ADC121S655
Convertidor A/D de micro potencia, 12 bits, 200 kSPS a 500 kSPS y entrada diferencial
ADC121S655
- True Differential Inputs
- Specified Performance from 200 kSPS to 500 kSPS
- External Reference
- Wide Input Common-Mode Voltage Range
- SPI/QSPI/MICROWIRE/DSP Compatible Serial Interface
Key Specifications
- Conversion Rate: 200 kSPS to 500 kSPS
- INL: ± 0.95 LSB (max)
- DNL: ± 0.85 LSB (max)
- Offset Error: ± 3.0 LSB (max)
- Gain Error: ± 5.5 LSB (max)
- SINAD: 70 dB (min)
- Power Consumption at VA = 5 V
- Active, 500 kSPS: 9 mW (typ)
- Active, 200 kSPS: 7 mW (typ)
- Power-Down: 1.5 µW (typ)
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The ADC121S655 is a 12-bit, 200 kSPS to 500 kSPS sampling Analog-to-Digital (A/D) converter that features a fully differential, high impedance analog input and an external reference. The reference voltage can be varied from 1.0V to VA, with a corresponding resolution between 244µV and VA divided by 4096.
The output serial data is binary 2's complement and is compatible with several standards, such as SPI, QSPI, MICROWIRE, and many common DSP serial interfaces. The differential input, low power consumption, and small size make the ADC121S655 ideal for direct connection to transducers in battery operated systems or remote data acquisition applications.
Operating from a single 5V supply, the supply current when operating at 500 kSPS is typically 1.8 mA. The supply current drops down to 0.3 µA typically when the ADC121S655 enters power-down mode. The ADC121S655 is available in the VSSOP-8 package. Operation is specified over the industrial temperature range of −40°C to +105°C and clock rates of 3.2 MHz to 8 MHz.
Documentación técnica
Tipo | Título | Fecha | ||
---|---|---|---|---|
* | Data sheet | 12-Bit, 200 kSPS to 500 kSPS, Differential Input, Micro Power A/D Converter datasheet (Rev. A) | 19 mar 2013 |
Pedidos y calidad
- RoHS
- REACH
- Marcado del dispositivo
- Acabado de plomo/material de la bola
- Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
- Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
- Contenido del material
- Resumen de calificaciones
- Monitoreo continuo de confiabilidad
- Lugar de fabricación
- Lugar de ensamblaje