인터페이스 SBC(시스템 기반 칩)

TCAN2857-Q1

미리 보기

Automotive CAN FD SIC and LIN System Basis Chip (SBC) with partial networking

제품 상세 정보

Protocols CAN, CAN FD, CAN FD SIC, LIN, SBC Number of channels 1 Supply voltage (V) 5.5 to 28 Bus fault voltage (V) -58 to 58 Signaling rate (max) (bps) 8000000 Rating Automotive
Protocols CAN, CAN FD, CAN FD SIC, LIN, SBC Number of channels 1 Supply voltage (V) 5.5 to 28 Bus fault voltage (V) -58 to 58 Signaling rate (max) (bps) 8000000 Rating Automotive
VQFN (RHB) 32 25 mm² 5 x 5
  • AEC-Q100 qualified for automotive applications
  • Meets the requirements for CAN flexible data (FD) including the signal improvement capability (SIC) per ISO 11898-2:2024
  • Local interconnect network (LIN) physical layer specification ISO/DIS 17987–4:2024 compliant and conforms to SAEJ2602 recommended practice for LIN
  • Functional Safety Quality-Managed
  • Simplifies system power management with up to three regulators
    • Low drop out (LDO) regulator supporting up to 250mA for 3.3V or 5V MCUs (VCC1)
    • Short-to-battery protected 5V LDO regulator supporting up to 200mA externally (VCC2)
    • Control of an external PNP transistor supporting up to 350mA at 1.8V, 2.5V, 3.3V or 5V (VEXCC)
  • Multiple methods to wake from sleep mode
    • CAN and LIN bus wake up pattern (WUP)
    • Optional, CAN selective wake up frame (WUF) capability (partial networking)
    • Local wake up (LWU) via WAKE pins
      • Cyclic sensing wake up support with HSS4
    • Digital wake up using the SW pin
  • Four high-side switches for loads up to 150mA
  • Protection and Diagnostic Features
    • Timeout, window and Q&A watchdog support
    • Undervoltage (UV), overvoltage (OV) and short-circuit supervision on regulator outputs

    • Fail-safe output (LIMP)

    • UV supervision of VSUP and VHSS; OV supervision of VHSS

    • Advanced CAN bus fault diagnostics

    • ±58V CAN bus fault tolerance

    • Integrated system level ESD protection

  • Customer-accessible EEPROM to save device configuration
  • QFN (32) package with improved automated optical inspection (AOI) capability
  • AEC-Q100 qualified for automotive applications
  • Meets the requirements for CAN flexible data (FD) including the signal improvement capability (SIC) per ISO 11898-2:2024
  • Local interconnect network (LIN) physical layer specification ISO/DIS 17987–4:2024 compliant and conforms to SAEJ2602 recommended practice for LIN
  • Functional Safety Quality-Managed
  • Simplifies system power management with up to three regulators
    • Low drop out (LDO) regulator supporting up to 250mA for 3.3V or 5V MCUs (VCC1)
    • Short-to-battery protected 5V LDO regulator supporting up to 200mA externally (VCC2)
    • Control of an external PNP transistor supporting up to 350mA at 1.8V, 2.5V, 3.3V or 5V (VEXCC)
  • Multiple methods to wake from sleep mode
    • CAN and LIN bus wake up pattern (WUP)
    • Optional, CAN selective wake up frame (WUF) capability (partial networking)
    • Local wake up (LWU) via WAKE pins
      • Cyclic sensing wake up support with HSS4
    • Digital wake up using the SW pin
  • Four high-side switches for loads up to 150mA
  • Protection and Diagnostic Features
    • Timeout, window and Q&A watchdog support
    • Undervoltage (UV), overvoltage (OV) and short-circuit supervision on regulator outputs

    • Fail-safe output (LIMP)

    • UV supervision of VSUP and VHSS; OV supervision of VHSS

    • Advanced CAN bus fault diagnostics

    • ±58V CAN bus fault tolerance

    • Integrated system level ESD protection

  • Customer-accessible EEPROM to save device configuration
  • QFN (32) package with improved automated optical inspection (AOI) capability

The TCAN285x-Q1 is a family of system basis chips (SBC) that provide a control area network flexible data rate capable (CAN FD) SICtransceiver that supports selective wake. The TCAN2857-Q1 includes a local interconnect network (LIN) transceiver. The CAN FD SICtransceiver supports data rates up to 8Mbps while the LIN transceiver supports fast mode data rates up to 200kbps. The VCC1 LDO provides 3.3V or 5V ±2% with up to 250mA of current and determines the digital IO logic levels. If more current is needed, an external PNP transistor can be used to support up to 350mA and voltages of 1.8V, 2.5V, 3.3V or 5V. VCC2 LDO provides 5V up to 200mA.

