產品詳細資料

Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 1 Vs (max) (V) 36 Vs (min) (V) 2 Vos (offset voltage at 25°C) (max) (mV) 2.5 Iq per channel (typ) (mA) 0.2 Input bias current (±) (max) (nA) 25 Rail-to-rail In to V- Rating Automotive Operating temperature range (°C) -40 to 125 VICR (max) (V) 0 VICR (min) (V) 34.5 TI functional safety category Functional Safety-Capable
Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 1 Vs (max) (V) 36 Vs (min) (V) 2 Vos (offset voltage at 25°C) (max) (mV) 2.5 Iq per channel (typ) (mA) 0.2 Input bias current (±) (max) (nA) 25 Rail-to-rail In to V- Rating Automotive Operating temperature range (°C) -40 to 125 VICR (max) (V) 0 VICR (min) (V) 34.5 TI functional safety category Functional Safety-Capable
SOIC (D) 8 29.4 mm² 4.9 x 6 SOT-23-THN (DDF) 8 8.12 mm² 2.9 x 2.8 TSSOP (PW) 8 19.2 mm² 3 x 6.4 VSSOP (DGK) 8 14.7 mm² 3 x 4.9 WSON (DSG) 8 4 mm² 2 x 2
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • Device temperature grade 0: –40°C to 150°C ambient operating temperature range (LM2903E-Q1)
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification level H1C
    • Device CDM ESD classification level C4B
  • Improved 2 kV HBM ESD for "B" device
  • Tri-Temp testing available for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200 uA typical per comparator ("B" Versions)
  • Low input bias current 3.5 nA typical ("B" device)
  • Low input offset current 0.5 nA typ ("B" device)
  • Low input offset voltage ±0.37 mV typ ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36 V
  • Output compatible with TTL, MOS, and CMOS
  • Functional Safety-Capable
  • Qualified for automotive applications
  • AEC-Q100 qualified with the following results:
    • Device temperature grade 0: –40°C to 150°C ambient operating temperature range (LM2903E-Q1)
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification level H1C
    • Device CDM ESD classification level C4B
  • Improved 2 kV HBM ESD for "B" device
  • Tri-Temp testing available for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200 uA typical per comparator ("B" Versions)
  • Low input bias current 3.5 nA typical ("B" device)
  • Low input offset current 0.5 nA typ ("B" device)
  • Low input offset voltage ±0.37 mV typ ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36 V
  • Output compatible with TTL, MOS, and CMOS
  • Functional Safety-Capable

The LM2903B-Q1 device is the next generation version of the industry-standard LM2903-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of two independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The LM2903-Q1 and LM2903B-Q1 are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C. The LM2903E-Q1 is Qualified for the Grade 0 extended temperature range of -40°C to +150°C.

The LM2903B-Q1 device is the next generation version of the industry-standard LM2903-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of two independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The LM2903-Q1 and LM2903B-Q1 are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C. The LM2903E-Q1 is Qualified for the Grade 0 extended temperature range of -40°C to +150°C.

下載 觀看有字幕稿的影片 影片

您可能會感興趣的類似產品

open-in-new 比較替代產品
具備升級功能,可直接投入使用替代所比較的產品
TLV1822-Q1 現行 車用雙路微功耗高電壓開漏極開路比較器 Upgraded rail-to-rail device with wider voltage range and improved power consumption, propagation delay and offset voltage
引腳對引腳的功能與所比較的產品相同
LM393LV-Q1 現行 車用低電壓物品比較器 Alternative for lower voltage range with improved performance: lower power, lower offset voltage and faster speed

技術文件

star =TI 所選的此產品重要文件
找不到結果。請清除您的搜尋條件,然後再試一次。
檢視所有 3
類型 標題 日期
* Data sheet LM2903-Q1 and LM2903B-Q1 Automotive Dual Comparators datasheet (Rev. L) PDF | HTML 2023年 8月 14日
Application note Application Design Guidelines for LM339, LM393, TL331 Family Comparators Including the New B-versions (Rev. E) PDF | HTML 2024年 6月 6日
Functional safety information LM2903B-Q1 Functional Safety, FIT Rate, Failure Mode Distribution and Pin FMA (Rev. A) PDF | HTML 2022年 1月 11日

設計與開發

如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。

開發板

DIP-ADAPTER-EVM — DIP 轉接器評估模組

Speed up your op amp prototyping and testing with the DIP-Adapter-EVM, which provides a fast, easy and inexpensive way to interface with small, surface-mount ICs. You can connect any supported op amp using the included Samtec terminal strips or wire them directly to existing circuits.

The (...)

使用指南: PDF
TI.com 無法提供
開發板

DUAL-DIYAMP-EVM — 雙通道通用自製 (DIY) 放大器電路評估模組

The DUAL-DIYAMP-EVM is a unique evaluation module (EVM) family that provides engineers and do it yourselfers (DIYers) with real-world amplifier circuits, enabling you to quickly evaluate design concepts and verify simulations. It is designed specifically for dual package op amps in the (...)
使用指南: PDF
TI.com 無法提供
開發板

SMALL-AMP-DIP-EVM — 適用於採用小尺寸封裝之運算放大器的評估模組

SMALL-AMP-DIP-EVM 提供快速簡易方式,與許多業界標準小型封裝進行介接,因而加速小型封裝運算放大器原型設計。SMALL-AMP-DIP-EVM 支援八個小型封裝選項,包括 DPW-5 (X2SON)、DSG-8 (WSON)、DCN-8 (SOT)、DDF-8 (SOT)、RUG-10 (X2QFN)、RUC-14 (X2QFN)、RGY-14 (VQFN) 和 RTE-16 (WQFN)。

使用指南: PDF
TI.com 無法提供
模擬型號

LM2903B PSpice Model (Rev. E)

SLCJ011E.ZIP (46 KB) - PSpice Model
模擬型號

LM2903B TINA-TI Spice Model (Rev. B)

SLCM014B.ZIP (10 KB) - TINA-TI Spice Model
模擬工具

PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
模擬工具

TINA-TI — 基於 SPICE 的類比模擬程式

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
使用指南: PDF
參考設計

TIDA-010249 — 四通道同步震動感測器介面參考設計

此參考設計闡明同步四通道寬頻高解析度介面的原理、設計與測試。主要目標為震動感測應用,但此設計也可套用至任何需要寬頻的應用項目,例如功率因數量測中三相電壓及電流監控。
Design guide: PDF
封裝 針腳 CAD 符號、佔位空間與 3D 模型
SOIC (D) 8 Ultra Librarian
SOT-23-THN (DDF) 8 Ultra Librarian
TSSOP (PW) 8 Ultra Librarian
VSSOP (DGK) 8 Ultra Librarian
WSON (DSG) 8 Ultra Librarian

訂購與品質

內含資訊:
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊:
  • 晶圓廠位置
  • 組裝地點

建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。

支援與培訓

內含 TI 工程師技術支援的 TI E2E™ 論壇

內容係由 TI 和社群貢獻者依「現狀」提供,且不構成 TI 規範。檢視使用條款

若有關於品質、封裝或訂購 TI 產品的問題,請參閱 TI 支援。​​​​​​​​​​​​​​

影片