首頁 放大器 比較器
首頁
放大器
比較器

TLC372-EP

現行

強化型產品 Lincmos 雙路差分比較器

立即訂購
產品規格表

TLC372-EP

現行
產品規格表 立即訂購

產品詳細資料

Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 0.2 Vs (max) (V) 16 Vs (min) (V) 4 Rating HiRel Enhanced Product Iq per channel (typ) (mA) 0.075 Vos (offset voltage at 25°C) (max) (mV) 5 Rail-to-rail In to V- Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 0.03 VICR (max) (V) 15 VICR (min) (V) 0
Number of channels 2 Output type Open-collector, Open-drain Propagation delay time (µs) 0.2 Vs (max) (V) 16 Vs (min) (V) 4 Rating HiRel Enhanced Product Iq per channel (typ) (mA) 0.075 Vos (offset voltage at 25°C) (max) (mV) 5 Rail-to-rail In to V- Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 0.03 VICR (max) (V) 15 VICR (min) (V) 0
SOIC (D) 8 29.4 mm² 4.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 100 V Using Machine Model (C = 200 pF, R = 0)
  • Single or Dual-Supply Operation
  • Wide Range of Supply Voltages . . .4 V to 18 V
  • Very Low Supply Current Drain . . .150 µA Typ at 5 V
  • Fast Response Time . . . 200 ns Typ for TTL-Level Input Step
  • Built-in ESD Protection
  • High Input Impedance . . . 1012 Typ
  • Extremely Low Input Bias Current. . .5 pA Typ
  • Ultrastable Low Input Offset Voltage
  • Input Offset Voltage Change at Worst-Case Input Conditions Typically 0.23 µV/Month, Including the First 30 Days
  • Common-Mode Input Voltage Range Includes Ground
  • Output Compatible With TTL, MOS, and CMOS
  • Pin-Compatible With LM393

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

LinCMOS is a trademark of Texas Instruments.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 100 V Using Machine Model (C = 200 pF, R = 0)
  • Single or Dual-Supply Operation
  • Wide Range of Supply Voltages . . .4 V to 18 V
  • Very Low Supply Current Drain . . .150 µA Typ at 5 V
  • Fast Response Time . . . 200 ns Typ for TTL-Level Input Step
  • Built-in ESD Protection
  • High Input Impedance . . . 1012 Typ
  • Extremely Low Input Bias Current. . .5 pA Typ
  • Ultrastable Low Input Offset Voltage
  • Input Offset Voltage Change at Worst-Case Input Conditions Typically 0.23 µV/Month, Including the First 30 Days
  • Common-Mode Input Voltage Range Includes Ground
  • Output Compatible With TTL, MOS, and CMOS
  • Pin-Compatible With LM393

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

LinCMOS is a trademark of Texas Instruments.

This device is fabricated using LinCMOS™ technology and consists of two independent voltage comparators, each designed to operate from a single power supply. Operation from dual supplies is also possible if the difference between the two supplies is 4 V to 18 V. Each device features extremely high input impedance (typically greater than 1012), allowing direct interfacing with high-impedance sources. The outputs are n-channel open-drain configurations and can be connected to achieve positive-logic wired-AND relationships.

The TLC372 has internal electrostatic discharge (ESD) protection circuits and has been classified with a 2000-V ESD rating using human-body-model (HBM) testing. However, care should be exercised in handling this device as exposure to ESD may result in a degradation of the device parametric performance.

The TLC372 is characterized for operation from -55°C to 125°C.

This device is fabricated using LinCMOS™ technology and consists of two independent voltage comparators, each designed to operate from a single power supply. Operation from dual supplies is also possible if the difference between the two supplies is 4 V to 18 V. Each device features extremely high input impedance (typically greater than 1012), allowing direct interfacing with high-impedance sources. The outputs are n-channel open-drain configurations and can be connected to achieve positive-logic wired-AND relationships.

The TLC372 has internal electrostatic discharge (ESD) protection circuits and has been classified with a 2000-V ESD rating using human-body-model (HBM) testing. However, care should be exercised in handling this device as exposure to ESD may result in a degradation of the device parametric performance.

The TLC372 is characterized for operation from -55°C to 125°C.
filter 尋找其它 比較器
下載 觀看有字幕稿的影片 影片

技術文件

star =TI 所選的此產品重要文件
找不到結果。請清除您的搜尋條件，然後再試一次。
檢視所有 4
類型 標題 日期
* Data sheet TLC372-EP datasheet 2007年 3月 23日
* VID TLC372-EP VID V6206675 2016年 6月 21日
* Radiation & reliability report TLC372MDREP Reliability Report 2016年 2月 2日
E-book The Signal e-book: A compendium of blog posts on op amp design topics 2017年 3月 28日

設計與開發

如需其他條款或必要資源，請按一下下方的任何標題以檢視詳細頁面 (如有)。

開發板

AMP-PDK-EVM — 放大器性能開發套件評估模組

放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件，可測試通用運算放大器 (op amp) 參數，並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項，可滿足封裝需求，使工程師能夠快速評估和驗證裝置性能。

AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝，包括：

  • D (SOIC-8 和 SOIC-14)
  • PW (TSSOP-14)
  • DGK (VSSOP-8)
  • DBV (SOT23-5 和 SOT23-6)
  • DCK (SC70-5 和 SC70-6)
使用指南: PDF | HTML
View Options
模擬工具

PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
要求
模擬工具

TINA-TI — 基於 SPICE 的類比模擬程式

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
使用指南: PDF
View Options
封裝 針腳 CAD 符號、佔位空間與 3D 模型
SOIC (D) 8 Ultra Librarian
適用 TI 的評估品項標準條款與條件。

訂購與品質

內含資訊：
  • RoHS
  • REACH
  • 產品標記
  • 鉛塗層/球物料
  • MSL 等級/回焊峰值
  • MTBF/FIT 估算值
  • 材料內容
  • 認證摘要
  • 進行中持續性的可靠性監測
內含資訊：
  • 晶圓廠位置
  • 組裝地點

支援與培訓

內含 TI 工程師技術支援的 TI E2E™ 論壇

以英文檢視所有論壇主題

內容係由 TI 和社群貢獻者依「現狀」提供，且不構成 TI 規範。檢視使用條款。

若有關於品質、封裝或訂購 TI 產品的問題，請參閱 TI 支援。​​​​​​​​​​​​​​

影片