產品詳細資料

Number of channels 4 Output type Open-collector, Open-drain Propagation delay time (µs) 1.3 Vs (max) (V) 30 Vs (min) (V) 2 Rating Automotive Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 7 Rail-to-rail In to V- Operating temperature range (°C) -40 to 125 Input bias current (±) (max) (nA) 250 VICR (max) (V) 28.5 VICR (min) (V) 0
Number of channels 4 Output type Open-collector, Open-drain Propagation delay time (µs) 1.3 Vs (max) (V) 30 Vs (min) (V) 2 Rating Automotive Iq per channel (typ) (mA) 0.2 Vos (offset voltage at 25°C) (max) (mV) 7 Rail-to-rail In to V- Operating temperature range (°C) -40 to 125 Input bias current (±) (max) (nA) 250 VICR (max) (V) 28.5 VICR (min) (V) 0
SOIC (D) 14 51.9 mm² 8.65 x 6 TSSOP (PW) 14 32 mm² 5 x 6.4
  • Qualified for automotive applications
  • AEC-Q100 Qualified with the following results:
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification levels:
      • Class 1C for "AV" version

      • Class 2 for all other versions

    • Device CDM ESD classification level C3
  • Improved 2 kV HBM ESD for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200 uA typical per comparator ("B" Versions)
  • Low input bias current 3.5 nA typical ("B" device)
  • Low input offset current 0.5 nA typ ("B" device)
  • Low input offset voltage ±0.37 mV typ ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36 V
  • Output compatible with TTL, MOS, and CMOS
  • For single version in SOT, see the TL331-Q1 (SLVS969)
  • For dual version in multiple packages, see the LM2903x-Q1 (SLCS141)
  • Functional Safety-Capable
  • Qualified for automotive applications
  • AEC-Q100 Qualified with the following results:
    • Device temperature grade 1: –40°C to 125°C ambient operating temperature range
    • Device HBM ESD classification levels:
      • Class 1C for "AV" version

      • Class 2 for all other versions

    • Device CDM ESD classification level C3
  • Improved 2 kV HBM ESD for "B" device
  • Single supply or dual supplies
  • Low supply-current independent of supply voltage 200 uA typical per comparator ("B" Versions)
  • Low input bias current 3.5 nA typical ("B" device)
  • Low input offset current 0.5 nA typ ("B" device)
  • Low input offset voltage ±0.37 mV typ ("B" device)
  • Common-mode input voltage range includes ground
  • Differential input voltage range equal to maximum-rated supply voltage ±36 V
  • Output compatible with TTL, MOS, and CMOS
  • For single version in SOT, see the TL331-Q1 (SLVS969)
  • For dual version in multiple packages, see the LM2903x-Q1 (SLCS141)
  • Functional Safety-Capable

The LM2901B-Q1 device is the next generation version of the industry-standard LM2901x-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of four independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The "V" versions operate up to 32V, and the "B" version operates up to 36V. All are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C.

The LM2901B-Q1 device is the next generation version of the industry-standard LM2901x-Q1 comparator family. This next generation family provides outstanding value for cost-sensitive applications, with features including lower offset voltage, higher supply voltage capability, lower supply current, lower input bias current, lower propagation delay, and improved 2kV ESD performance with drop-in replacement convenience.

All devices consist of four independent voltage comparators that are designed to operate over a wide range of voltages. Operation from dual supplies also is possible as long as the difference between the two supplies is within 2 V to 36 V, and VCC is at least 1.5 V more positive than the input common-mode voltage. The outputs can be connected to other open-collector outputs.

The "V" versions operate up to 32V, and the "B" version operates up to 36V. All are qualified for the AEC-Q100 Grade 1 temperature range of -40°C to +125°C.

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類型 標題 日期
* Data sheet LM2901B-Q1, LM2901x-Q1 Quadruple Automotive Comparator datasheet (Rev. G) PDF | HTML 2023年 3月 3日
Functional safety information LM2901-Q1, LM2901B-Q1, LM2901V-Q1, FS, FIT Rate, Failure Mode Dist and Pin FMA PDF | HTML 2020年 4月 7日
E-book The Signal e-book: A compendium of blog posts on op amp design topics 2017年 3月 28日

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AMP-PDK-EVM — 放大器性能開發套件評估模組

放大器性能開發套件 (PDK) 是一款評估模組 (EVM) 套件,可測試通用運算放大器 (op amp) 參數,並與大多數運算放大器和比較器相容。EVM 套件提供主板和多個插槽式子卡選項,可滿足封裝需求,使工程師能夠快速評估和驗證裝置性能。

AMP-PDK-EVM 套件支援五種最熱門的業界標準封裝,包括:

  • D (SOIC-8 和 SOIC-14)
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使用指南: PDF | HTML
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LM2901 and LM339 PSpice Model (Rev. C)

SLCJ010C.ZIP (45 KB) - PSpice Model
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LM2901 and LM339 TINA-TI Spice Model (Rev. B)

SLCM013B.ZIP (10 KB) - TINA-TI Spice Model
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PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
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SOIC (D) 14 Ultra Librarian
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