DAC39RF10-SEP
- Radiation hardness assured DAC39RFx10-SP:
- Single event upset (SEU) immune registers
- Single-event latch up (SEL): 120MeV-cm2/mg
- RLAT Total ionizing dose (TID): 300krad (Si)
- Radiation tolerant DAC39RFx10-SEP:
- Single event upset (SEU) immune registers
- Single-event latch up (SEL): 43MeV-cm2/mg
- RLAT Total ionizing dose (TID): 30krad (Si)
- 16-bit, 10.4 or 20.8GSPS, multi-Nyquist DAC Cores
- Maximum input data rate:
- 8-bit, Single channel, DES mode: 20.8GSPS
- 12-bit, Single channel, DES mode: 15.5GSPS
- 16-bit, Single channel: 10.4GSPS
- 8-bit, Dual channel, 10.4GSPS
- 12-bit, Dual channel: 7.75GSPS/ch
- 16-bit, Dual channel: 6.2GSPS/ch
- Output bandwidth (-3dB): 12GHz
- Performance at fOUT = 2.997GHz, DES2XL mode, DEM/Dither off
- Noise floor (small signal): –155dBFS/Hz
- SFDR (-0.1dBFS) : 60dBc
- IMD3 (-7dBFS each tone) : –62dBc
- Additive phase noise, 10kHz offset: -138dBc/Hz
- Four Integrated digital up-converters (DUC)
- Interpolation: 1x, 2x, 3x, 4x, 6x, 8x, 12x ... 256x
- Complex baseband DUC for I/Q output
- Complex to real up conversion for dual channel direct RF sampling
- 64-bit frequency resolution NCOs
- JESD204C Interface
- Up to 16 Lanes at up to 12.8Gbps
- Class C-S, subclass-1 Compatible
- Internal AC coupling capacitors
- SYSREF Windowing for automatic SYSREF timing calibration
- Space screening and assurance:
- Meets ASTM E595 outgassing specification
- One fabrication, assembly, and test site
- Wafer lot traceability
- Extended product life cycle
- Radiation lot acceptance test (RLAT)
- Production burn-in (DAC39RFx10-SP only)
The DAC39RF10-Sx and ’RFS10-Sx are a family of dual and single channel digital-to-analog converters (DAC) with 16-bit resolution. The devices can be used as non-interpolating or interpolating DACs for either direct RF sampling or complex baseband signal generation. The maximum input data rate is 20.8GSPS for a single channel or 10.4 GSPS for two channels. The devices can generate signals of up to 10, 7.5, and 5GHz signal bandwidth (8, 12, and 16-bit input resolution) at carrier frequencies exceeding 10GHz enabling direct sampling in X-band.
The high sampling rate, output frequency range, 64-bit NCO frequency resolution and any frequency hopping with phase coherence also makes the DAC39RF10-Sx and ’RFS10-Sx capable of arbitrary waveform generation (AWG) and direct digital synthesis (DDS).
A JESD204B and JESD204C compatible serial interface has 16 receiver pairs capable of up to 12.8Gbps. The interface is JESD204B and JESD204C subclass-1 compliant for deterministic latency and multi-device synchronization through the use of SYSREF.
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DAC39RF10EVM — DAC39RF10 評估模組
DAC39RF10EVM 是用於評估德州儀器的 DAC39RF10 數位轉類比轉換器 (DAC) 的評估板。DAC39RF10 是雙通道、16/08 位元的 DAC。DAC39RF10 是具有 16 位元解析度的單雙通道數位轉類比轉換器 (DAC) 系列產品。這些裝置可做為單通道或雙通道非內插 DAC 使用。在直接射頻取樣模式或基頻模式中，裝置也可當作內插 DAC 來使用。單通道模式下的最大輸入資料速率為 20.48 GSPS，而雙通道模式或基頻模式下的最大輸入資料速率為 10.24 Gsps。裝置可在超過 8 GHz 的載波頻率下產生高達 10、7.5 及 5 GHz 訊號頻寬 (8、12 (...)
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| 封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
|---|---|---|
| FCBGA (ACL) | 256 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。