홈 로직 및 전압 변환 플립플롭, 래치 및 레지스터 D형 래치
홈
로직 및 전압 변환
플립플롭, 래치 및 레지스터
D형 래치

CD4042B

활성

CMOS 쿼드 클록 'D' 래치

지금 주문
데이터 시트

CD4042B

활성
데이터 시트 지금 주문

제품 상세 정보

Number of channels 4 Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Input type Standard CMOS Output type CMOS Clock frequency (max) (MHz) 8 IOL (max) (mA) 2.4 IOH (max) (mA) -2.4 Supply current (max) (µA) 600 Features High speed (tpd 10-50ns), Partial power down (Ioff), Standard speed (tpd > 50ns) Operating temperature range (°C) -55 to 125 Rating Catalog
Number of channels 4 Technology family CD4000 Supply voltage (min) (V) 3 Supply voltage (max) (V) 18 Input type Standard CMOS Output type CMOS Clock frequency (max) (MHz) 8 IOL (max) (mA) 2.4 IOH (max) (mA) -2.4 Supply current (max) (µA) 600 Features High speed (tpd 10-50ns), Partial power down (Ioff), Standard speed (tpd > 50ns) Operating temperature range (°C) -55 to 125 Rating Catalog
PDIP (N) 16 181.42 mm² 19.3 x 9.4 SOIC (D) 16 59.4 mm² 9.9 x 6 SOIC (DW) 16 106.09 mm² 10.3 x 10.3 SOP (NS) 16 79.56 mm² 10.2 x 7.8 TSSOP (PW) 16 32 mm² 5 x 6.4
  • Clock polarity control
  • Q and Q\ outputs
  • Common Clock
  • Low power TTL compatible
  • Standardized, symmetrical output characteristics
  • 100% tested for quiescent current at 20 V
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Noise margin (full package-temperature range) =
            1 V at VDD = 5 V
            2 V at VDD = 10 V
         2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Applications:
    • Buffer storage
    • Holding register
    • General digital logic

Data sheet acquired from Harris Semiconductor
  • Clock polarity control
  • Q and Q\ outputs
  • Common Clock
  • Low power TTL compatible
  • Standardized, symmetrical output characteristics
  • 100% tested for quiescent current at 20 V
  • Maximum input current of 1 µA at 18 V over full package-temperature range; 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Noise margin (full package-temperature range) =
            1 V at VDD = 5 V
            2 V at VDD = 10 V
         2.5 V at VDD = 15 V
  • Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of ’B’ Series CMOS Devices"
  • Applications:
    • Buffer storage
    • Holding register
    • General digital logic

Data sheet acquired from Harris Semiconductor

CD4042B types contain four latch circuits, each strobed by a common clock. Complementary buffered outputs are available from each circuit. The impedance of the n- and p-channel output devices is balanced and all outputs are electrically identical.

Information present at the data input is transferred to outputs Q and Q\ during the CLOCK level which is programmed by the POLARITY input. For POLARITY = 0 the transfer occurs during the 0 CLOCK level and for POLARITY = 1 the transfer occurs during the 1 CLOCK level. The outputs follow the data input providing the CLOCK and POLARITY levels defined above are present. When a CLOCK transition occurs (positive for POLARITY = 0 and negative for POLARITY = 1) the information present at the input during the CLOCK transition is retained at the output until an opposite CLOCK transition occurs.

The CD4042B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffixes), 16-lead dual-in-line plastic package (E suffix), 16-lead small-outline packages (D, DR, DT, DW, DWR, and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

CD4042B types contain four latch circuits, each strobed by a common clock. Complementary buffered outputs are available from each circuit. The impedance of the n- and p-channel output devices is balanced and all outputs are electrically identical.

Information present at the data input is transferred to outputs Q and Q\ during the CLOCK level which is programmed by the POLARITY input. For POLARITY = 0 the transfer occurs during the 0 CLOCK level and for POLARITY = 1 the transfer occurs during the 1 CLOCK level. The outputs follow the data input providing the CLOCK and POLARITY levels defined above are present. When a CLOCK transition occurs (positive for POLARITY = 0 and negative for POLARITY = 1) the information present at the input during the CLOCK transition is retained at the output until an opposite CLOCK transition occurs.

The CD4042B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffixes), 16-lead dual-in-line plastic package (E suffix), 16-lead small-outline packages (D, DR, DT, DW, DWR, and NSR suffixes), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).
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기술 자료

star =TI에서 선정한 이 제품의 인기 문서
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8개 모두 보기
유형 직함 날짜
* Data sheet CD4042B TYPES datasheet (Rev. D) 2003/10/14
Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 2022/12/15
Selection guide Logic Guide (Rev. AB) 2017/06/12
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015/12/02
User guide LOGIC Pocket Data Book (Rev. B) 2007/01/16
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004/07/08
User guide Signal Switch Data Book (Rev. A) 2003/11/14
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 2001/12/03

설계 및 개발

추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.

평가 보드

14-24-LOGIC-EVM — 14핀~24핀 D, DB, DGV, DW, DYY, NS 및 PW 패키지용 로직 제품 일반 평가 모듈

14-24-LOGIC-EVM 평가 모듈(EVM)은 14핀~24핀 D, DW, DB, NS, PW, DYY 또는 DGV 패키지에 있는 모든 로직 장치를 지원하도록 설계되었습니다.

사용 설명서: PDF | HTML
TI.com에서 구매 불가
패키지 핀 CAD 기호, 풋프린트 및 3D 모델
PDIP (N) 16 Ultra Librarian
SOIC (D) 16 Ultra Librarian
SOIC (DW) 16 Ultra Librarian
SOP (NS) 16 Ultra Librarian
TSSOP (PW) 16 Ultra Librarian
TI의 평가 항목에 대한 표준 약관이 적용됩니다.

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

지원 및 교육

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포럼 주제 모두 보기(영문)

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