現在提供此產品的更新版本
可直接投入的替代產品,相較於所比較的裝置,具備升級功能
TLV3011-Q1
- Qualified for automotive applications
- AEC-Q100 qualified with the following results:
- Device temperature grade 1: –40°C to +125°C ambient operating temperature range
- Device HBM ESD classification level 2
- Device CDM ESD classification level C6
- Low quiescent current: 3.1 µA (maximum, "B" version)
- Integrated voltage reference: 1.242 V
- Input common-mode range: 200 mV beyond rails
- Voltage reference initial accuracy: 1%
- Fail-safe inputs ("B" version)
- Power-on-reset ("B" version)
- Integrated hysteresis ("B" version)
-
Open drain output option (TLV3011x -Q1)
-
Push-pull output option (TLV3012x -Q1)
-
Fast response time: 6 uS
- Low supply voltage = 1.65 V to 5.5 V ("B" version)
The TLV3011 -Q1 is a low-power, open-drain output comparator; the TLV3012 -Q1 is a push-pull output comparator. Both devices feature an uncommitted on-chip voltage reference and have a 5 µA (maximum) quiescent current, an input common-mode range 200 mV beyond the supply rails, and single-supply operation from 1.8 V to 5.5 V. The integrated 1.242 V series voltage reference offers low 100 ppm/°C (maximum) drift, is stable with up to 10 nF capacitive load, and can provide up to 0.5 mA (typical) of output current.
The TLV3011B -Q1 and TLV3012B -Q1 "B" versions add power-on-reset (POR), fail-safe inputs, built-in hysteresis, a lower minimum supply voltage of 1.65 V and a 3.1 µA maximum quiescent current.
The family is available in both the tiny SOT23-6 package for space-conservative designs, and in the SC-70 package for even greater board area savings. All versions are specified for the temperature range of –40°C to +125°C.
技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | TLV3011-Q1, TLV3012-Q1, TLV3011B-Q1 and TLV3012B-Q1 Low-Power Comparators With Integrated 1.24 V Voltage Reference datasheet (Rev. C) | PDF | HTML | 2023年 4月 18日 |
Application brief | Voltage Supervision with a Comparator | PDF | HTML | 2023年 9月 28日 | |
Circuit design | Circuit for voltage monitoring in eCall telematics control units | 2020年 1月 16日 | ||
Circuit design | Low-power, bidirectional current-sensing circuit (Rev. A) | PDF | HTML | 2019年 2月 18日 | |
Circuit design | Undervoltage protection with comparator circuit | PDF | HTML | 2019年 1月 17日 | |
E-book | The Signal e-book: A compendium of blog posts on op amp design topics | 2017年 3月 28日 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:
- D (SOIC-8)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV(SOT23-5 與 SOT23-6)
- DCK(SC70-5 與 SC70-6)
DIP-ADAPTER-EVM — DIP 轉接器評估模組
Speed up your op amp prototyping and testing with the DIP-Adapter-EVM, which provides a fast, easy and inexpensive way to interface with small, surface-mount ICs. You can connect any supported op amp using the included Samtec terminal strips or wire them directly to existing circuits.
The (...)
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TINA-TI — 基於 SPICE 的類比模擬程式
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
SOT-23 (DBV) | 6 | Ultra Librarian |
SOT-SC70 (DCK) | 6 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。