AFE1256
- 256 Channels
- On-Chip, 16-Bit ADC
- Photodiode Short Immunity
- Column Short Immunity
- High Performance:
- Noise: 758 e-RMS with 28-pF Sensor
Capacitor in 1.2-pC Range - Integral Nonlinearity:
±2 LSB with Internal 16-Bit ADC - Minimum Scan Time:
- 37.9 µs in Normal Mode
- 20 µs in 2x Binning Mode
- Noise: 758 e-RMS with 28-pF Sensor
- Integration:
- Eight Selectable Full-Scale Ranges:
0.15 pC (Min) to 9.6 pC (Max) - Built-In Correlated Double Sampler
- 2x Binning (Averages Charge of Two Adjacent
Channels) for Faster Throughput - Pipelined Integrate and Read: Allows Data
Read During Integration
- Eight Selectable Full-Scale Ranges:
- Flexibility:
- Electron and Hole Integration
- Low Power:
- 2.9 mW/Ch with ADC
- 2.3 mW/Ch without ADC
- 0.1 mW/Ch in Nap Mode
- Total Power-Down Feature
- 22-mm × 5-mm Gold-Bump Die,
Suitable for TCP and COF
Application
- Flat-Panel, X-Ray Detector
All trademarks are the property of their respective owners.
The AFE1256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detectors (FPDs) based on digital X-ray systems. The device includes 256 integrators, a programmable gain amplifier (PGA) for full-scale, charge-level selection, a correlated double sampler (CDS) with dual banking, 256:4 analog multiplexers, and four 16-bit, successive-approximation register (SAR) analog-to-digital converters (ADCs) onboard. Serial data from the ADCs are available in SPI™ format.
Hardware-selectable integration polarity allows for the integration of positive or negative charge and provides more flexibility in system design. The Nap feature enables substantial power saving. This power savings is especially useful in battery-powered systems.
The device is available as a 22-mm × 5-mm gold-bumped die and a 38-mm × 28-mm, COF-314 TDS package in singulated forms.
To request a full data sheet or other design resources: request AFE1256
추가 정보 요청
NDA에 따라 전체 데이터시트 및 기타 설계 리소스를 사용할 수 있습니다. 지금 요청
기술 자료
| 유형 | 직함 | 날짜 | ||
|---|---|---|---|---|
| * | Data sheet | AFE1256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors datasheet (Rev. D) | PDF | HTML | 2016/05/26 |
| Analog Design Journal | Selecting a multichannel ultra-low-current measurement IC | PDF | HTML | 2022/03/18 | |
| EVM User's guide | AFE1256COF EVM Introduction User Guide | 2013/11/05 |
설계 및 개발
추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.
AFE1256EVM — AFE1256 평판 디지털 엑스레이 감지기용 256채널 AFE 평가 모듈
The AFE1256EVM is a compact USB based evaluation kit for evaluating the AFE1256 COF, a 256-channel analog front-end. The EVM is self-contained with DACs and on board pattern generator built , greatly reducing its dependency on external equipment so all it needs is a power supply. The kit consists (...)
PSPICE-FOR-TI — TI 설계 및 시뮬레이션 툴용 PSpice®
TI 설계 및 시뮬레이션 환경용 PSpice는 기본 제공 라이브러리를 이용해 복잡한 혼합 신호 설계를 시뮬레이션할 수 있습니다. 레이아웃 및 제작에 (...)
| 패키지 | 핀 | CAD 기호, 풋프린트 및 3D 모델 |
|---|---|---|
| COF (TDS) | 314 | Ultra Librarian |
| DIESALE (TD) | — |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치
권장 제품에는 본 TI 제품과 관련된 매개 변수, 평가 모듈 또는 레퍼런스 디자인이 있을 수 있습니다.