인터페이스 SBC(시스템 기반 칩)

TCAN2845-Q1

미리 보기

Automotive CAN FD System Basis Chip (SBC) with partial networking

제품 상세 정보

Protocols CAN, CAN FD, SBC Number of channels 1 Supply voltage (V) 5.5 to 28 Bus fault voltage (V) -58 to 58 Signaling rate (max) (bps) 8000000 Rating Automotive
Protocols CAN, CAN FD, SBC Number of channels 1 Supply voltage (V) 5.5 to 28 Bus fault voltage (V) -58 to 58 Signaling rate (max) (bps) 8000000 Rating Automotive
VQFN (RHB) 32 25 mm² 5 x 5
  • AEC-Q100 qualified for automotive applications
  • Meets the requirements for CAN flexible data (FD) per ISO 11898-2:2024
  • Local interconnect network (LIN) physical layer specification ISO/DIS 17987–4:2024 compliant and conforms to SAEJ2602 recommended practice for LIN
  • Functional Safety Quality-Managed
  • Simplifies system power management with up to three regulators
    • Low drop out (LDO) regulator supporting up to 250mA for 3.3V or 5V MCUs (VCC1)
    • Short-to-battery protected 5V LDO regulator supporting up to 200mA externally (VCC2)
    • Control of an external PNP transistor supporting up to 350mA at 1.8V, 2.5V, 3.3V or 5V (VEXCC)
  • Multiple methods to wake from sleep mode
    • CAN and LIN bus wake up pattern (WUP)
    • Optional, CAN selective wake up frame (WUF) capability (partial networking)
    • Local wake up (LWU) via WAKE pins
      • Cyclic sensing wake up support with HSS4
    • Digital wake up using the SW pin
  • Four high-side switches for loads up to 150mA
  • Protection and Diagnostic Features
    • Timeout, window and Q&A watchdog support
    • Undervoltage (UV), overvoltage (OV) and short-circuit supervision on regulator outputs

    • Fail-safe output (LIMP)

    • UV supervision of VSUP and VHSS; OV supervision of VHSS

    • Advanced CAN bus fault diagnostics

    • ±58V CAN bus fault tolerance

    • Integrated system level ESD protection

  • Customer-accessible EEPROM to save device configuration
  • QFN (32) package with improved automated optical inspection (AOI) capability
  • AEC-Q100 qualified for automotive applications
  • Meets the requirements for CAN flexible data (FD) per ISO 11898-2:2024
  • Local interconnect network (LIN) physical layer specification ISO/DIS 17987–4:2024 compliant and conforms to SAEJ2602 recommended practice for LIN
  • Functional Safety Quality-Managed
  • Simplifies system power management with up to three regulators
    • Low drop out (LDO) regulator supporting up to 250mA for 3.3V or 5V MCUs (VCC1)
    • Short-to-battery protected 5V LDO regulator supporting up to 200mA externally (VCC2)
    • Control of an external PNP transistor supporting up to 350mA at 1.8V, 2.5V, 3.3V or 5V (VEXCC)
  • Multiple methods to wake from sleep mode
    • CAN and LIN bus wake up pattern (WUP)
    • Optional, CAN selective wake up frame (WUF) capability (partial networking)
    • Local wake up (LWU) via WAKE pins
      • Cyclic sensing wake up support with HSS4
    • Digital wake up using the SW pin
  • Four high-side switches for loads up to 150mA
  • Protection and Diagnostic Features
    • Timeout, window and Q&A watchdog support
    • Undervoltage (UV), overvoltage (OV) and short-circuit supervision on regulator outputs

    • Fail-safe output (LIMP)

    • UV supervision of VSUP and VHSS; OV supervision of VHSS

    • Advanced CAN bus fault diagnostics

    • ±58V CAN bus fault tolerance

    • Integrated system level ESD protection

  • Customer-accessible EEPROM to save device configuration
  • QFN (32) package with improved automated optical inspection (AOI) capability

