AFE1256

활성

평면 패널 디지털 엑스레이 감지기용 256채널 아날로그 프론트 엔드(AFE)

제품 상세 정보

Number of input channels 256 Resolution (Bits) 16 Features Internal Reference Buffer, Nap Mode, Power Down, X-ray Interface type SPI Operating temperature range (°C) 0 to 70 Rating Catalog
Number of input channels 256 Resolution (Bits) 16 Features Internal Reference Buffer, Nap Mode, Power Down, X-ray Interface type SPI Operating temperature range (°C) 0 to 70 Rating Catalog
COF (TDS) 314 1064 mm² 38 x 28 DIESALE (TD) See data sheet
  • 256 Channels
  • On-Chip, 16-Bit ADC
  • Photodiode Short Immunity
  • Column Short Immunity
  • High Performance:
    • Noise: 758 e-RMS with 28-pF Sensor
      Capacitor in 1.2-pC Range
    • Integral Nonlinearity:
      ±2 LSB with Internal 16-Bit ADC
    • Minimum Scan Time:
      • 37.9 µs in Normal Mode
      • 20 µs in 2x Binning Mode
  • Integration:
    • Eight Selectable Full-Scale Ranges:
      0.15 pC (Min) to 9.6 pC (Max)
    • Built-In Correlated Double Sampler
    • 2x Binning (Averages Charge of Two Adjacent
      Channels) for Faster Throughput
    • Pipelined Integrate and Read: Allows Data
      Read During Integration
  • Flexibility:
    • Electron and Hole Integration
  • Low Power:
    • 2.9 mW/Ch with ADC
    • 2.3 mW/Ch without ADC
    • 0.1 mW/Ch in Nap Mode
    • Total Power-Down Feature
  • 22-mm × 5-mm Gold-Bump Die,
    Suitable for TCP and COF

Application

  • Flat-Panel, X-Ray Detector

All trademarks are the property of their respective owners.

  • 256 Channels
  • On-Chip, 16-Bit ADC
  • Photodiode Short Immunity
  • Column Short Immunity
  • High Performance:
    • Noise: 758 e-RMS with 28-pF Sensor
      Capacitor in 1.2-pC Range
    • Integral Nonlinearity:
      ±2 LSB with Internal 16-Bit ADC
    • Minimum Scan Time:
      • 37.9 µs in Normal Mode
      • 20 µs in 2x Binning Mode
  • Integration:
    • Eight Selectable Full-Scale Ranges:
      0.15 pC (Min) to 9.6 pC (Max)
    • Built-In Correlated Double Sampler
    • 2x Binning (Averages Charge of Two Adjacent
      Channels) for Faster Throughput
    • Pipelined Integrate and Read: Allows Data
      Read During Integration
  • Flexibility:
    • Electron and Hole Integration
  • Low Power:
    • 2.9 mW/Ch with ADC
    • 2.3 mW/Ch without ADC
    • 0.1 mW/Ch in Nap Mode
    • Total Power-Down Feature
  • 22-mm × 5-mm Gold-Bump Die,
    Suitable for TCP and COF

Application

  • Flat-Panel, X-Ray Detector

All trademarks are the property of their respective owners.

The AFE1256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detectors (FPDs) based on digital X-ray systems. The device includes 256 integrators, a programmable gain amplifier (PGA) for full-scale, charge-level selection, a correlated double sampler (CDS) with dual banking, 256:4 analog multiplexers, and four 16-bit, successive-approximation register (SAR) analog-to-digital converters (ADCs) onboard. Serial data from the ADCs are available in SPI™ format.

Hardware-selectable integration polarity allows for the integration of positive or negative charge and provides more flexibility in system design. The Nap feature enables substantial power saving. This power savings is especially useful in battery-powered systems.

The device is available as a 22-mm × 5-mm gold-bumped die and a 38-mm × 28-mm, COF-314 TDS package in singulated forms.

To request a full data sheet or other design resources: request AFE1256

The AFE1256 is a 256-channel, analog front-end (AFE) designed to suit the requirements of flat-panel detectors (FPDs) based on digital X-ray systems. The device includes 256 integrators, a programmable gain amplifier (PGA) for full-scale, charge-level selection, a correlated double sampler (CDS) with dual banking, 256:4 analog multiplexers, and four 16-bit, successive-approximation register (SAR) analog-to-digital converters (ADCs) onboard. Serial data from the ADCs are available in SPI™ format.

Hardware-selectable integration polarity allows for the integration of positive or negative charge and provides more flexibility in system design. The Nap feature enables substantial power saving. This power savings is especially useful in battery-powered systems.

The device is available as a 22-mm × 5-mm gold-bumped die and a 38-mm × 28-mm, COF-314 TDS package in singulated forms.

To request a full data sheet or other design resources: request AFE1256

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* Data sheet AFE1256 256-Channel, Analog Front-End for Digital X-Ray, Flat-Panel Detectors datasheet (Rev. D) PDF | HTML 2016/05/26

주문 및 품질

포함된 정보:
  • RoHS
  • REACH
  • 디바이스 마킹
  • 납 마감/볼 재질
  • MSL 등급/피크 리플로우
  • MTBF/FIT 예측
  • 물질 성분
  • 인증 요약
  • 지속적인 신뢰성 모니터링
포함된 정보:
  • 팹 위치
  • 조립 위치

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