SN54SC4T125-SEP
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VID V62/23631-01XE
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Radiation Tolerant
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Single Event Latch-Up (SEL) immune up to 43 MeV-cm 2/mg at 125°C
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Total Ionizing Does (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 30 krad(Si)
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Single Event Transient (SET) characterized up to LET = 43 MeV-cm 2/mg
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Wide operating range of 1.2 V to 5.5 V
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Single-supply voltage translator:
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Up translation:
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1.2 V to 1.8 V
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1.5 V to 2.5 V
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1.8 V to 3.3 V
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3.3 V to 5.0 V
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Down translation:
- 5.0 V, 3.3 V, 2.5 V to 1.8 V
- 5.0 V, 3.3 V to 2.5 V
- 5.0 V to 3.3 V
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- 5.5-V tolerant input pins
- Supports standard pinouts
- Up to 150 Mbps with 5-V or 3.3-V V CC
- Latch-up performance exceeds 250 mA per JESD 17
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Space Enhanced Plastic
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Controlled baseline
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Au bondwire and NiPdAu lead finish
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Meets NASA ASTM E595 outgassing specification
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One fabrication, assembly, and test site
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Extended product life cycle
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Product traceability
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The SN54SC4T125-SEP contains four independent buffers with 3-state outputs and extended voltage operation to allow for level translation. Each buffer performs the Boolean function Y = A in positive logic. The outputs can be put into a high impedance (Hi-Z) state by applying a HIGH on the OE pin. The output level is referenced to the supply voltage (V CC) and supports 1.8-V, 2.5-V, 3.3-V, and 5-V CMOS levels.
The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2 V input to 1.8 V output or 1.8 V input to 3.3 V output). In addition, the 5-V tolerant input pins enable down translation (for example, 3.3 V to 2.5 V output).
기술 자료
설계 및 개발
추가 조건 또는 필수 리소스는 사용 가능한 경우 아래 제목을 클릭하여 세부 정보 페이지를 확인하세요.
14-24-LOGIC-EVM — 14핀~24핀 D, DB, DGV, DW, DYY, NS 및 PW 패키지용 로직 제품 일반 평가 모듈
14-24-LOGIC-EVM 평가 모듈(EVM)은 14핀~24핀 D, DW, DB, NS, PW, DYY 또는 DGV 패키지에 있는 모든 로직 장치를 지원하도록 설계되었습니다.
패키지 | 핀 | CAD 기호, 풋프린트 및 3D 모델 |
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TSSOP (PW) | 14 | Ultra Librarian |
주문 및 품질
- RoHS
- REACH
- 디바이스 마킹
- 납 마감/볼 재질
- MSL 등급/피크 리플로우
- MTBF/FIT 예측
- 물질 성분
- 인증 요약
- 지속적인 신뢰성 모니터링
- 팹 위치
- 조립 위치