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LM2903B-Q1

現行

車用雙差分物品比較器

立即訂購
產品規格表

LM2903B-Q1

現行
產品規格表 立即訂購

產品詳細資料

Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 1 Vs (max) (V) 36 Vs (min) (V) 2 Rating Automotive Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 2.5 Rail-to-rail In to V- Operating temperature range (°C) -40 to 125 Input bias current (±) (max) (nA) 25 VICR (max) (V) 0 VICR (min) (V) 34.5 TI functional safety category Functional Safety-Capable
Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 1 Vs (max) (V) 36 Vs (min) (V) 2 Rating Automotive Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 2.5 Rail-to-rail In to V- Operating temperature range (°C) -40 to 125 Input bias current (±) (max) (nA) 25 VICR (max) (V) 0 VICR (min) (V) 34.5 TI functional safety category Functional Safety-Capable
SOIC (D) 8 29.4 mm² 4.9 x 6 SOT-23-THN (DDF) 8 8.12 mm² 2.9 x 2.8 TSSOP (PW) 8 19.2 mm² 3 x 6.4 VSSOP (DGK) 8 14.7 mm² 3 x 4.9 WSON (DSG) 8 4 mm² 2 x 2
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • Device temperature grade 0: –40°C to 150°C ambient operating temperature range (LM2903E-Q1)
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification level H1C
    • Device CDM ESD classification level C4B
  • Improved 2kV HBM ESD for "B" device
  • Tri-Temp testing available for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200uA typical per comparator ("B" Versions)
  • Low input bias current 3.5nA typical ("B" device)
  • Low input offset current 0.5nA typical ("B" device)
  • Low input offset voltage ±0.37mV typical ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36 V
  • Output compatible with TTL, MOS, and CMOS
  • Functional Safety-Capable
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • Device temperature grade 0: –40°C to 150°C ambient operating temperature range (LM2903E-Q1)
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification level H1C
    • Device CDM ESD classification level C4B
  • Improved 2kV HBM ESD for "B" device
  • Tri-Temp testing available for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200uA typical per comparator ("B" Versions)
  • Low input bias current 3.5nA typical ("B" device)
  • Low input offset current 0.5nA typical ("B" device)
  • Low input offset voltage ±0.37mV typical ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36 V
  • Output compatible with TTL, MOS, and CMOS
  • Functional Safety-Capable

The LM2903B-Q1 device is the next generation version of the industry-standard LM2903-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of two independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2V to 36V, and VCC is at least 1.5V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The LM2903-Q1 and LM2903B-Q1 are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C. The LM2903E-Q1 is Qualified for the Grade 0 extended temperature range of -40°C to +150°C.

The LM2903B-Q1 device is the next generation version of the industry-standard LM2903-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of two independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2V to 36V, and VCC is at least 1.5V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The LM2903-Q1 and LM2903B-Q1 are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C. The LM2903E-Q1 is Qualified for the Grade 0 extended temperature range of -40°C to +150°C.
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類型 標題 日期
* Data sheet LM2903-Q1 and LM2903B-Q1 Automotive Dual Comparators datasheet (Rev. M) PDF | HTML 2024年 12月 13日
Application note Application Design Guidelines for LM339, LM393, TL331 Family Comparators Including the New B-versions (Rev. F) PDF | HTML 2024年 12月 12日
Functional safety information LM2903B-Q1 Functional Safety, FIT Rate, Failure Mode Distribution and Pin FMA (Rev. A) PDF | HTML 2022年 1月 11日

設計與開發

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開發板

AMP-PDK-EVM — 放大器性能開發套件評估模組

放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件，可測試通用運算放大器 (op amp) 參數，並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項，可滿足封裝需求，使工程師能夠快速評估和驗證裝置性能。

AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝，包括：

  • D (SOIC-8 和 SOIC-14)
  • PW (TSSOP-14)
  • DGK (VSSOP-8)
  • DBV (SOT23-5 和 SOT23-6)
  • DCK (SC70-5 和 SC70-6)
使用指南: PDF | HTML
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開發板

DIP-ADAPTER-EVM — DIP 轉接器評估模組

Speed up your op amp prototyping and testing with the DIP-Adapter-EVM, which provides a fast, easy and inexpensive way to interface with small, surface-mount ICs. You can connect any supported op amp using the included Samtec terminal strips or wire them directly to existing circuits.

The (...)

使用指南: PDF
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開發板

DUAL-DIYAMP-EVM — 雙通道通用自製 (DIY) 放大器電路評估模組

The DUAL-DIYAMP-EVM is a unique evaluation module (EVM) family that provides engineers and do it yourselfers (DIYers) with real-world amplifier circuits, enabling you to quickly evaluate design concepts and verify simulations. It is designed specifically for dual package op amps in the (...)
使用指南: PDF
TI.com 無法提供
開發板

SMALL-AMP-DIP-EVM — 適用於採用小尺寸封裝之運算放大器的評估模組

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使用指南: PDF
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模擬型號

LM2903B PSpice Model (Rev. E)

SLCJ011E.ZIP (46 KB) - PSpice Model
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模擬型號

LM2903B TINA-TI Spice Model (Rev. B)

SLCM014B.ZIP (10 KB) - TINA-TI Spice Model
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模擬工具

PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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模擬工具

TINA-TI — 基於 SPICE 的類比模擬程式

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使用指南: PDF
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參考設計

TIDA-010249 — 四通道同步震動感測器介面參考設計

此參考設計闡明同步四通道寬頻高解析度介面的原理、設計與測試。主要目標為震動感測應用，但此設計也可套用至任何需要寬頻的應用項目，例如功率因數量測中三相電壓及電流監控。
Design guide: PDF
封裝 針腳 CAD 符號、佔位空間與 3D 模型
SOIC (D) 8 Ultra Librarian
SOT-23-THN (DDF) 8 Ultra Librarian
TSSOP (PW) 8 Ultra Librarian
VSSOP (DGK) 8 Ultra Librarian
WSON (DSG) 8 Ultra Librarian
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