홈 로직 및 전압 변환 플립플롭, 래치 및 레지스터 시프트 레지스터
홈
로직 및 전압 변환
플립플롭, 래치 및 레지스터
시프트 레지스터

SN74HC165-EP

구형

향상된 제품 8비트 병렬 부하 시프트 레지스터

지금 주문
데이터 시트
SN74HC165-EP은(는) 더 이상 생산되지 않습니다.
이 제품은 더 이상 생산되지 않습니다. 새로운 설계는 대체 제품을 고려해야 합니다.
open-in-new 대안 비교
비교 대상 장치보다 업그레이드된 기능을 지원하는 드롭인 대체품
SN74HC165B-EP 활성 향상된 제품 8비트 병렬 부하 시프트 레지스터 Replacement

SN74HC165-EP

구형
데이터 시트 지금 주문

제품 상세 정보

Configuration Parallel-in, Serial-out Bits (#) 8 Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 24 IOL (max) (mA) 5.2 IOH (max) (mA) -5.2 Supply current (max) (µA) 160 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 125 Rating HiRel Enhanced Product
Configuration Parallel-in, Serial-out Bits (#) 8 Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 24 IOL (max) (mA) 5.2 IOH (max) (mA) -5.2 Supply current (max) (µA) 160 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 125 Rating HiRel Enhanced Product
TSSOP (PW) 16 32 mm² 5 x 6.4
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up To –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 80-µA Max ICC
  • Typical tpd = 13 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max
  • Complementary Outputs
  • Direct Overriding Load (Data) Inputs
  • Gated Clock Inputs
  • Parallel-to-Serial Data Conversion

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up To –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 80-µA Max ICC
  • Typical tpd = 13 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max
  • Complementary Outputs
  • Direct Overriding Load (Data) Inputs
  • Gated Clock Inputs
  • Parallel-to-Serial Data Conversion

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74HC165 is an 8-bit parallel-load shift register that, when clocked, shifts the data toward a serial (QH) output. Parallel-in access to each stage is provided by eight individual direct data (A-H) inputs that are enabled by a low level at the shift/load (SH/LD) input. The SN74HC165 device also features a clock-inhibit (CLK INH) function and a complementary serial (QH) output.

Clocking is accomplished by a low-to-high transition of the clock (CLK) input while SH/LD\ is held high and CLK INH is held low. The functions of CLK and CLK INH are interchangeable. Since a low CLK and a low-to-high transition of CLK INH also accomplish clocking, CLK INH should be changed to the high level only while CLK is high. Parallel loading is inhibited when SH/LD\ is held high. While SH/LD\ is low, the parallel inputs to the register are enabled independently of the levels of the CLK, CLK INH, or serial (SER) inputs.

The SN74HC165 is an 8-bit parallel-load shift register that, when clocked, shifts the data toward a serial (QH) output. Parallel-in access to each stage is provided by eight individual direct data (A-H) inputs that are enabled by a low level at the shift/load (SH/LD) input. The SN74HC165 device also features a clock-inhibit (CLK INH) function and a complementary serial (QH) output.

Clocking is accomplished by a low-to-high transition of the clock (CLK) input while SH/LD\ is held high and CLK INH is held low. The functions of CLK and CLK INH are interchangeable. Since a low CLK and a low-to-high transition of CLK INH also accomplish clocking, CLK INH should be changed to the high level only while CLK is high. Parallel loading is inhibited when SH/LD\ is held high. While SH/LD\ is low, the parallel inputs to the register are enabled independently of the levels of the CLK, CLK INH, or serial (SER) inputs.
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다운로드

기술 자료

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유형 직함 날짜
* Data sheet SN74HC165-EP datasheet (Rev. A) 2004/01/06

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치