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비교 대상 장치보다 업그레이드된 기능을 지원하는 드롭인 대체품
LM124-SP
- QML-V Qualified, SMD 5962-7704301VCA, 5962-9950403VCA and 5962-9950403V9B
- Rad-Tolerant: 50 kRad (Si) TID
(5962-9950403VCA and 5962-9950403V9B)(1)- TID Dose Rate = 0.01 rad/sec (Si)
- Wide Supply Ranges
- Single Supply: 3 V to 32 V
- Dual Supplies: ±1.5 V to ±16 V
- Low Supply-Current Drain Independent of
Supply Voltage: 0.8 mA (Typ) - Low Input Bias and Offset Parameters
- Input Offset Voltage: 1 mV Typ
- Input Offset Current: 2 nA Typ
- Input Bias Current: 30 nA Typ
- Common-Mode Input Voltage Range Includes
Ground, Allowing Direct Sensing Near Ground - Differential Input Voltage Range Equal to Maximum-Rated Supply Voltage: ±32 V
- Open-Loop Differential Voltage
Amplification: 100 V/mV Typ - Internal Frequency Compensation
(1) Radiation tolerance is a typical value based upon initial device qualification with dose rate = 0.01 rad/sec. Radiation lot acceptance testing is available - contact factory for details.
These devices consist of four independent high-gain frequency-compensated operational amplifiers that are designed specifically to operate from a single supply over a wide range of voltages. Operation from split supplies also is possible if the difference between the two supplies is 3 V to 32 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. The low supply-current drain is independent of the magnitude of the supply voltage.
Applications include transducer amplifiers, dc amplification blocks, and all the conventional operational-amplifier circuits that now can be more easily implemented in single-supply-voltage systems. For example, the LM124 can be operated directly from the standard 5-V supply that is used in digital systems and provides the required interface electronics, without requiring additional ±15-V supplies.
기술 자료
유형 | 직함 | 날짜 | ||
---|---|---|---|---|
* | Data sheet | QUADRUPLE OPERATIONAL AMPLIFIER. datasheet (Rev. A) | 2011/01/07 |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치