The TCAN284x-Q1 is a family of system basis chips (SBC) that provide a control area network flexible data rate capable (CAN FD) transceiver that supports selective wake. The TCAN2847x-Q1 includes a local interconnect network (LIN) transceiver. The CAN FD transceiver supports data rates up to 8Mbps while the LIN transceiver supports fast mode data rates up to 200kbps. The VCC1 LDO provides 3.3V or 5V ±2% with up to 250mA of current and determines the digital IO logic levels. If more current is needed, an external PNP transistor can be used to support up to 350mA and voltages of 1.8V, 2.5V, 3.3V or 5V. VCC2 LDO provides 5V up to 200mA.

The TCAN284x-Q1 includes features such as LIMP, three local wake inputs and four high side switches. The high side switch can be on/off, 10-bit PWM or timer controlled. Controlling an external CAN FD, LIN transceiver, CAN SBC or LIN SBC is possible using the GFO pin. The WAKE pins can be configured for static sensing, cyclic sensing (with HSS4 pin) and pulse based for waking up. These devices provide EEPROM to store specific device configuration information; thus, avoiding extensive reprogramming after power fluctuations. WAKE1 and WAKE2 can enable an internal switch between pins to enable external VBAT monitoring. WAKE3 can be configured as a direct drive control pin for any combinations of high-side switches when cyclic sensing wake is enabled.

The TCAN284x-Q1 is a family of system basis chips (SBC) that provide a control area network flexible data rate capable (CAN FD) transceiver that supports selective wake. The TCAN2847x-Q1 includes a local interconnect network (LIN) transceiver. The CAN FD transceiver supports data rates up to 8Mbps while the LIN transceiver supports fast mode data rates up to 200kbps. The VCC1 LDO provides 3.3V or 5V ±2% with up to 250mA of current and determines the digital IO logic levels. If more current is needed, an external PNP transistor can be used to support up to 350mA and voltages of 1.8V, 2.5V, 3.3V or 5V. VCC2 LDO provides 5V up to 200mA.

The TCAN284x-Q1 includes features such as LIMP, three local wake inputs and four high side switches. The high side switch can be on/off, 10-bit PWM or timer controlled. Controlling an external CAN FD, LIN transceiver, CAN SBC or LIN SBC is possible using the GFO pin. The WAKE pins can be configured for static sensing, cyclic sensing (with HSS4 pin) and pulse based for waking up. These devices provide EEPROM to store specific device configuration information; thus, avoiding extensive reprogramming after power fluctuations. WAKE1 and WAKE2 can enable an internal switch between pins to enable external VBAT monitoring. WAKE3 can be configured as a direct drive control pin for any combinations of high-side switches when cyclic sensing wake is enabled.

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* Data sheet TCAN284x-Q1 Automotive CAN FD and LIN System Basis Chip (SBC) with Wake Inputs and High-side Switches datasheet PDF | HTML 2024/11/19

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평가 보드

TCAN284XEVM — TCAN284x evaluation module

The TCAN284XEVM is an evaluation module that supports testing any CAN and LIN integrated system basis chip (SBC) within the TCAN284xx and TCAN285xx families of devices. All IC signals are available on the board, and device features are accessible through the board's components.
사용 설명서: PDF | HTML
설계 툴

TCAN28XX-Q1-DESIGN CAN FD / CAN FD SIC and LIN system basis chips (SBC) full data sheets and design resources

Automotive CAN FD / CAN FD SIC and LIN system basis chip (SBC) with integrated watchdog, partial networking, and high side switches
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제품
SBC(시스템 기반 칩)
TCAN2845-Q1 Automotive CAN FD System Basis Chip (SBC) with partial networking TCAN2847-Q1 Automotive CAN FD and LIN System Basis Chip (SBC) with partial networking TCAN2857-Q1 Automotive CAN FD SIC and LIN System Basis Chip (SBC) with partial networking
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VQFN (RHB) 32 Ultra Librarian

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  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
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