LM2901-Q1
- Qualified for automotive applications
- AEC-Q100 Qualified with the following results:
- Device temperature grade 1: –40°C to 125°C ambient operating temperature range
- Device HBM ESD classification levels:
-
Class 1C for "AV" version
-
Class 2 for all other versions
-
- Device CDM ESD classification level C3
- Improved 2 kV HBM ESD for "B" device
- Single supply or dual supplies
- Low supply-current independent of supply voltage 200 uA typical per comparator ("B" Versions)
- Low input bias current 3.5 nA typical ("B" device)
- Low input offset current 0.5 nA typ ("B" device)
- Low input offset voltage ±0.37 mV typ ("B" device)
- Common-mode input voltage range includes ground
- Differential input voltage range equal to maximum-rated supply voltage ±36 V
- Output compatible with TTL, MOS, and CMOS
- For single version in SOT, see the TL331-Q1 (SLVS969)
- For dual version in multiple packages, see the LM2903x-Q1 (SLCS141)
- Functional Safety-Capable
The LM2901B-Q1 device is the next generation version of the industry-standard LM2901x-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.
All devices consist of four independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.
The "V" versions operate up to 32V, and the "B" version operates up to 36V. All are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C.
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技術文件
類型 | 標題 | 日期 | ||
---|---|---|---|---|
* | Data sheet | LM2901B-Q1, LM2901x-Q1 Quadruple Automotive Comparator datasheet (Rev. G) | PDF | HTML | 2023年 3月 3日 |
Functional safety information | LM2901-Q1, LM2901B-Q1, LM2901V-Q1, FS, FIT Rate, Failure Mode Dist and Pin FMA | PDF | HTML | 2020年 4月 7日 | |
E-book | The Signal e-book: A compendium of blog posts on op amp design topics | 2017年 3月 28日 |
設計與開發
如需其他條款或必要資源,請按一下下方的任何標題以檢視詳細頁面 (如有)。
AMP-PDK-EVM — 放大器性能開發套件評估模組
放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。
AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:
- D (SOIC-8)
- PW (TSSOP-14)
- DGK (VSSOP-8)
- DBV(SOT23-5 與 SOT23-6)
- DCK(SC70-5 與 SC70-6)
PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具
TINA-TI — 基於 SPICE 的類比模擬程式
封裝 | 針腳 | CAD 符號、佔位空間與 3D 模型 |
---|---|---|
SOIC (D) | 14 | Ultra Librarian |
TSSOP (PW) | 14 | Ultra Librarian |
訂購與品質
- RoHS
- REACH
- 產品標記
- 鉛塗層/球物料
- MSL 等級/回焊峰值
- MTBF/FIT 估算值
- 材料內容
- 認證摘要
- 進行中持續性的可靠性監測
- 晶圓廠位置
- 組裝地點
建議產品可能具有與此 TI 產品相關的參數、評估模組或參考設計。