AFE3256

現行

適用於動態及半動態 X 光和平板偵測器的 256 通道類比前端 (AFE)

產品詳細資料

Number of input channels 256 Resolution (Bits) 16 Features Internal Reference Buffer, Nap Mode, Power Down, X-ray Interface type SPI/LVDS Operating temperature range (°C) 0 to 70 Rating Catalog
Number of input channels 256 Resolution (Bits) 16 Features Internal Reference Buffer, Nap Mode, Power Down, X-ray Interface type SPI/LVDS Operating temperature range (°C) 0 to 70 Rating Catalog
COF (TFU) 320 1064 mm² 38 x 28 COF (TFV) 315 831.84 mm² 48 x 17.33
  • 256 channels
  • On-chip, 16-bit ADC
  • High performance:
    • Noise: 440 electrons RMS (1.2-pC input charge range)
    • Low correlated noise
    • Full-channel integral nonlinearity: ±2 LSB at 16 bit
    • Scan time: < 16 µs to 204.8 µs
  • Integration:
    • Programmable full-scale input charge range: 0.3pC to 12.5pC with resolution of 0.3pC
    • Internal timing generator (TG)
    • Built-in correlated double sampler
    • Software programmable electron or hole integration mode
    • Pipelined integrate-and-read for improved throughput—data-read during integration
    • Serial LVDS output
    • On-chip temperature sensor
  • Simple power supply scheme:
    • Single 1.85V power supply operation
  • Multiple power modes with power consumption ranging from 1mW/ch to 2mW/ch
  • Power-down modes: sleep and standby
  • Binning mode support
  • Custom chip-on-film (COF) packages
  • 256 channels
  • On-chip, 16-bit ADC
  • High performance:
    • Noise: 440 electrons RMS (1.2-pC input charge range)
    • Low correlated noise
    • Full-channel integral nonlinearity: ±2 LSB at 16 bit
    • Scan time: < 16 µs to 204.8 µs
  • Integration:
    • Programmable full-scale input charge range: 0.3pC to 12.5pC with resolution of 0.3pC
    • Internal timing generator (TG)
    • Built-in correlated double sampler
    • Software programmable electron or hole integration mode
    • Pipelined integrate-and-read for improved throughput—data-read during integration
    • Serial LVDS output
    • On-chip temperature sensor
  • Simple power supply scheme:
    • Single 1.85V power supply operation
  • Multiple power modes with power consumption ranging from 1mW/ch to 2mW/ch
  • Power-down modes: sleep and standby
  • Binning mode support
  • Custom chip-on-film (COF) packages

The AFE3256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detector (FPD) based digital X-ray systems. The device includes 256 integrators, correlated double samplers (CDSs) with dual banking, and 256:2 analog multiplexers. The device also features two 16-bit successive-approximation register (SAR) analog-to-digital converters (ADCs). Serial data from the ADCs are available in low-voltage differential signaling (LVDS) format.

The device, also commonly referred to as a readout integrated circuit (ROIC), optimizes the overall system performance using features such as multiple power modes and in-system debug options.

The sleep and standby modes enable substantial power saving which is critical for battery-powered systems.

The AFE3256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detector (FPD) based digital X-ray systems. The device includes 256 integrators, correlated double samplers (CDSs) with dual banking, and 256:2 analog multiplexers. The device also features two 16-bit successive-approximation register (SAR) analog-to-digital converters (ADCs). Serial data from the ADCs are available in low-voltage differential signaling (LVDS) format.

The device, also commonly referred to as a readout integrated circuit (ROIC), optimizes the overall system performance using features such as multiple power modes and in-system debug options.

The sleep and standby modes enable substantial power saving which is critical for battery-powered systems.

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類型 標題 日期
* Data sheet AFE3256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors datasheet (Rev. A) PDF | HTML 2024年 4月 24日
Certificate AFE3256EVM EU Declaration of Conformity (DoC) 2023年 9月 18日
Analog Design Journal Selecting a multichannel ultra-low-current measurement IC PDF | HTML 2022年 3月 18日

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AFE3256EVM — 適用於 X 光平板偵測器之 256 通道類比前端 (AFE) 的 AFE3256 評估模組

AFE3256 評估模組 (EVM) 用於評估 AFE3256 產品,這是一款採用覆晶式薄膜 (COF) 封裝的低功耗、低雜訊充電讀出 IC (充電至數位轉換器)。EVM 包含一個類比電路板,該電路板與 TSWDC155EVM (FPGA EVM) 無縫整合以進行數據擷取。EVM 包含所有必要的控制訊號及板載功率產生,所以能大幅降低對外部設備的需求。此 EVM 也包括適用於 Microsoft® Windows® 且易於使用的軟體,可協助快速評估產品功能和性能。

驅動程式或資料庫

AFE3256-DESIGN AFE3256 design files

AFE3256 datasheet, COF package drawings, EVM GUI/user guide and other design resources
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產品
數位 X 光 AFE
AFE3256 適用於動態及半動態 X 光和平板偵測器的 256 通道類比前端 (AFE)
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PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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COF (TFU) 320 Ultra Librarian
COF (TFV) 315 Ultra Librarian

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