TLC2543-Q1
- Qualified for Automotive Applications
- 12-Bit-Resolution A/D Converter
- 10-µs Conversion Time Over Operating Temperature
- 11 Analog Input Channels
- Three Built-In Self-Test Modes
- Inherent Sample-and-Hold Function
- Linearity Error . . . ±1 LSB Max
- On-Chip System Clock
- End-of-Conversion Output
- Unipolar or Bipolar Output Operation (Signed Binary With Respect to 1/2 the Applied Voltage Reference)
- Programmable MSB or LSB First
- Programmable Power Down
- Programmable Output Data Length
- CMOS Technology
- Application Report Available
Microcontroller Based Data Acquisition Using the TLC2543 12-bit Serial-Out ADC (SLAA012)
The TLC2543 is a 12-bit, switched-capacitor, successive-approximation, analog-to-digital converters. Each device, with three control inputs [chip select (CS), the input-output clock, and the address input (DATA INPUT)], is designed for communication with the serial port of a host processor or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.
In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel multiplexer that can select any one of 11 inputs or any one of three internal self-test voltages. The sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high to indicate that conversion is complete. The converter incorporated in the device features differential high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating temperature range.
관심 가지실만한 유사 제품
비교 대상 장치와 동일한 기능을 지원하는 핀 대 핀
비교 대상 장치와 유사한 기능
기술 자료
유형 | 직함 | 날짜 | ||
---|---|---|---|---|
* | Data sheet | 12-Bit Analog-to-Digital Converters with Serial Control and 11 Analog Inputs datasheet (Rev. D) | 2008/05/06 |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치