產品詳細資料

Rating Space Architecture Gate driver Vs ABS (max) (V) 100 Operating temperature range (°C) -55 to 125
Rating Space Architecture Gate driver Vs ABS (max) (V) 100 Operating temperature range (°C) -55 to 125
TSSOP (PW) 20 41.6 mm² 6.5 x 6.4
  • 40V Three Phase Half-Bridge Gate driver
    • Drives N-Channel MOSFETs (NMOS)
    • Gate Driver Supply (GVDD): 5-15V
    • MOSFET supply (SHx) supports up to 40V
  • Target Radiation Performance
    • SEL, SEB, and SET immune up to LET = 43 MeV-cm2 /mg
    • SET and SEFI characterized up to LET = 43 MeV-cm2 /mg
    • TID assured for every wafer lot up to 30 krad(Si)
    • TID characterized up to 30 krad(Si)
  • Space-enhanced plastic (space EP):
    • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication site
    • Extended Product Life Cycle
    • Product Traceability
  • Integrated Bootstrap Diodes
  • Supports Inverting and Non-Inverting INLx inputs
  • Bootstrap gate drive architecture
    • 750mA source current
    • 1.5- sink current
  • Low leakage current on SHx pins (<55µA)
  • Absolute maximum BSTx voltage up to 57.5V
  • Supports negative transients up to -22V on SHx
  • Built-in cross conduction prevention
  • Fixed deadtime insertion of 200nS
  • Supports 3.3V and 5V logic inputs with 20V Abs max
  • 4nS typical propagation delay matching
  • Compact TSSOP package
  • Efficient system design with Power Blocks
  • Integrated protection features
    • BST undervoltage lockout (BSTUV)
    • GVDD undervoltage (GVDDUV)
  • 40V Three Phase Half-Bridge Gate driver
    • Drives N-Channel MOSFETs (NMOS)
    • Gate Driver Supply (GVDD): 5-15V
    • MOSFET supply (SHx) supports up to 40V
  • Target Radiation Performance
    • SEL, SEB, and SET immune up to LET = 43 MeV-cm2 /mg
    • SET and SEFI characterized up to LET = 43 MeV-cm2 /mg
    • TID assured for every wafer lot up to 30 krad(Si)
    • TID characterized up to 30 krad(Si)
  • Space-enhanced plastic (space EP):
    • Controlled Baseline
    • One Assembly/Test Site
    • One Fabrication site
    • Extended Product Life Cycle
    • Product Traceability
  • Integrated Bootstrap Diodes
  • Supports Inverting and Non-Inverting INLx inputs
  • Bootstrap gate drive architecture
    • 750mA source current
    • 1.5- sink current
  • Low leakage current on SHx pins (<55µA)
  • Absolute maximum BSTx voltage up to 57.5V
  • Supports negative transients up to -22V on SHx
  • Built-in cross conduction prevention
  • Fixed deadtime insertion of 200nS
  • Supports 3.3V and 5V logic inputs with 20V Abs max
  • 4nS typical propagation delay matching
  • Compact TSSOP package
  • Efficient system design with Power Blocks
  • Integrated protection features
    • BST undervoltage lockout (BSTUV)
    • GVDD undervoltage (GVDDUV)

DRV8351-SEP is a three phase half-bridge gate driver, capable of driving high-side and low-side N-channel power MOSFETs. The DRV8351-SEPD generates the correct gate drive voltages using an integrated bootstrap diode and external capacitor for the high-side MOSFETs. GVDD is used to generate gate drive voltage for the low-side MOSFETs. The Gate Drive architecture supports peak up to 750mA source and 1.5A sink currents.

The phase pins SHx are able to tolerate significant negative voltage transients; while high side gate driver supply BSTx and GHx can support higher positive voltage transients (57.5V) abs max voltage which improve the robustness of the system. Small propagation delay and delay matching specifications minimize the dead-time requirement which further improves efficiency. Undervoltage protection is provided for both low and high sides through GVDD and BST undervoltage lockout.

DRV8351-SEP is a three phase half-bridge gate driver, capable of driving high-side and low-side N-channel power MOSFETs. The DRV8351-SEPD generates the correct gate drive voltages using an integrated bootstrap diode and external capacitor for the high-side MOSFETs. GVDD is used to generate gate drive voltage for the low-side MOSFETs. The Gate Drive architecture supports peak up to 750mA source and 1.5A sink currents.

The phase pins SHx are able to tolerate significant negative voltage transients; while high side gate driver supply BSTx and GHx can support higher positive voltage transients (57.5V) abs max voltage which improve the robustness of the system. Small propagation delay and delay matching specifications minimize the dead-time requirement which further improves efficiency. Undervoltage protection is provided for both low and high sides through GVDD and BST undervoltage lockout.

下載 觀看有字幕稿的影片 影片

技術文件

star =TI 所選的此產品重要文件
找不到結果。請清除您的搜尋條件,然後再試一次。
檢視所有 2
類型 標題 日期
* Data sheet DRV8351-SEP: 40-V Three-Phase BLDC Gate Driver datasheet PDF | HTML 2024年 12月 9日
* Radiation & reliability report DRV8351-SEP Total Ionizing Dose (TID) Report PDF | HTML 2024年 12月 12日

設計與開發

如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。

開發板

DRV8351EVM — DRV8351 評估模組

DRV8351 是適用於三相位馬達驅動應用的閘極驅動器 IC,且提供三個高準確度修整和溫度補償功能的半橋驅動器,每個驅動器都可驅動高壓側及低壓側 N 型 MOSFET。除了 DRV8351 的硬體外,TMS320F280049C 微控制器架構電路板也具有參考軟體,會將必要的訊號傳送至 DRV8351 以轉動三相位無刷 DC 馬達。GUI Composer 軟體可讓使用者對設定進行編程、讓馬達旋轉,並監控系統是否有故障狀況。
使用指南: PDF | HTML
TI.com 無法提供
封裝 針腳 CAD 符號、佔位空間與 3D 模型
TSSOP (PW) 20 Ultra Librarian

訂購與品質

內含資訊:
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊:
  • 晶圓廠位置
  • 組裝地點

支援與培訓

內含 TI 工程師技術支援的 TI E2E™ 論壇

內容係由 TI 和社群貢獻者依「現狀」提供,且不構成 TI 規範。檢視使用條款

若有關於品質、封裝或訂購 TI 產品的問題,請參閱 TI 支援。​​​​​​​​​​​​​​

影片