal decoders consisting of buffering on all 4 inputs, decoding-logic gates, and 10 output buffers. A BCD code applied to the four input, A to D, results in a high level at the selected one of 10 decimal decoded outputs. Similarly, a 3-bit binary code applied to inputs A through C is decoded in octal code at output 0 to 7 if D = "0". High drive capability is provided at all outputs to enhance dc and dynamic performance in high fan-out applications.

The CD4028B-Series types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (M, M96, MT and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

CD4028 types are BCD-to-decimal or binary-to-octal decoders consisting of buffering on all 4 inputs, decoding-logic gates, and 10 output buffers. A BCD code applied to the four input, A to D, results in a high level at the selected one of 10 decimal decoded outputs. Similarly, a 3-bit binary code applied to inputs A through C is decoded in octal code at output 0 to 7 if D = "0". High drive capability is provided at all outputs to enhance dc and dynamic performance in high fan-out applications.

The CD4028B-Series types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (M, M96, MT and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

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Documentación técnica

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Tipo Título Fecha
* Data sheet CD4028B TYPES datasheet (Rev. C) 14 oct 2003

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

Soporte y capacitación

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