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Schieberegister

SN74HC165-EP

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Verbessertes Produkt – Schieberegister, 8 Bit, Parallellast

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SN74HC165-EP

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Produktdetails

Configuration Parallel-in, Serial-out Bits (#) 8 Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 24 IOL (max) (mA) 5.2 IOH (max) (mA) -5.2 Supply current (max) (µA) 160 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 125 Rating HiRel Enhanced Product
Configuration Parallel-in, Serial-out Bits (#) 8 Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type Push-Pull Clock frequency (MHz) 24 IOL (max) (mA) 5.2 IOH (max) (mA) -5.2 Supply current (max) (µA) 160 Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 125 Rating HiRel Enhanced Product
TSSOP (PW) 16 32 mm² 5 x 6.4
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up To –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 80-µA Max ICC
  • Typical tpd = 13 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max
  • Complementary Outputs
  • Direct Overriding Load (Data) Inputs
  • Gated Clock Inputs
  • Parallel-to-Serial Data Conversion

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of Up To –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 6-V VCC Operation
  • Outputs Can Drive Up To 10 LSTTL Loads
  • Low Power Consumption, 80-µA Max ICC
  • Typical tpd = 13 ns
  • ±4-mA Output Drive at 5 V
  • Low Input Current of 1 µA Max
  • Complementary Outputs
  • Direct Overriding Load (Data) Inputs
  • Gated Clock Inputs
  • Parallel-to-Serial Data Conversion

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74HC165 is an 8-bit parallel-load shift register that, when clocked, shifts the data toward a serial (QH) output. Parallel-in access to each stage is provided by eight individual direct data (A-H) inputs that are enabled by a low level at the shift/load (SH/LD) input. The SN74HC165 device also features a clock-inhibit (CLK INH) function and a complementary serial (QH) output.

Clocking is accomplished by a low-to-high transition of the clock (CLK) input while SH/LD\ is held high and CLK INH is held low. The functions of CLK and CLK INH are interchangeable. Since a low CLK and a low-to-high transition of CLK INH also accomplish clocking, CLK INH should be changed to the high level only while CLK is high. Parallel loading is inhibited when SH/LD\ is held high. While SH/LD\ is low, the parallel inputs to the register are enabled independently of the levels of the CLK, CLK INH, or serial (SER) inputs.

The SN74HC165 is an 8-bit parallel-load shift register that, when clocked, shifts the data toward a serial (QH) output. Parallel-in access to each stage is provided by eight individual direct data (A-H) inputs that are enabled by a low level at the shift/load (SH/LD) input. The SN74HC165 device also features a clock-inhibit (CLK INH) function and a complementary serial (QH) output.

Clocking is accomplished by a low-to-high transition of the clock (CLK) input while SH/LD\ is held high and CLK INH is held low. The functions of CLK and CLK INH are interchangeable. Since a low CLK and a low-to-high transition of CLK INH also accomplish clocking, CLK INH should be changed to the high level only while CLK is high. Parallel loading is inhibited when SH/LD\ is held high. While SH/LD\ is low, the parallel inputs to the register are enabled independently of the levels of the CLK, CLK INH, or serial (SER) inputs.
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Technische Dokumentation

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Typ Titel Datum
* Data sheet SN74HC165-EP datasheet (Rev. A) 06 Jan 2004
* VID SN74HC165-EP VID V6204689 21 Jun 2016
Application note Power-Up Behavior of Clocked Devices (Rev. B) PDF | HTML 15 Dez 2022
Application note Implications of Slow or Floating CMOS Inputs (Rev. E) 26 Jul 2021
Selection guide Logic Guide (Rev. AB) 12 Jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 Dez 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 Jan 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 Jul 2004
User guide Signal Switch Data Book (Rev. A) 14 Nov 2003
Application note TI IBIS File Creation, Validation, and Distribution Processes 29 Aug 2002
Application note CMOS Power Consumption and CPD Calculation (Rev. B) 01 Jun 1997
Application note Designing With Logic (Rev. C) 01 Jun 1997
Application note Input and Output Characteristics of Digital Integrated Circuits 01 Okt 1996
Application note Live Insertion 01 Okt 1996
Application note SN54/74HCT CMOS Logic Family Applications and Restrictions 01 Mai 1996
Application note Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc 01 Apr 1996

Design und Entwicklung

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Bestellen & Qualität

Beinhaltete Information:
  • RoHS
  • REACH
  • Bausteinkennzeichnung
  • Blei-Finish/Ball-Material
  • MSL-Rating / Spitzenrückfluss
  • MTBF-/FIT-Schätzungen
  • Materialinhalt
  • Qualifikationszusammenfassung
  • Kontinuierliches Zuverlässigkeitsmonitoring
Beinhaltete Information:
  • Werksstandort
  • Montagestandort

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