The TCAN285x-Q1 includes features such as LIMP, three local wake inputs and four high side switches. The high side switch can be on/off, 10-bit PWM or timer controlled. Controlling an external CAN FD, LIN transceiver, CAN SBC or LIN SBC is possible using the GFO pin. The WAKE pins can be configured for static sensing, cyclic sensing (with HSS4 pin) and pulse based for waking up. These devices provide EEPROM to store specific device configuration information; thus, avoiding extensive reprogramming after power fluctuations. WAKE1 and WAKE2 can enable an internal switch between pins to enable external VBAT monitoring. WAKE3 can be configured as a direct drive control pin for any combinations of high-side switches when cyclic sensing wake is enabled.

The TCAN285x-Q1 is a family of system basis chips (SBC) that provide a control area network flexible data rate capable (CAN FD) SICtransceiver that supports selective wake. The TCAN2857-Q1 includes a local interconnect network (LIN) transceiver. The CAN FD SICtransceiver supports data rates up to 8Mbps while the LIN transceiver supports fast mode data rates up to 200kbps. The VCC1 LDO provides 3.3V or 5V ±2% with up to 250mA of current and determines the digital IO logic levels. If more current is needed, an external PNP transistor can be used to support up to 350mA and voltages of 1.8V, 2.5V, 3.3V or 5V. VCC2 LDO provides 5V up to 200mA.

The TCAN285x-Q1 includes features such as LIMP, three local wake inputs and four high side switches. The high side switch can be on/off, 10-bit PWM or timer controlled. Controlling an external CAN FD, LIN transceiver, CAN SBC or LIN SBC is possible using the GFO pin. The WAKE pins can be configured for static sensing, cyclic sensing (with HSS4 pin) and pulse based for waking up. These devices provide EEPROM to store specific device configuration information; thus, avoiding extensive reprogramming after power fluctuations. WAKE1 and WAKE2 can enable an internal switch between pins to enable external VBAT monitoring. WAKE3 can be configured as a direct drive control pin for any combinations of high-side switches when cyclic sensing wake is enabled.

다운로드 스크립트와 함께 비디오 보기 동영상
Request more information

The full data sheet and additional resources are available. Request now

기술 자료

star =TI에서 선정한 이 제품의 인기 문서
검색된 결과가 없습니다. 검색어를 지우고 다시 시도하십시오.
1개 모두 보기
유형 직함 날짜
* Data sheet TCAN285x-Q1 Automotive CAN FD SIC and LIN System Basis Chip (SBC) with Wake Inputs and High-side Switches datasheet PDF | HTML 2024/11/19

설계 및 개발

추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.

평가 보드

TCAN284XEVM — TCAN284x evaluation module

The TCAN284XEVM is an evaluation module that supports testing any CAN and LIN integrated system basis chip (SBC) within the TCAN284xx and TCAN285xx families of devices. All IC signals are available on the board, and device features are accessible through the board's components.
사용 설명서: PDF | HTML
시뮬레이션 툴

PSPICE-FOR-TI — TI 설계 및 시뮬레이션 툴용 PSpice®

TI용 PSpice®는 아날로그 회로의 기능을 평가하는 데 사용되는 설계 및 시뮬레이션 환경입니다. 완전한 기능을 갖춘 이 설계 및 시뮬레이션 제품군은 Cadence®의 아날로그 분석 엔진을 사용합니다. 무료로 제공되는 TI용 PSpice에는 아날로그 및 전력 포트폴리오뿐 아니라 아날로그 행동 모델에 이르기까지 업계에서 가장 방대한 모델 라이브러리 중 하나가 포함되어 있습니다.

TI 설계 및 시뮬레이션 환경용 PSpice는 기본 제공 라이브러리를 이용해 복잡한 혼합 신호 설계를 시뮬레이션할 수 있습니다. 레이아웃 및 제작에 (...)
시뮬레이션 툴

TINA-TI — SPICE 기반 아날로그 시뮬레이션 프로그램

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
사용 설명서: PDF
패키지 CAD 기호, 풋프린트 및 3D 모델
VQFN (RHB) 32 Ultra Librarian

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

권장 제품에는 본 TI 제품과 관련된 매개 변수, 평가 모듈 또는 레퍼런스 디자인이 있을 수 있습니다.

지원 및 교육

TI 엔지니어의 기술 지원을 받을 수 있는 TI E2E™ 포럼

콘텐츠는 TI 및 커뮤니티 기고자에 의해 "있는 그대로" 제공되며 TI의 사양으로 간주되지 않습니다. 사용 약관을 참조하십시오.

품질, 패키징, TI에서 주문하는 데 대한 질문이 있다면 TI 지원을 방문하세요. ​​​​​​​​​​​​​​

동영상