CD54HC280

ACTIVO

Comprobador/generador de paridad impar/par de 9 bits CMOS Logic de alta velocidad

Detalles del producto

Technology family HC Bits (#) 2 Rating Military Operating temperature range (°C) -55 to 125
Technology family HC Bits (#) 2 Rating Military Operating temperature range (°C) -55 to 125
CDIP (J) 14 130.4652 mm² 19.56 x 6.67
  • Typical Propagation Delay = 17ns at VCC = 5V, CL = 15pF, TA = 25°C
  • Replaces LS180 Types
  • Easily Cascadable
  • Fanout (Over Temperature Range)
    • Standard Outputs...10 LSTTL Loads
    • Bus Driver Outputs...15 LSTTL Loads
  • Wide Operating Temperature Range... –55°C to 125°C
  • Balanced Propagation Delay and Transition Times
  • Significant Power Reduction Compared to LSTTL Logic ICs
  • HC Types
    • 2V to 6V Operation
    • High Noise Immunity: NIL = 30%, NIH = 30% of VCC at VCC = 5V
  • HCT Types
    • 4.5V to 5.5V Operation
    • Direct LSTTL Input Logic Compatibility, VIL = 0.8V (Max), VIH = 2V (Min)
    • CMOS Input Compatibility, Il 1µA at VOL, VOH

Data sheet acquired from Harris Semiconductor

  • Typical Propagation Delay = 17ns at VCC = 5V, CL = 15pF, TA = 25°C
  • Replaces LS180 Types
  • Easily Cascadable
  • Fanout (Over Temperature Range)
    • Standard Outputs...10 LSTTL Loads
    • Bus Driver Outputs...15 LSTTL Loads
  • Wide Operating Temperature Range... –55°C to 125°C
  • Balanced Propagation Delay and Transition Times
  • Significant Power Reduction Compared to LSTTL Logic ICs
  • HC Types
    • 2V to 6V Operation
    • High Noise Immunity: NIL = 30%, NIH = 30% of VCC at VCC = 5V
  • HCT Types
    • 4.5V to 5.5V Operation
    • Direct LSTTL Input Logic Compatibility, VIL = 0.8V (Max), VIH = 2V (Min)
    • CMOS Input Compatibility, Il 1µA at VOL, VOH

Data sheet acquired from Harris Semiconductor

The ’HC280 and ’HCT280 are 9-bit odd/even parity, generator checker devices. Both even and odd parity outputs are available for checking or generating parity for words up to nine bits long. Even parity is indicated (E output to any input of an additional HC/HCT280 parity checker.

The ’HC280 and ’HCT280 are 9-bit odd/even parity, generator checker devices. Both even and odd parity outputs are available for checking or generating parity for words up to nine bits long. Even parity is indicated (E output to any input of an additional HC/HCT280 parity checker.

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Documentación técnica

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Tipo Título Fecha
* Data sheet CD54HC280, CD74HC280, CD54HCT280, CD74HCT280 datasheet (Rev. D) 21 oct 2003
* SMD CD54HC280 SMD 8607701CA 21 jun 2016
Application note Implications of Slow or Floating CMOS Inputs (Rev. E) 26 jul 2021
Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
User guide Signal Switch Data Book (Rev. A) 14 nov 2003
Application note TI IBIS File Creation, Validation, and Distribution Processes 29 ago 2002
Application note CMOS Power Consumption and CPD Calculation (Rev. B) 01 jun 1997
Application note Designing With Logic (Rev. C) 01 jun 1997
Application note Input and Output Characteristics of Digital Integrated Circuits 01 oct 1996
Application note Live Insertion 01 oct 1996
Application note SN54/74HCT CMOS Logic Family Applications and Restrictions 01 may 1996
Application note Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc 01 abr 1996

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Encapsulado Pines Símbolos CAD, huellas y modelos 3D
CDIP (J) 14 Ultra Librarian

Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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